AU5759600A - Probe device using superelastic probe elements - Google Patents

Probe device using superelastic probe elements

Info

Publication number
AU5759600A
AU5759600A AU57596/00A AU5759600A AU5759600A AU 5759600 A AU5759600 A AU 5759600A AU 57596/00 A AU57596/00 A AU 57596/00A AU 5759600 A AU5759600 A AU 5759600A AU 5759600 A AU5759600 A AU 5759600A
Authority
AU
Australia
Prior art keywords
probe
superelastic
elements
device
probe device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU57596/00A
Inventor
Marshall J. Dana
Alan E. Humphrey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Test Solutions Inc
Original Assignee
Int Test Solutions Inc
International Test Solutions Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US14023199P priority Critical
Priority to US60140231 priority
Priority to US60254500A priority
Priority to US09602545 priority
Application filed by Int Test Solutions Inc, International Test Solutions Inc filed Critical Int Test Solutions Inc
Priority to PCT/US2000/017238 priority patent/WO2000079293A1/en
Publication of AU5759600A publication Critical patent/AU5759600A/en
Application status is Abandoned legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
AU57596/00A 1999-06-22 2000-06-22 Probe device using superelastic probe elements Abandoned AU5759600A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US14023199P true 1999-06-22 1999-06-22
US60140231 1999-06-22
US60254500A true 2000-06-21 2000-06-21
US09602545 2000-06-21
PCT/US2000/017238 WO2000079293A1 (en) 1999-06-22 2000-06-22 Probe device using superelastic probe elements

Publications (1)

Publication Number Publication Date
AU5759600A true AU5759600A (en) 2001-01-09

Family

ID=26837992

Family Applications (1)

Application Number Title Priority Date Filing Date
AU57596/00A Abandoned AU5759600A (en) 1999-06-22 2000-06-22 Probe device using superelastic probe elements

Country Status (2)

Country Link
AU (1) AU5759600A (en)
WO (1) WO2000079293A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5514619B2 (en) * 2009-12-24 2014-06-04 ガーディアンジャパン株式会社 Wiring inspection jig
DE102010033991A1 (en) 2010-03-11 2011-12-01 Rhode & Schwarz Gmbh & Co. Kg Probe tip with integrated transducer
JP2018501490A (en) * 2014-12-30 2018-01-18 テクノプローベ エス.ピー.エー. Contact probe for test head
CN106154136B (en) * 2016-06-20 2018-11-16 泉州市弘丰农农业技术有限公司 A kind of detection jig of operational amplifier integrated circuit

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3659662B2 (en) * 1993-12-24 2005-06-15 株式会社デンソー Probe contact
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US6084420A (en) * 1998-11-25 2000-07-04 Chee; Wan Soo Probe assembly for testing

Also Published As

Publication number Publication date
WO2000079293A1 (en) 2000-12-28

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase