AU5759600A - Probe device using superelastic probe elements - Google Patents

Probe device using superelastic probe elements

Info

Publication number
AU5759600A
AU5759600A AU57596/00A AU5759600A AU5759600A AU 5759600 A AU5759600 A AU 5759600A AU 57596/00 A AU57596/00 A AU 57596/00A AU 5759600 A AU5759600 A AU 5759600A AU 5759600 A AU5759600 A AU 5759600A
Authority
AU
Australia
Prior art keywords
probe
superelastic
elements
probe device
probe elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU57596/00A
Inventor
Marshall J. Dana
Alan E. Humphrey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Test Solutions LLC
Original Assignee
Int Test Solutions Inc
International Test Solutions LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Test Solutions Inc, International Test Solutions LLC filed Critical Int Test Solutions Inc
Publication of AU5759600A publication Critical patent/AU5759600A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
AU57596/00A 1999-06-22 2000-06-22 Probe device using superelastic probe elements Abandoned AU5759600A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US14023199P 1999-06-22 1999-06-22
US60140231 1999-06-22
US60254500A 2000-06-21 2000-06-21
US09602545 2000-06-21
PCT/US2000/017238 WO2000079293A1 (en) 1999-06-22 2000-06-22 Probe device using superelastic probe elements

Publications (1)

Publication Number Publication Date
AU5759600A true AU5759600A (en) 2001-01-09

Family

ID=26837992

Family Applications (1)

Application Number Title Priority Date Filing Date
AU57596/00A Abandoned AU5759600A (en) 1999-06-22 2000-06-22 Probe device using superelastic probe elements

Country Status (2)

Country Link
AU (1) AU5759600A (en)
WO (1) WO2000079293A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5514619B2 (en) * 2009-12-24 2014-06-04 ガーディアンジャパン株式会社 Wiring inspection jig
DE102010033991A1 (en) 2010-03-11 2011-12-01 Rhode & Schwarz Gmbh & Co. Kg Measuring tip with integrated transducer
SG11201704433TA (en) * 2014-12-30 2017-07-28 Technoprobe Spa Contact probe for testing head
CN106154136B (en) * 2016-06-20 2018-11-16 泉州市弘丰农农业技术有限公司 A kind of detection jig of operational amplifier integrated circuit
IT201700021400A1 (en) * 2017-02-24 2018-08-24 Technoprobe Spa Measuring head with vertical probes with improved frequency properties
TW201942581A (en) 2018-03-30 2019-11-01 日商日本電產理德股份有限公司 Inspection jig, and inspecting device provided with same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3659662B2 (en) * 1993-12-24 2005-06-15 株式会社デンソー Probe contact
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US6084420A (en) * 1998-11-25 2000-07-04 Chee; Wan Soo Probe assembly for testing

Also Published As

Publication number Publication date
WO2000079293A1 (en) 2000-12-28

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase