AU1864401A - Measuring device - Google Patents

Measuring device

Info

Publication number
AU1864401A
AU1864401A AU18644/01A AU1864401A AU1864401A AU 1864401 A AU1864401 A AU 1864401A AU 18644/01 A AU18644/01 A AU 18644/01A AU 1864401 A AU1864401 A AU 1864401A AU 1864401 A AU1864401 A AU 1864401A
Authority
AU
Australia
Prior art keywords
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU18644/01A
Inventor
Paul Huber
Raiko Milanovic
Frank Schlagenhauf
Bernhard Schmitz
Jorg Sopka
Dietmar Treibert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Research Ltd Sweden
Original Assignee
ABB Research Ltd Sweden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Research Ltd Sweden filed Critical ABB Research Ltd Sweden
Publication of AU1864401A publication Critical patent/AU1864401A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
AU18644/01A 1999-12-17 2000-12-15 Measuring device Abandoned AU1864401A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19960880 1999-12-17
DE1999160880 DE19960880A1 (en) 1999-12-17 1999-12-17 Measuring device
PCT/EP2000/012831 WO2001044752A1 (en) 1999-12-17 2000-12-15 Measuring device

Publications (1)

Publication Number Publication Date
AU1864401A true AU1864401A (en) 2001-06-25

Family

ID=7933014

Family Applications (1)

Application Number Title Priority Date Filing Date
AU18644/01A Abandoned AU1864401A (en) 1999-12-17 2000-12-15 Measuring device

Country Status (4)

Country Link
EP (1) EP1153266A1 (en)
AU (1) AU1864401A (en)
DE (1) DE19960880A1 (en)
WO (1) WO2001044752A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10138167A1 (en) * 2001-08-03 2003-02-27 Saremo Objektfinish Ag Equipment and method for specific application of coating material employing thermal camera to determine thickness and finish
FR2897687B1 (en) * 2006-02-17 2008-09-26 Commissariat Energie Atomique METHOD AND DEVICE FOR CHARACTERIZING, BY ACTIVE PYROMETRY, A THIN-LAYER MATERIAL ARRANGED ON A SUBSTRATE
US9557164B2 (en) * 2015-04-15 2017-01-31 General Electric Company Data acquisition devices, systems and method for analyzing strain sensors and monitoring turbine component strain
EP3086087B1 (en) * 2015-04-20 2021-07-07 OptiSense GmbH & Co. KG Photo thermal measuring device and method for photo thermal measuring
CN107401988B (en) * 2017-09-08 2023-09-15 成都中住光纤有限公司 Optical fiber coating concentricity monitoring system
DE102019104260A1 (en) * 2019-02-20 2020-08-20 Stefan Böttger Method and device for determining a layer thickness of a layer applied to a substrate

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3034944C2 (en) * 1980-09-01 1985-01-17 Gerhard Dr. 8029 Sauerlach Busse Method and device for the photothermal structure investigation of solid bodies
FR2593917B1 (en) * 1986-02-06 1988-06-03 Univ Reims Champagne Ardenne METHOD AND DEVICE FOR ANALYSIS AND MEASUREMENT OF PHYSICAL PARAMETERS OF A LAYERED MATERIAL BY THERMAL RADIOMETRY
DE3631652C2 (en) * 1986-09-17 1994-05-19 Siemens Ag Measuring arrangement for non-contact thickness determination
DE4003407A1 (en) * 1990-02-05 1991-08-08 Siemens Ag Testing surfaces of moving objects - by photo-thermal heat wave analysis using fixed measurement arrangement with measurement spot inside thermal radiation spot
DE4343076C2 (en) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Device for photothermal testing of a surface of an object in particular being moved

Also Published As

Publication number Publication date
DE19960880A1 (en) 2001-06-21
WO2001044752A1 (en) 2001-06-21
EP1153266A1 (en) 2001-11-14

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase