AU1864401A - Measuring device - Google Patents
Measuring deviceInfo
- Publication number
- AU1864401A AU1864401A AU18644/01A AU1864401A AU1864401A AU 1864401 A AU1864401 A AU 1864401A AU 18644/01 A AU18644/01 A AU 18644/01A AU 1864401 A AU1864401 A AU 1864401A AU 1864401 A AU1864401 A AU 1864401A
- Authority
- AU
- Australia
- Prior art keywords
- measuring device
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19960880 | 1999-12-17 | ||
DE1999160880 DE19960880A1 (en) | 1999-12-17 | 1999-12-17 | Measuring device |
PCT/EP2000/012831 WO2001044752A1 (en) | 1999-12-17 | 2000-12-15 | Measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
AU1864401A true AU1864401A (en) | 2001-06-25 |
Family
ID=7933014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU18644/01A Abandoned AU1864401A (en) | 1999-12-17 | 2000-12-15 | Measuring device |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1153266A1 (en) |
AU (1) | AU1864401A (en) |
DE (1) | DE19960880A1 (en) |
WO (1) | WO2001044752A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10138167A1 (en) * | 2001-08-03 | 2003-02-27 | Saremo Objektfinish Ag | Equipment and method for specific application of coating material employing thermal camera to determine thickness and finish |
FR2897687B1 (en) * | 2006-02-17 | 2008-09-26 | Commissariat Energie Atomique | METHOD AND DEVICE FOR CHARACTERIZING, BY ACTIVE PYROMETRY, A THIN-LAYER MATERIAL ARRANGED ON A SUBSTRATE |
US9557164B2 (en) * | 2015-04-15 | 2017-01-31 | General Electric Company | Data acquisition devices, systems and method for analyzing strain sensors and monitoring turbine component strain |
EP3086087B1 (en) * | 2015-04-20 | 2021-07-07 | OptiSense GmbH & Co. KG | Photo thermal measuring device and method for photo thermal measuring |
CN107401988B (en) * | 2017-09-08 | 2023-09-15 | 成都中住光纤有限公司 | Optical fiber coating concentricity monitoring system |
DE102019104260A1 (en) * | 2019-02-20 | 2020-08-20 | Stefan Böttger | Method and device for determining a layer thickness of a layer applied to a substrate |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3034944C2 (en) * | 1980-09-01 | 1985-01-17 | Gerhard Dr. 8029 Sauerlach Busse | Method and device for the photothermal structure investigation of solid bodies |
FR2593917B1 (en) * | 1986-02-06 | 1988-06-03 | Univ Reims Champagne Ardenne | METHOD AND DEVICE FOR ANALYSIS AND MEASUREMENT OF PHYSICAL PARAMETERS OF A LAYERED MATERIAL BY THERMAL RADIOMETRY |
DE3631652C2 (en) * | 1986-09-17 | 1994-05-19 | Siemens Ag | Measuring arrangement for non-contact thickness determination |
DE4003407A1 (en) * | 1990-02-05 | 1991-08-08 | Siemens Ag | Testing surfaces of moving objects - by photo-thermal heat wave analysis using fixed measurement arrangement with measurement spot inside thermal radiation spot |
DE4343076C2 (en) * | 1993-12-16 | 1997-04-03 | Phototherm Dr Petry Gmbh | Device for photothermal testing of a surface of an object in particular being moved |
-
1999
- 1999-12-17 DE DE1999160880 patent/DE19960880A1/en not_active Withdrawn
-
2000
- 2000-12-15 WO PCT/EP2000/012831 patent/WO2001044752A1/en not_active Application Discontinuation
- 2000-12-15 EP EP00981382A patent/EP1153266A1/en not_active Withdrawn
- 2000-12-15 AU AU18644/01A patent/AU1864401A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
DE19960880A1 (en) | 2001-06-21 |
WO2001044752A1 (en) | 2001-06-21 |
EP1153266A1 (en) | 2001-11-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |