GB789712A - Methods of determining the location of p or n zones in semiconductor bodies - Google Patents
Methods of determining the location of p or n zones in semiconductor bodiesInfo
- Publication number
- GB789712A GB789712A GB2470/56A GB247056A GB789712A GB 789712 A GB789712 A GB 789712A GB 2470/56 A GB2470/56 A GB 2470/56A GB 247056 A GB247056 A GB 247056A GB 789712 A GB789712 A GB 789712A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- display
- pulses
- junction
- semi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0438—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
-
- C—CHEMISTRY; METALLURGY
- C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
- C10K—PURIFYING OR MODIFYING THE CHEMICAL COMPOSITION OF COMBUSTIBLE GASES CONTAINING CARBON MONOXIDE
- C10K1/00—Purifying combustible gases containing carbon monoxide
- C10K1/08—Purifying combustible gases containing carbon monoxide by washing with liquids; Reviving the used wash liquors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US486073A US2748349A (en) | 1955-02-04 | 1955-02-04 | Fabrication of junction transistors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB789712A true GB789712A (en) | 1958-01-29 |
Family
ID=23930493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB2470/56A Expired GB789712A (en) | 1955-02-04 | 1956-01-25 | Methods of determining the location of p or n zones in semiconductor bodies |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US2748349A (https=) |
| BE (1) | BE543825A (https=) |
| FR (1) | FR1147942A (https=) |
| GB (1) | GB789712A (https=) |
| NL (2) | NL98752C (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2951204A (en) * | 1957-04-08 | 1960-08-30 | Texas Instruments Inc | Method and apparatus for locating the base section of a transistor bar |
| BE571509A (https=) * | 1957-09-26 | 1900-01-01 | ||
| US2956230A (en) * | 1958-08-29 | 1960-10-11 | Texas Instruments Inc | Method for locating p-n junctions in semiconductor bodies |
| US3067387A (en) * | 1959-07-14 | 1962-12-04 | Ibm | P-n junction position determination |
| US3185927A (en) * | 1961-01-31 | 1965-05-25 | Kulicke & Soffa Mfg Co | Probe instrument for inspecting semiconductor wafers including means for marking defective zones |
| US3351733A (en) * | 1963-08-21 | 1967-11-07 | Hitachi Ltd | Welding method |
| US3548491A (en) * | 1967-02-03 | 1970-12-22 | Ibm | Mass production of electronic devices |
-
0
- NL NL201406D patent/NL201406A/xx unknown
- BE BE543825D patent/BE543825A/xx unknown
- NL NL98752D patent/NL98752C/xx active
-
1955
- 1955-02-04 US US486073A patent/US2748349A/en not_active Expired - Lifetime
- 1955-10-11 FR FR1147942D patent/FR1147942A/fr not_active Expired
-
1956
- 1956-01-25 GB GB2470/56A patent/GB789712A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| NL98752C (https=) | |
| NL201406A (https=) | |
| BE543825A (https=) | |
| US2748349A (en) | 1956-05-29 |
| FR1147942A (fr) | 1957-12-02 |
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