GB2368120A - Optical inspection system - Google Patents

Optical inspection system

Info

Publication number
GB2368120A
GB2368120A GB0201514A GB0201514A GB2368120A GB 2368120 A GB2368120 A GB 2368120A GB 0201514 A GB0201514 A GB 0201514A GB 0201514 A GB0201514 A GB 0201514A GB 2368120 A GB2368120 A GB 2368120A
Authority
GB
United Kingdom
Prior art keywords
border
color
color region
location
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0201514A
Other languages
English (en)
Other versions
GB0201514D0 (en
Inventor
Uri Gold
Eli Parente
Tally Gilat-Bernshtein
Edward Baranovsky
Tamir Margalit
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Orbotech Ltd
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Publication of GB0201514D0 publication Critical patent/GB0201514D0/en
Publication of GB2368120A publication Critical patent/GB2368120A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/12—Edge-based segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/155—Segmentation; Edge detection involving morphological operators
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/69—Microscopic objects, e.g. biological cells or cellular parts
    • G06V20/695—Preprocessing, e.g. image segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GB0201514A 1999-07-25 2000-07-23 Optical inspection system Withdrawn GB2368120A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL131092A IL131092A (en) 1999-07-25 1999-07-25 Optical inspection system
PCT/IL2000/000434 WO2001007893A2 (en) 1999-07-25 2000-07-23 Optical inspection system

Publications (2)

Publication Number Publication Date
GB0201514D0 GB0201514D0 (en) 2002-03-13
GB2368120A true GB2368120A (en) 2002-04-24

Family

ID=11073060

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0201514A Withdrawn GB2368120A (en) 1999-07-25 2000-07-23 Optical inspection system

Country Status (7)

Country Link
US (2) US7200259B1 (enExample)
JP (2) JP4339541B2 (enExample)
AU (1) AU6012800A (enExample)
GB (1) GB2368120A (enExample)
IL (1) IL131092A (enExample)
TW (2) TW536919B (enExample)
WO (1) WO2001007893A2 (enExample)

Families Citing this family (120)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL131092A (en) * 1999-07-25 2006-08-01 Orbotech Ltd Optical inspection system
IL133696A (en) 1999-12-23 2006-04-10 Orbotech Ltd Cam reference inspection of multi-color and contour images
WO2002021105A1 (en) 2000-09-10 2002-03-14 Orbotech, Ltd. Reduction of false alarms in pcb inspection
US7343038B2 (en) * 2001-07-27 2008-03-11 Nippon Sheet Glass Company, Limited Method for evaluating contamination on surface of object and imaging box used for the method
JP4839560B2 (ja) * 2001-09-27 2011-12-21 日本電気株式会社 Ｉｃ外観検査方法
US7430303B2 (en) * 2002-03-29 2008-09-30 Lockheed Martin Corporation Target detection method and system
US7460703B2 (en) 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7124394B1 (en) * 2003-04-06 2006-10-17 Luminescent Technologies, Inc. Method for time-evolving rectilinear contours representing photo masks
US7698665B2 (en) * 2003-04-06 2010-04-13 Luminescent Technologies, Inc. Systems, masks, and methods for manufacturable masks using a functional representation of polygon pattern
JP4238074B2 (ja) * 2003-06-19 2009-03-11 新日本製鐵株式会社 表面疵検査方法
US7778493B2 (en) * 2003-10-09 2010-08-17 The Henry M. Jackson Foundation For The Advancement Of Military Medicine Inc. Pixelation reconstruction for image resolution and image data transmission
AU2004292260A1 (en) * 2003-11-12 2005-06-02 Siemens Corporate Research, Inc. A system and method for filtering and automatic detection of candidate anatomical structures in medical images
WO2006004202A1 (en) * 2004-07-05 2006-01-12 Matsushita Electric Industrial Co., Ltd. Method of generating image of component
JP2006024116A (ja) * 2004-07-09 2006-01-26 Dainippon Screen Mfg Co Ltd カラー画像の領域分割
US9769354B2 (en) 2005-03-24 2017-09-19 Kofax, Inc. Systems and methods of processing scanned data
US9137417B2 (en) 2005-03-24 2015-09-15 Kofax, Inc. Systems and methods for processing video data
US20060227381A1 (en) * 2005-04-06 2006-10-12 Xerox Corporation Edge detection for dispersed-dot binary halftone images
WO2007003438A2 (en) 2005-07-06 2007-01-11 Copf Franz Jun Intervertebral disc prosthesis
US8585764B2 (en) 2005-07-06 2013-11-19 Spontech Spine Intelligence Group Ag Intervertebral disc prosthesis manufacturing method
US7707541B2 (en) * 2005-09-13 2010-04-27 Luminescent Technologies, Inc. Systems, masks, and methods for photolithography
US7921385B2 (en) * 2005-10-03 2011-04-05 Luminescent Technologies Inc. Mask-pattern determination using topology types
WO2007041602A2 (en) * 2005-10-03 2007-04-12 Luminescent Technologies, Inc. Lithography verification using guard bands
US7793253B2 (en) * 2005-10-04 2010-09-07 Luminescent Technologies, Inc. Mask-patterns including intentional breaks
WO2007044557A2 (en) 2005-10-06 2007-04-19 Luminescent Technologies, Inc. System, masks, and methods for photomasks optimized with approximate and accurate merit functions
JP4825021B2 (ja) * 2006-02-28 2011-11-30 株式会社日立ハイテクノロジーズ レポートフォーマット設定方法、レポートフォーマット設定装置、及び欠陥レビューシステム
TWI398157B (zh) * 2006-08-11 2013-06-01 Hon Hai Prec Ind Co Ltd 影像邊界掃描系統及方法
WO2008039674A2 (en) * 2006-09-20 2008-04-03 Luminescent Technologies, Inc. Photo-mask and wafer image reconstruction
US8331645B2 (en) * 2006-09-20 2012-12-11 Luminescent Technologies, Inc. Photo-mask and wafer image reconstruction
US20090092338A1 (en) * 2007-10-05 2009-04-09 Jeffrey Matthew Achong Method And Apparatus For Determining The Direction of Color Dependency Interpolating In Order To Generate Missing Colors In A Color Filter Array
TWI399704B (zh) * 2007-12-31 2013-06-21 Hon Hai Prec Ind Co Ltd 影像雜質分析系統及方法
US9177218B2 (en) * 2008-09-08 2015-11-03 Kofax, Inc. System and method, and computer program product for detecting an edge in scan data
US8774516B2 (en) 2009-02-10 2014-07-08 Kofax, Inc. Systems, methods and computer program products for determining document validity
US8958605B2 (en) 2009-02-10 2015-02-17 Kofax, Inc. Systems, methods and computer program products for determining document validity
US9576272B2 (en) 2009-02-10 2017-02-21 Kofax, Inc. Systems, methods and computer program products for determining document validity
US9767354B2 (en) 2009-02-10 2017-09-19 Kofax, Inc. Global geographic information retrieval, validation, and normalization
US9349046B2 (en) 2009-02-10 2016-05-24 Kofax, Inc. Smart optical input/output (I/O) extension for context-dependent workflows
US8189943B2 (en) * 2009-03-17 2012-05-29 Mitsubishi Electric Research Laboratories, Inc. Method for up-sampling depth images
CN101620060B (zh) * 2009-08-13 2010-12-29 上海交通大学 颗粒大小分布自动检测方法
US20110074804A1 (en) * 2009-09-30 2011-03-31 Nokia Corporation Selection of a region
US8780134B2 (en) 2009-09-30 2014-07-15 Nokia Corporation Access to control of multiple editing effects
TWI408362B (zh) * 2009-10-19 2013-09-11 Innolux Corp 陣列基板與液晶面板的自動檢測方法，製程機台及其陣列基板自動檢測裝置
AU2009250986B2 (en) * 2009-12-16 2013-05-02 Canon Kabushiki Kaisha Rendering piece-wise smooth image from colour values along paths
GB2477116B (en) * 2010-01-22 2014-09-17 Frederick Warwick Michael Stentiford A method and apparatus of processing an image
US9035673B2 (en) * 2010-01-25 2015-05-19 Palo Alto Research Center Incorporated Method of in-process intralayer yield detection, interlayer shunt detection and correction
US9232670B2 (en) 2010-02-02 2016-01-05 Apple Inc. Protection and assembly of outer glass surfaces of an electronic device housing
US8463016B2 (en) * 2010-02-05 2013-06-11 Luminescent Technologies, Inc. Extending the field of view of a mask-inspection image
JP2011216080A (ja) * 2010-03-18 2011-10-27 Canon Inc 画像処理装置、画像処理方法、および記憶媒体
US8555214B2 (en) 2010-09-14 2013-10-08 Luminescent Technologies, Inc. Technique for analyzing a reflective photo-mask
US8612903B2 (en) 2010-09-14 2013-12-17 Luminescent Technologies, Inc. Technique for repairing a reflective photo-mask
JP5574379B2 (ja) * 2010-10-13 2014-08-20 富士機械製造株式会社 画像処理装置及び画像処理方法
US8386968B2 (en) 2010-11-29 2013-02-26 Luminescent Technologies, Inc. Virtual photo-mask critical-dimension measurement
US8458622B2 (en) 2010-11-29 2013-06-04 Luminescent Technologies, Inc. Photo-mask acceptance technique
US9005852B2 (en) 2012-09-10 2015-04-14 Dino Technology Acquisition Llc Technique for repairing a reflective photo-mask
US8653454B2 (en) 2011-07-13 2014-02-18 Luminescent Technologies, Inc. Electron-beam image reconstruction
NL2009853A (en) 2011-12-23 2013-06-26 Asml Netherlands Bv Methods and apparatus for measuring a property of a substrate.
US9158967B2 (en) 2012-01-12 2015-10-13 Kofax, Inc. Systems and methods for mobile image capture and processing
US9058515B1 (en) 2012-01-12 2015-06-16 Kofax, Inc. Systems and methods for identification document processing and business workflow integration
US9058580B1 (en) 2012-01-12 2015-06-16 Kofax, Inc. Systems and methods for identification document processing and business workflow integration
US9483794B2 (en) 2012-01-12 2016-11-01 Kofax, Inc. Systems and methods for identification document processing and business workflow integration
US10146795B2 (en) 2012-01-12 2018-12-04 Kofax, Inc. Systems and methods for mobile image capture and processing
KR102056664B1 (ko) * 2012-10-04 2019-12-17 한국전자통신연구원 센서를 이용한 작업 방법 및 이를 수행하는 작업 시스템
US9091935B2 (en) 2013-03-11 2015-07-28 Kla-Tencor Corporation Multistage extreme ultra-violet mask qualification
US9208536B2 (en) 2013-09-27 2015-12-08 Kofax, Inc. Systems and methods for three dimensional geometric reconstruction of captured image data
US9311531B2 (en) 2013-03-13 2016-04-12 Kofax, Inc. Systems and methods for classifying objects in digital images captured using mobile devices
US9355312B2 (en) 2013-03-13 2016-05-31 Kofax, Inc. Systems and methods for classifying objects in digital images captured using mobile devices
US9494854B2 (en) 2013-03-14 2016-11-15 Kla-Tencor Corporation Technique for repairing an EUV photo-mask
US20140316841A1 (en) 2013-04-23 2014-10-23 Kofax, Inc. Location-based workflows and services
CN105518704A (zh) 2013-05-03 2016-04-20 柯法克斯公司 检测和分类使用移动设备采集的视频中对象的系统和方法
CN103308523B (zh) * 2013-05-28 2015-04-15 清华大学 多尺度瓶口缺陷检测方法及装置
WO2015073920A1 (en) 2013-11-15 2015-05-21 Kofax, Inc. Systems and methods for generating composite images of long documents using mobile video data
EP3078004B1 (de) * 2013-12-02 2023-02-15 Leonhard Kurz Stiftung & Co. KG Verfahren zum authentifizieren eines sicherheitselements
GB2522663B (en) * 2014-01-31 2020-02-12 Apical Ltd A method of selecting a region of interest
US9760788B2 (en) 2014-10-30 2017-09-12 Kofax, Inc. Mobile document detection and orientation based on reference object characteristics
JP2016090548A (ja) * 2014-11-11 2016-05-23 株式会社東芝 ひび割れ情報収集方法及びひび割れ情報収集プログラム
JP2016090547A (ja) * 2014-11-11 2016-05-23 株式会社東芝 ひび割れ情報収集装置及びひび割れ情報を収集するためのサーバ装置
US9747520B2 (en) * 2015-03-16 2017-08-29 Kla-Tencor Corporation Systems and methods for enhancing inspection sensitivity of an inspection tool
DE102015204800B3 (de) * 2015-03-17 2016-12-01 MTU Aero Engines AG Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines additiven Herstellungsverfahrens hergestellten Bauteils
US9909860B2 (en) 2015-04-15 2018-03-06 General Electric Company Systems and methods for monitoring component deformation
US10697760B2 (en) 2015-04-15 2020-06-30 General Electric Company Data acquisition devices, systems and method for analyzing strain sensors and monitoring component strain
US9557164B2 (en) * 2015-04-15 2017-01-31 General Electric Company Data acquisition devices, systems and method for analyzing strain sensors and monitoring turbine component strain
US9932853B2 (en) 2015-04-28 2018-04-03 General Electric Company Assemblies and methods for monitoring turbine component strain
JP6512965B2 (ja) * 2015-07-01 2019-05-15 キヤノン株式会社 画像処理装置および画像処理方法
JP6478840B2 (ja) * 2015-07-01 2019-03-06 キヤノン株式会社 画像処理装置および画像処理方法
JP6433384B2 (ja) * 2015-07-01 2018-12-05 キヤノン株式会社 画像処理装置および画像処理方法
US10242285B2 (en) 2015-07-20 2019-03-26 Kofax, Inc. Iterative recognition-guided thresholding and data extraction
US9953408B2 (en) 2015-11-16 2018-04-24 General Electric Company Methods for monitoring components
US9846933B2 (en) 2015-11-16 2017-12-19 General Electric Company Systems and methods for monitoring components
US9733062B2 (en) 2015-11-20 2017-08-15 General Electric Company Systems and methods for monitoring component strain
US10012552B2 (en) 2015-11-23 2018-07-03 General Electric Company Systems and methods for monitoring component strain
US9967523B2 (en) 2015-12-16 2018-05-08 General Electric Company Locating systems and methods for components
CN105509643B (zh) * 2016-01-04 2019-04-19 京东方科技集团股份有限公司 一种亚像素单元线宽的测量方法及装置
US9779296B1 (en) 2016-04-01 2017-10-03 Kofax, Inc. Content-based detection and three dimensional geometric reconstruction of objects in image and video data
US9879981B1 (en) 2016-12-02 2018-01-30 General Electric Company Systems and methods for evaluating component strain
US10132615B2 (en) 2016-12-20 2018-11-20 General Electric Company Data acquisition devices, systems and method for analyzing passive strain indicators and monitoring turbine component strain
US10126119B2 (en) 2017-01-17 2018-11-13 General Electric Company Methods of forming a passive strain indicator on a preexisting component
US10872176B2 (en) 2017-01-23 2020-12-22 General Electric Company Methods of making and monitoring a component with an integral strain indicator
US11313673B2 (en) 2017-01-24 2022-04-26 General Electric Company Methods of making a component with an integral strain indicator
US10345179B2 (en) 2017-02-14 2019-07-09 General Electric Company Passive strain indicator
US10502551B2 (en) 2017-03-06 2019-12-10 General Electric Company Methods for monitoring components using micro and macro three-dimensional analysis
US10451499B2 (en) 2017-04-06 2019-10-22 General Electric Company Methods for applying passive strain indicators to components
KR102309569B1 (ko) * 2017-06-14 2021-10-07 캠텍 리미티드 자동 결함 분류
US11062176B2 (en) 2017-11-30 2021-07-13 Kofax, Inc. Object detection and image cropping using a multi-detector approach
TWI721385B (zh) * 2018-07-08 2021-03-11 香港商康代影像技術方案香港有限公司 產生印刷電路板合成彩色影像之技術
US11010887B2 (en) 2018-09-17 2021-05-18 General Electric Company Automated distress ranking system
CN111175302A (zh) * 2018-11-13 2020-05-19 晶彩科技股份有限公司 复合检测条件的光学影像自动撷取方法
US11423527B2 (en) 2018-11-20 2022-08-23 Bnsf Railway Company System and method for minimizing lost vehicle axel motion and filtering erroneous electrical signals
US10984521B2 (en) 2018-11-20 2021-04-20 Bnsf Railway Company Systems and methods for determining defects in physical objects
US12373930B2 (en) 2018-11-20 2025-07-29 Bnsf Railway Company Computational heuristic encoder enhancement relay system
US11508055B2 (en) 2018-11-20 2022-11-22 Bnsf Railway Company Systems and methods for calibrating image capturing modules
CN109886914B (zh) * 2018-12-19 2020-01-17 浙江企银印务科技有限公司 基于局部亮度不变性先验的纸张缺陷检测方法
DE102019116103B4 (de) 2019-06-13 2021-04-22 Notion Systems GmbH Verfahren zum Beschriften einer Leiterplatte durch Erzeugen von Schattierungen in einer funktionalen Lackschicht
CN110793454A (zh) * 2019-11-04 2020-02-14 如冈自动化控制技术(上海)有限公司 一种激光检测塞子插孔深度的装置和方法
IL295078B2 (en) 2020-02-16 2025-10-01 Orbotech Ltd System and method for testing multiple characteristics of sample objects in the production of electrical circuits
CN114022403A (zh) * 2020-07-16 2022-02-08 京东方科技集团股份有限公司 检测显示面板不良的方法及装置
CN112017157B (zh) * 2020-07-21 2023-04-11 中国科学院西安光学精密机械研究所 一种光学元件激光损伤阈值测试中损伤点识别方法
CN113109368B (zh) * 2021-03-12 2023-09-01 浙江华睿科技股份有限公司 玻璃裂纹检测方法、装置、设备及介质
CN113516193B (zh) * 2021-07-19 2024-03-01 中国农业大学 基于图像处理的红枣缺陷识别分类方法及装置
CN116563288B (zh) * 2023-07-11 2023-09-05 深圳市欣精艺科技有限公司 一种汽车发动机齿轮螺纹孔检测方法
CN116645364B (zh) * 2023-07-18 2023-10-27 金乡县金沪合金钢有限公司 一种基于图像数据的合金钢铸件气孔缺陷检测方法
CN118329887B (zh) * 2024-04-22 2025-05-02 深圳市航达高新材料有限公司 芯片封装件的检测方法、装置、设备及存储介质

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5774572A (en) 1984-12-20 1998-06-30 Orbotech Ltd. Automatic visual inspection system
US5774573A (en) 1984-12-20 1998-06-30 Orbotech Ltd. Automatic visual inspection system
JPS61229175A (ja) * 1985-04-03 1986-10-13 Nec Corp パタ−ン情報処理方式
US4928313A (en) * 1985-10-25 1990-05-22 Synthetic Vision Systems, Inc. Method and system for automatically visually inspecting an article
IL81450A (en) 1987-02-02 1994-10-07 Orbotech Ltd Lighting device for optical scanners
US4758888A (en) 1987-02-17 1988-07-19 Orbot Systems, Ltd. Method of and means for inspecting workpieces traveling along a production line
US4923066A (en) * 1987-10-08 1990-05-08 Elor Optronics Ltd. Small arms ammunition inspection system
US5058982A (en) 1989-06-21 1991-10-22 Orbot Systems Ltd. Illumination system and inspection apparatus including same
US5586058A (en) 1990-12-04 1996-12-17 Orbot Instruments Ltd. Apparatus and method for inspection of a patterned object by comparison thereof to a reference
US5544256A (en) * 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
JPH07183697A (ja) * 1993-12-24 1995-07-21 Matsushita Electric Ind Co Ltd 電子部品実装装置
US6005978A (en) * 1996-02-07 1999-12-21 Cognex Corporation Robust search for image features across image sequences exhibiting non-uniform changes in brightness
US5917332A (en) * 1996-05-09 1999-06-29 Advanced Micro Devices, Inc. Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer
US5963662A (en) * 1996-08-07 1999-10-05 Georgia Tech Research Corporation Inspection system and method for bond detection and validation of surface mount devices
JPH10149441A (ja) * 1996-11-20 1998-06-02 Casio Comput Co Ltd 画像処理方法、及びその装置
IL120071A (en) 1997-01-24 2002-03-10 Orbotech Ltd Method and system for continuously processing workpieces along a production line
US6201892B1 (en) * 1997-02-26 2001-03-13 Acuity Imaging, Llc System and method for arithmetic operations for electronic package inspection
US6895109B1 (en) * 1997-09-04 2005-05-17 Texas Instruments Incorporated Apparatus and method for automatically detecting defects on silicon dies on silicon wafers
US6586829B1 (en) * 1997-12-18 2003-07-01 Si Diamond Technology, Inc. Ball grid array package
EP1105716B1 (en) 1998-08-18 2005-10-26 Orbotech Ltd. Inspection of printed circuit boards using color
AU9456298A (en) 1998-09-28 2000-04-17 Orbotech Ltd. Pixel coding and image processing method
US6385342B1 (en) * 1998-11-13 2002-05-07 Xerox Corporation Blocking signature detection for identification of JPEG images
US6489586B1 (en) * 1999-04-29 2002-12-03 Cad-Tech, Inc. Method and apparatus for verification of assembled printed circuit boards
US6603877B1 (en) * 1999-06-01 2003-08-05 Beltronics, Inc. Method of and apparatus for optical imaging inspection of multi-material objects and the like
IL131092A (en) * 1999-07-25 2006-08-01 Orbotech Ltd Optical inspection system
US6456899B1 (en) * 1999-12-07 2002-09-24 Ut-Battelle, Llc Context-based automated defect classification system using multiple morphological masks
US6586839B2 (en) * 2000-08-31 2003-07-01 Texas Instruments Incorporated Approach to structurally reinforcing the mechanical performance of silicon level interconnect layers

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Not yet advised *

Also Published As

Publication number Publication date
GB0201514D0 (en) 2002-03-13
JP5086789B2 (ja) 2012-11-28
AU6012800A (en) 2001-02-13
TW512636B (en) 2002-12-01
TW536919B (en) 2003-06-11
US7200259B1 (en) 2007-04-03
WO2001007893A2 (en) 2001-02-01
JP4339541B2 (ja) 2009-10-07
US20070133862A1 (en) 2007-06-14
JP2003511651A (ja) 2003-03-25
JP2008164597A (ja) 2008-07-17
IL131092A (en) 2006-08-01
WO2001007893A3 (en) 2002-06-27
IL131092A0 (en) 2001-01-28

Similar Documents

Publication Publication Date Title
GB2368120A (en) Optical inspection system
EP0669587A3 (en) Network system for viewing multimedia presentations.
DE69926659D1 (de) Verfahren und vorrichtung für die optische Inspektion von Objekten auf einem Substrat
EP0644476A3 (en) Procedure for changing the display dimensions of the handwritten inputs.
DE69835250D1 (de) Bildanzeigesystem, Informationsverarbeitungsgerät und Verfahren zur Steuerung desselben
DK0437073T3 (da) Tonerfremkaldt, elektrostatisk fremgangsmåde til billeddannelse til udendørsskilte
DE69616006D1 (de) Vorrichtung zum darstellen autostereoskopischer bilder
EP0933727A3 (en) Image information processing apparatus and its method
DE69625075D1 (de) System und verfahren zur synchronisierung von web-seiten
DE59908887D1 (de) Verfahren zur ein- bzw. abschaltung von verbrauchern
DK0826068T3 (da) Fremgangsmåde til diagnosticering af skizofreni
EP1045328A3 (en) Automated optical detection system and method.
EP1383084A3 (en) Method and apparatus of inspecting surface irregularity of an object article
EP0654750A3 (en) Data analysis method defining an image.
DE69936368D1 (de) Verbessertes Anzeigeverfahren für Bilder mit Graustufen
DE69828641D1 (de) Verfahren und vorrichtung zum erfassen von schmutz auf gegenständen, zum beispiel eiern
EP0638819A3 (en) Method for detecting adjacent transponders.
AU7655291A (en) Inspecting garments
DE60232161D1 (de) Verfahren zum anzeigen von videobildern, z.b. bei einer plasmaanzeigetafel
DE50212561D1 (de) Verfahren zur Erkennung und Verfolgung von Objekten
FI97008C (fi) Menetelmä videokuvan ennustamiseksi käsittelyjärjestyksessä edellisen kuvan perusteella
FI960110A7 (fi) Menetelmä piirtojen segmentoimiseksi käsinkirjoitetulla syötteellä
DE69623980D1 (de) Vorrichtung und system zur automatisierten sortierung
EP0578138A3 (en) Method for the detection of genes.
DE69012863D1 (de) Verfahren zum Betreiben einer Bilddarstellungsvorrichtung.

Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)