GB2352884B - Probe tip terminating device providing an easily changable feed-through termination - Google Patents

Probe tip terminating device providing an easily changable feed-through termination

Info

Publication number
GB2352884B
GB2352884B GB0017053A GB0017053A GB2352884B GB 2352884 B GB2352884 B GB 2352884B GB 0017053 A GB0017053 A GB 0017053A GB 0017053 A GB0017053 A GB 0017053A GB 2352884 B GB2352884 B GB 2352884B
Authority
GB
United Kingdom
Prior art keywords
changable
termination
feed
probe tip
device providing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0017053A
Other languages
English (en)
Other versions
GB2352884A (en
GB0017053D0 (en
Inventor
Donald A Whiteman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of GB0017053D0 publication Critical patent/GB0017053D0/en
Publication of GB2352884A publication Critical patent/GB2352884A/en
Application granted granted Critical
Publication of GB2352884B publication Critical patent/GB2352884B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB0017053A 1999-07-29 2000-07-11 Probe tip terminating device providing an easily changable feed-through termination Expired - Fee Related GB2352884B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/354,759 US6407562B1 (en) 1999-07-29 1999-07-29 Probe tip terminating device providing an easily changeable feed-through termination

Publications (3)

Publication Number Publication Date
GB0017053D0 GB0017053D0 (en) 2000-08-30
GB2352884A GB2352884A (en) 2001-02-07
GB2352884B true GB2352884B (en) 2003-03-05

Family

ID=23394800

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0017053A Expired - Fee Related GB2352884B (en) 1999-07-29 2000-07-11 Probe tip terminating device providing an easily changable feed-through termination

Country Status (4)

Country Link
US (1) US6407562B1 (enExample)
JP (1) JP2001066324A (enExample)
DE (1) DE10028381A1 (enExample)
GB (1) GB2352884B (enExample)

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US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
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US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
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US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
EP1932003A2 (en) 2005-06-13 2008-06-18 Cascade Microtech, Inc. Wideband active-passive differential signal probe
DE112007001399T5 (de) 2006-06-09 2009-05-07 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
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US8593156B2 (en) 2010-11-22 2013-11-26 General Electric Company Sensor assembly and microwave emitter for use in a sensor assembly
US8624603B2 (en) 2010-11-22 2014-01-07 General Electric Company Sensor assembly and methods of adjusting the operation of a sensor
US8531191B2 (en) 2010-11-22 2013-09-10 General Electric Company Sensor assembly and methods of measuring a proximity of a machine component to a sensor
US8854052B2 (en) 2010-11-22 2014-10-07 General Electric Company Sensor assembly and method of measuring the proximity of a machine component to a sensor
US8482456B2 (en) 2010-12-16 2013-07-09 General Electric Company Sensor assembly and method of measuring the proximity of a machine component to an emitter
US8742319B2 (en) 2011-12-13 2014-06-03 General Electric Company Sensor and inspection system deploying an optical conduit
US20130328549A1 (en) * 2012-06-07 2013-12-12 Chung Instrument Electronics Industrial Co., Ltd. Rotating mobile probe and probing rod using the same
CN104122417B (zh) * 2013-04-26 2018-09-25 苏州普源精电科技有限公司 一种一体式探头及具有一体式探头的测试测量仪器
US9188606B2 (en) 2013-04-29 2015-11-17 Keysight Technologies, Inc. Oscilloscope current probe with interchangeable range and sensitivity setting modules
US9417266B2 (en) 2014-01-16 2016-08-16 International Business Machines Corporation Implementing handheld transfer impedance probe
JP6455451B2 (ja) * 2015-03-24 2019-01-23 三菱電機株式会社 同軸プローブ
US10451515B2 (en) * 2016-09-19 2019-10-22 Electro Scan, Inc. Electric field expansion system for low voltage conductivity inspection
US10816431B1 (en) 2017-09-18 2020-10-27 Electro Scan, Inc. Leak detection system for underground access chambers using conductivity
CN111541072B (zh) * 2020-03-31 2021-10-26 深圳三星通信技术研究有限公司 一种测试转接器
US12174243B2 (en) * 2022-12-14 2024-12-24 Tron Future Tech Inc. Probe assembly, system and method for testing rf device of phased array antenna

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JPH0886808A (ja) * 1994-07-20 1996-04-02 Sony Tektronix Corp 高電圧プローブ

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JPS6221064A (ja) * 1985-07-19 1987-01-29 Koichi Yoshida スプリング・コンタクト式プロ−ブ
EP0513992A1 (en) * 1991-04-24 1992-11-19 Hewlett-Packard Company Wide bandwidth passive probe
JPH0886808A (ja) * 1994-07-20 1996-04-02 Sony Tektronix Corp 高電圧プローブ

Also Published As

Publication number Publication date
US6407562B1 (en) 2002-06-18
JP2001066324A (ja) 2001-03-16
DE10028381A1 (de) 2001-03-01
GB2352884A (en) 2001-02-07
GB0017053D0 (en) 2000-08-30

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040711