GB1523458A - Wien filter - Google Patents
Wien filterInfo
- Publication number
- GB1523458A GB1523458A GB43796/75A GB4379675A GB1523458A GB 1523458 A GB1523458 A GB 1523458A GB 43796/75 A GB43796/75 A GB 43796/75A GB 4379675 A GB4379675 A GB 4379675A GB 1523458 A GB1523458 A GB 1523458A
- Authority
- GB
- United Kingdom
- Prior art keywords
- coils
- coil
- magnetic field
- wien filter
- core
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 abstract 3
- 230000005684 electric field Effects 0.000 abstract 1
- 238000004804 winding Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
- H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
- H01J49/288—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/466—Static spectrometers using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7415318A NL7415318A (nl) | 1974-11-25 | 1974-11-25 | Wienfilter. |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1523458A true GB1523458A (en) | 1978-08-31 |
Family
ID=19822525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB43796/75A Expired GB1523458A (en) | 1974-11-25 | 1975-10-24 | Wien filter |
Country Status (6)
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2182485A (en) * | 1985-10-16 | 1987-05-13 | Hitachi Ltd | Ion beam apparatus |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4287419A (en) * | 1978-05-22 | 1981-09-01 | The United States Of America As Represented By The United States Department Of Energy | Strong focus space charge |
US4315153A (en) * | 1980-05-19 | 1982-02-09 | Hughes Aircraft Company | Focusing ExB mass separator for space-charge dominated ion beams |
JPS57206173A (en) * | 1981-06-15 | 1982-12-17 | Nippon Telegr & Teleph Corp <Ntt> | Focusing deflecting device for charged corpuscule beam |
JPS58169856A (ja) * | 1982-03-31 | 1983-10-06 | Jeol Ltd | 荷電粒子線装置 |
US4661712A (en) * | 1985-05-28 | 1987-04-28 | Varian Associates, Inc. | Apparatus for scanning a high current ion beam with a constant angle of incidence |
EP0236807A3 (de) * | 1986-03-07 | 1990-05-16 | Siemens Aktiengesellschaft | Spektrometerobjektiv für die Korpuskularstrahl-Messtechnik |
US4775789A (en) * | 1986-03-19 | 1988-10-04 | Albridge Jr Royal G | Method and apparatus for producing neutral atomic and molecular beams |
US4789787A (en) * | 1987-05-27 | 1988-12-06 | Microbeam Inc. | Wien filter design |
DE3813641A1 (de) * | 1988-01-26 | 1989-08-03 | Finnigan Mat Gmbh | Doppelfokussierendes massenspektrometer und ms/ms-anordnung |
EP0501257B1 (en) * | 1991-02-22 | 1996-08-21 | Shimadzu Corporation | Ion scattering spectrometer |
US5374913A (en) * | 1991-12-13 | 1994-12-20 | Houston Advanced Research Center | Twin-bore flux pipe dipole magnet |
JP3757371B2 (ja) * | 1999-07-05 | 2006-03-22 | 日本電子株式会社 | エネルギーフィルタ及びそれを用いた電子顕微鏡 |
US6815668B2 (en) * | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
US6806463B2 (en) | 1999-07-21 | 2004-10-19 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
US7005632B2 (en) * | 2002-04-12 | 2006-02-28 | Sionex Corporation | Method and apparatus for control of mobility-based ion species identification |
US6495823B1 (en) | 1999-07-21 | 2002-12-17 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
US6815669B1 (en) | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Longitudinal field driven ion mobility filter and detection system |
US7129482B2 (en) | 1999-07-21 | 2006-10-31 | Sionex Corporation | Explosives detection using differential ion mobility spectrometry |
US6690004B2 (en) | 1999-07-21 | 2004-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
US7098449B1 (en) | 1999-07-21 | 2006-08-29 | The Charles Stark Draper Laboratory, Inc. | Spectrometer chip assembly |
EP1405065B1 (en) * | 2001-06-30 | 2012-04-11 | Dh Technologies Development Pte. Ltd. | System for collection of data and identification of unknown ion species in an electric field |
US7714284B2 (en) * | 2001-06-30 | 2010-05-11 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
US7274015B2 (en) * | 2001-08-08 | 2007-09-25 | Sionex Corporation | Capacitive discharge plasma ion source |
US7091481B2 (en) | 2001-08-08 | 2006-08-15 | Sionex Corporation | Method and apparatus for plasma generation |
US6727496B2 (en) * | 2001-08-14 | 2004-04-27 | Sionex Corporation | Pancake spectrometer |
US7122794B1 (en) | 2002-02-21 | 2006-10-17 | Sionex Corporation | Systems and methods for ion mobility control |
DE10339346B8 (de) | 2003-08-25 | 2006-04-13 | Ion-Tof Gmbh | Massenspektrometer und Flüssigmetall-Ionenquelle für ein solches Massenspektrometer |
US7399959B2 (en) * | 2004-12-03 | 2008-07-15 | Sionex Corporation | Method and apparatus for enhanced ion based sample filtering and detection |
US7164139B1 (en) | 2005-02-01 | 2007-01-16 | Kla-Tencor Technologies Corporation | Wien filter with reduced chromatic aberration |
GB2441943A (en) | 2005-07-26 | 2008-03-19 | Sionex Corp | Ultra compact ion mobility based analyzer system and method |
US7402799B2 (en) * | 2005-10-28 | 2008-07-22 | Northrop Grumman Corporation | MEMS mass spectrometer |
US8217344B2 (en) | 2007-02-01 | 2012-07-10 | Dh Technologies Development Pte. Ltd. | Differential mobility spectrometer pre-filter assembly for a mass spectrometer |
WO2008115339A1 (en) * | 2007-03-15 | 2008-09-25 | White Nicholas R | Open-ended electromagnetic corrector assembly and method for deflecting, focusing, and controlling the uniformity of a traveling ion beam |
JP4977509B2 (ja) * | 2007-03-26 | 2012-07-18 | 株式会社日立ハイテクノロジーズ | 走査電子顕微鏡 |
US8835866B2 (en) * | 2011-05-19 | 2014-09-16 | Fei Company | Method and structure for controlling magnetic field distributions in an ExB Wien filter |
US8436317B1 (en) | 2011-11-09 | 2013-05-07 | Hermes-Microvision, Inc. | Wien filter |
JP6545053B2 (ja) * | 2015-03-30 | 2019-07-17 | 東京エレクトロン株式会社 | 処理装置および処理方法、ならびにガスクラスター発生装置および発生方法 |
DE102020118567A1 (de) * | 2019-11-27 | 2021-05-27 | Huf Hülsbeck & Fürst Gmbh & Co. Kg | Vorrichtung für ein Fahrzeug zur Kommunikation mit einem mobilen Gerät |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3816748A (en) * | 1972-04-28 | 1974-06-11 | Alpha Ind Inc | Ion accelerator employing crossed-field selector |
-
1974
- 1974-11-25 NL NL7415318A patent/NL7415318A/xx not_active Application Discontinuation
-
1975
- 1975-10-22 US US05/624,579 patent/US4019989A/en not_active Expired - Lifetime
- 1975-10-24 GB GB43796/75A patent/GB1523458A/en not_active Expired
- 1975-11-12 DE DE19752550668 patent/DE2550668A1/de not_active Withdrawn
- 1975-11-22 JP JP50140708A patent/JPS5177384A/ja active Pending
- 1975-11-24 FR FR7535798A patent/FR2292331A1/fr active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2182485A (en) * | 1985-10-16 | 1987-05-13 | Hitachi Ltd | Ion beam apparatus |
US4755685A (en) * | 1985-10-16 | 1988-07-05 | Hitachi, Ltd. | Ion micro beam apparatus |
GB2182485B (en) * | 1985-10-16 | 1990-05-23 | Hitachi Ltd | Ion beam apparatus |
Also Published As
Publication number | Publication date |
---|---|
FR2292331A1 (fr) | 1976-06-18 |
US4019989A (en) | 1977-04-26 |
NL7415318A (nl) | 1976-05-28 |
FR2292331B1 (US20090177143A1-20090709-C00008.png) | 1979-06-01 |
DE2550668A1 (de) | 1976-05-26 |
JPS5177384A (US20090177143A1-20090709-C00008.png) | 1976-07-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |