GB2406720B - An inductor formed in an integrated circuit - Google Patents
An inductor formed in an integrated circuitInfo
- Publication number
- GB2406720B GB2406720B GB0421662A GB0421662A GB2406720B GB 2406720 B GB2406720 B GB 2406720B GB 0421662 A GB0421662 A GB 0421662A GB 0421662 A GB0421662 A GB 0421662A GB 2406720 B GB2406720 B GB 2406720B
- Authority
- GB
- United Kingdom
- Prior art keywords
- conductive
- inductor
- aluminum
- line
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H01L23/5227—
-
- H01L27/08—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/20—Inductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/497—Inductive arrangements or effects of, or between, wiring layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/02—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets
- H01F41/04—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing coils
- H01F41/041—Printed circuit coils
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US50733503P | 2003-09-30 | 2003-09-30 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB0421662D0 GB0421662D0 (en) | 2004-10-27 |
| GB2406720A GB2406720A (en) | 2005-04-06 |
| GB2406720B true GB2406720B (en) | 2006-09-13 |
Family
ID=33418512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB0421662A Expired - Fee Related GB2406720B (en) | 2003-09-30 | 2004-09-29 | An inductor formed in an integrated circuit |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US7068139B2 (https=) |
| JP (1) | JP4948756B2 (https=) |
| KR (1) | KR101045195B1 (https=) |
| GB (1) | GB2406720B (https=) |
| TW (1) | TWI362098B (https=) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2406720B (en) * | 2003-09-30 | 2006-09-13 | Agere Systems Inc | An inductor formed in an integrated circuit |
| US7786836B2 (en) * | 2005-07-19 | 2010-08-31 | Lctank Llc | Fabrication of inductors in transformer based tank circuitry |
| TWI304261B (en) | 2005-10-12 | 2008-12-11 | Realtek Semiconductor Corp | Integrated inductor |
| US8669637B2 (en) * | 2005-10-29 | 2014-03-11 | Stats Chippac Ltd. | Integrated passive device system |
| US7851257B2 (en) * | 2005-10-29 | 2010-12-14 | Stats Chippac Ltd. | Integrated circuit stacking system with integrated passive components |
| US8791006B2 (en) | 2005-10-29 | 2014-07-29 | Stats Chippac, Ltd. | Semiconductor device and method of forming an inductor on polymer matrix composite substrate |
| US8158510B2 (en) | 2009-11-19 | 2012-04-17 | Stats Chippac, Ltd. | Semiconductor device and method of forming IPD on molded substrate |
| US8409970B2 (en) | 2005-10-29 | 2013-04-02 | Stats Chippac, Ltd. | Semiconductor device and method of making integrated passive devices |
| US8188590B2 (en) | 2006-03-30 | 2012-05-29 | Stats Chippac Ltd. | Integrated circuit package system with post-passivation interconnection and integration |
| JP2008016502A (ja) * | 2006-07-03 | 2008-01-24 | Sharp Corp | Rf集積回路及びその製造方法 |
| US7791199B2 (en) * | 2006-11-22 | 2010-09-07 | Tessera, Inc. | Packaged semiconductor chips |
| US8569876B2 (en) * | 2006-11-22 | 2013-10-29 | Tessera, Inc. | Packaged semiconductor chips with array |
| US8410578B2 (en) * | 2006-12-29 | 2013-04-02 | Semiconductor Components Industries, Llc | Method of manufacturing a semiconductor component and structure |
| US7602027B2 (en) * | 2006-12-29 | 2009-10-13 | Semiconductor Components Industries, L.L.C. | Semiconductor component and method of manufacture |
| EP2135280A2 (en) | 2007-03-05 | 2009-12-23 | Tessera, Inc. | Chips having rear contacts connected by through vias to front contacts |
| US8212155B1 (en) * | 2007-06-26 | 2012-07-03 | Wright Peter V | Integrated passive device |
| EP2183770B1 (en) | 2007-07-31 | 2020-05-13 | Invensas Corporation | Method of forming through-substrate vias and corresponding decvice |
| JP5578797B2 (ja) | 2009-03-13 | 2014-08-27 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US8395233B2 (en) * | 2009-06-24 | 2013-03-12 | Harris Corporation | Inductor structures for integrated circuit devices |
| TWI389260B (zh) * | 2009-09-30 | 2013-03-11 | Inotera Memories Inc | 半導體記憶體之電容下電極的製備方法 |
| US8179221B2 (en) * | 2010-05-20 | 2012-05-15 | Harris Corporation | High Q vertical ribbon inductor on semiconducting substrate |
| US8860390B2 (en) | 2010-06-04 | 2014-10-14 | Apple Inc. | Switching power supply opposite polarity inductor arrangement |
| US8796135B2 (en) | 2010-07-23 | 2014-08-05 | Tessera, Inc. | Microelectronic elements with rear contacts connected with via first or via middle structures |
| US8791575B2 (en) | 2010-07-23 | 2014-07-29 | Tessera, Inc. | Microelectronic elements having metallic pads overlying vias |
| US9640437B2 (en) | 2010-07-23 | 2017-05-02 | Tessera, Inc. | Methods of forming semiconductor elements using micro-abrasive particle stream |
| US8304855B2 (en) | 2010-08-04 | 2012-11-06 | Harris Corporation | Vertical capacitors formed on semiconducting substrates |
| US8610259B2 (en) | 2010-09-17 | 2013-12-17 | Tessera, Inc. | Multi-function and shielded 3D interconnects |
| US8847380B2 (en) | 2010-09-17 | 2014-09-30 | Tessera, Inc. | Staged via formation from both sides of chip |
| US8310328B2 (en) * | 2010-10-07 | 2012-11-13 | Touch Micro-System Technology Corp. | Planar coil and method of making the same |
| KR101059490B1 (ko) * | 2010-11-15 | 2011-08-25 | 테세라 리써치 엘엘씨 | 임베드된 트레이스에 의해 구성된 전도성 패드 |
| US8637968B2 (en) | 2010-12-02 | 2014-01-28 | Tessera, Inc. | Stacked microelectronic assembly having interposer connecting active chips |
| US8736066B2 (en) | 2010-12-02 | 2014-05-27 | Tessera, Inc. | Stacked microelectronic assemby with TSVS formed in stages and carrier above chip |
| US8587126B2 (en) | 2010-12-02 | 2013-11-19 | Tessera, Inc. | Stacked microelectronic assembly with TSVs formed in stages with plural active chips |
| US8610264B2 (en) | 2010-12-08 | 2013-12-17 | Tessera, Inc. | Compliant interconnects in wafers |
| KR101218985B1 (ko) * | 2011-05-31 | 2013-01-04 | 삼성전기주식회사 | 칩형 코일 부품 |
| US9159711B2 (en) * | 2011-07-29 | 2015-10-13 | GlobalFoundries, Inc. | Integrated circuit systems including vertical inductors |
| US20130146345A1 (en) * | 2011-12-12 | 2013-06-13 | Kazuki KAJIHARA | Printed wiring board and method for manufacturing the same |
| US9001031B2 (en) | 2012-07-30 | 2015-04-07 | Qualcomm Mems Technologies, Inc. | Complex passive design with special via implementation |
| US8859419B2 (en) | 2013-02-01 | 2014-10-14 | Globalfoundries Inc. | Methods of forming copper-based nitride liner/passivation layers for conductive copper structures and the resulting device |
| US9263405B2 (en) * | 2013-12-05 | 2016-02-16 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device |
| US10032850B2 (en) * | 2016-05-11 | 2018-07-24 | Texas Instruments Incorporated | Semiconductor die with back-side integrated inductive component |
| US10263064B2 (en) * | 2017-06-30 | 2019-04-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor devices and methods of forming the same |
| US11495555B2 (en) * | 2018-03-14 | 2022-11-08 | Intel Corporation | Magnetic bilayer structure for a cored or coreless semiconductor package |
| US11270959B2 (en) * | 2018-03-23 | 2022-03-08 | Intel Corporation | Enabling magnetic films in inductors integrated into semiconductor packages |
| US11355459B2 (en) * | 2018-05-17 | 2022-06-07 | Intel Corpoation | Embedding magnetic material, in a cored or coreless semiconductor package |
| US10748810B2 (en) | 2018-05-29 | 2020-08-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of manufacturing an integrated inductor with protections caps on conductive lines |
| US10756161B2 (en) * | 2018-06-27 | 2020-08-25 | Intel Corporation | Package-embedded thin-film capacitors, package-integral magnetic inductors, and methods of assembling same |
| US11049820B2 (en) * | 2018-07-30 | 2021-06-29 | Texas Instruments Incorporated | Crack suppression structure for HV isolation component |
| CN113364337A (zh) * | 2021-06-24 | 2021-09-07 | 洛阳理工学院 | 一种柔性单电极摩擦纳米发电机 |
| CN114360842B (zh) * | 2021-12-28 | 2022-11-22 | 中国人民解放军海军工程大学 | 一种应用于高功率微波源的轻型化周期性磁场线圈 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5446311A (en) * | 1994-09-16 | 1995-08-29 | International Business Machines Corporation | High-Q inductors in silicon technology without expensive metalization |
| US6083802A (en) * | 1998-12-31 | 2000-07-04 | Winbond Electronics Corporation | Method for forming an inductor |
| US6329234B1 (en) * | 2000-07-24 | 2001-12-11 | Taiwan Semiconductor Manufactuirng Company | Copper process compatible CMOS metal-insulator-metal capacitor structure and its process flow |
| US6472285B1 (en) * | 1999-04-30 | 2002-10-29 | Winbond Electronics Corporation | Method for fabricating high-Q inductance device in monolithic technology |
| US6573148B1 (en) * | 2000-07-12 | 2003-06-03 | Koninklljke Philips Electronics N.V. | Methods for making semiconductor inductor |
| US20030157805A1 (en) * | 2002-02-15 | 2003-08-21 | Schultz Richard T. | Thick traces from multiple damascene layers |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5610433A (en) * | 1995-03-13 | 1997-03-11 | National Semiconductor Corporation | Multi-turn, multi-level IC inductor with crossovers |
| JPH09162357A (ja) * | 1995-12-08 | 1997-06-20 | Hitachi Ltd | 高周波半導体装置 |
| JP2904086B2 (ja) * | 1995-12-27 | 1999-06-14 | 日本電気株式会社 | 半導体装置およびその製造方法 |
| US5793272A (en) * | 1996-08-23 | 1998-08-11 | International Business Machines Corporation | Integrated circuit toroidal inductor |
| FR2771843B1 (fr) * | 1997-11-28 | 2000-02-11 | Sgs Thomson Microelectronics | Transformateur en circuit integre |
| KR100279753B1 (ko) * | 1997-12-03 | 2001-03-02 | 정선종 | 반도체 집적회로 제조공정을 이용한 인덕터 제조방법 |
| US6008102A (en) * | 1998-04-09 | 1999-12-28 | Motorola, Inc. | Method of forming a three-dimensional integrated inductor |
| JP3578644B2 (ja) * | 1998-10-12 | 2004-10-20 | Necエレクトロニクス株式会社 | 半導体装置 |
| US6037649A (en) * | 1999-04-01 | 2000-03-14 | Winbond Electronics Corp. | Three-dimension inductor structure in integrated circuit technology |
| JP4005762B2 (ja) * | 1999-06-30 | 2007-11-14 | 株式会社東芝 | 集積回路装置及びその製造方法 |
| JP4200631B2 (ja) * | 2000-03-29 | 2008-12-24 | 沖電気工業株式会社 | オンチップ・コイルとその製造方法 |
| US6429504B1 (en) * | 2000-05-16 | 2002-08-06 | Tyco Electronics Corporation | Multilayer spiral inductor and integrated circuits incorporating the same |
| SG99939A1 (en) * | 2000-08-11 | 2003-11-27 | Casio Computer Co Ltd | Semiconductor device |
| US6342424B1 (en) * | 2001-04-06 | 2002-01-29 | National Semiconductor Corp. | High-Q spiral inductor structure and methods of manufacturing the structure |
| US6650220B2 (en) * | 2002-04-23 | 2003-11-18 | Chartered Semiconductor Manufacturing Ltd. | Parallel spiral stacked inductor on semiconductor material |
| US7135951B1 (en) * | 2003-07-15 | 2006-11-14 | Altera Corporation | Integrated circuit inductors |
| GB2406720B (en) | 2003-09-30 | 2006-09-13 | Agere Systems Inc | An inductor formed in an integrated circuit |
| US7167072B2 (en) * | 2004-03-25 | 2007-01-23 | United Microelectronics Corp. | Method of fabricating inductor and structure formed therefrom |
-
2004
- 2004-09-29 GB GB0421662A patent/GB2406720B/en not_active Expired - Fee Related
- 2004-09-29 TW TW093129464A patent/TWI362098B/zh not_active IP Right Cessation
- 2004-09-29 JP JP2004283352A patent/JP4948756B2/ja not_active Expired - Lifetime
- 2004-09-29 US US10/953,475 patent/US7068139B2/en not_active Expired - Lifetime
- 2004-09-30 KR KR1020040078024A patent/KR101045195B1/ko not_active Expired - Lifetime
-
2006
- 2006-05-01 US US11/414,902 patent/US7541238B2/en not_active Expired - Lifetime
-
2008
- 2008-12-22 US US12/340,813 patent/US7678639B2/en not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5446311A (en) * | 1994-09-16 | 1995-08-29 | International Business Machines Corporation | High-Q inductors in silicon technology without expensive metalization |
| US6083802A (en) * | 1998-12-31 | 2000-07-04 | Winbond Electronics Corporation | Method for forming an inductor |
| US6472285B1 (en) * | 1999-04-30 | 2002-10-29 | Winbond Electronics Corporation | Method for fabricating high-Q inductance device in monolithic technology |
| US6573148B1 (en) * | 2000-07-12 | 2003-06-03 | Koninklljke Philips Electronics N.V. | Methods for making semiconductor inductor |
| US6329234B1 (en) * | 2000-07-24 | 2001-12-11 | Taiwan Semiconductor Manufactuirng Company | Copper process compatible CMOS metal-insulator-metal capacitor structure and its process flow |
| US20030157805A1 (en) * | 2002-02-15 | 2003-08-21 | Schultz Richard T. | Thick traces from multiple damascene layers |
Also Published As
| Publication number | Publication date |
|---|---|
| US7541238B2 (en) | 2009-06-02 |
| JP2005175434A (ja) | 2005-06-30 |
| TWI362098B (en) | 2012-04-11 |
| KR20050032009A (ko) | 2005-04-06 |
| US7068139B2 (en) | 2006-06-27 |
| US20060192647A1 (en) | 2006-08-31 |
| US20090100668A1 (en) | 2009-04-23 |
| TW200520195A (en) | 2005-06-16 |
| GB0421662D0 (en) | 2004-10-27 |
| US7678639B2 (en) | 2010-03-16 |
| JP4948756B2 (ja) | 2012-06-06 |
| GB2406720A (en) | 2005-04-06 |
| KR101045195B1 (ko) | 2011-06-30 |
| US20050099259A1 (en) | 2005-05-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20160929 |