GB1431069A - Pulsed field emission electron gun apparatus - Google Patents
Pulsed field emission electron gun apparatusInfo
- Publication number
- GB1431069A GB1431069A GB3291873A GB3291873A GB1431069A GB 1431069 A GB1431069 A GB 1431069A GB 3291873 A GB3291873 A GB 3291873A GB 3291873 A GB3291873 A GB 3291873A GB 1431069 A GB1431069 A GB 1431069A
- Authority
- GB
- United Kingdom
- Prior art keywords
- pulses
- tip
- pulse
- field emission
- electron gun
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005513 bias potential Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/021—Electron guns using a field emission, photo emission, or secondary emission electron source
Landscapes
- Electron Sources, Ion Sources (AREA)
- Cold Cathode And The Manufacture (AREA)
Abstract
1431069 Automatic current control NIHON DENSHI K K 10 July 1973 [17 July 1972] 32918/73 Heading G3R Field emission electron gun apparatus comprises an emitter tip 2, means 6 for heating the tip, means for supplying pulses between the tip and an electrode to produce field emission and means for maintaining the emission current constant by controlling the pulse duty factor, the tip temperature or a bias voltage applied between pulses. The beam current is compared with a reference signal in a differential amplifier 10 which has a D.C. output converted into a time modulated pulse train by analog-digital converter 12. This pulse train is converted by a mono-multi circuit 13 into pulses of constant duration which are applied to a pulse amplifier 14 controlling the duty factor of the pulse signal applied between the tip and the electrode 4, either the frequency or pulse width being varied. In another embodiment a variable bias potential is applied between pulses. Alternatively the emitter temperature is controlled, the temperature during and between pulses being different, e.g. the tip is heated only between pulses.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7148972A JPS557656B2 (en) | 1972-07-17 | 1972-07-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1431069A true GB1431069A (en) | 1976-04-07 |
Family
ID=13462110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3291873A Expired GB1431069A (en) | 1972-07-17 | 1973-07-10 | Pulsed field emission electron gun apparatus |
Country Status (4)
Country | Link |
---|---|
US (1) | US3887839A (en) |
JP (1) | JPS557656B2 (en) |
FR (1) | FR2193248B1 (en) |
GB (1) | GB1431069A (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4337422A (en) * | 1980-03-17 | 1982-06-29 | The Perkin-Elmer Corporation | Field emission gun with noise compensation |
JPS5818101A (en) * | 1981-07-27 | 1983-02-02 | Nippon Denzai Kogyo Kenkyusho:Kk | Touch sensor |
US5025196A (en) * | 1986-06-02 | 1991-06-18 | Canon Kabushiki Kaisha | Image forming device with beam current control |
JPS6440219A (en) * | 1987-08-04 | 1989-02-10 | Fanuc Ltd | Machining start hole measuring device |
JP3131339B2 (en) * | 1993-12-22 | 2001-01-31 | 三菱電機株式会社 | Cathode, cathode ray tube and method of operating cathode ray tube |
JPH08212952A (en) * | 1995-02-06 | 1996-08-20 | Natl Res Inst For Metals | Laser irradiation type electron gun |
EP1426997A1 (en) * | 2002-12-06 | 2004-06-09 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh | Field emitter beam source and method for controlling a beam current |
EP1993119B1 (en) * | 2005-09-05 | 2017-11-08 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Charged particle beam emitting device and method for operating a charged particle beam emitting device |
EP2365511B1 (en) | 2010-03-10 | 2013-05-08 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Feedback loop for emitter flash cleaning |
US8487534B2 (en) * | 2010-03-31 | 2013-07-16 | General Electric Company | Pierce gun and method of controlling thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE878685C (en) * | 1951-03-28 | 1953-06-05 | Wilhelm Dipl-Chem Dr Stuermer | Method for imaging objects with the field emission microscope |
US3361928A (en) * | 1962-11-28 | 1968-01-02 | Hitachi Ltd | Transformers having a plurality of secondary windings and charged particle sources of double pulsing system utilizing such transformers |
US3775637A (en) * | 1971-09-15 | 1973-11-27 | Rca Corp | Cathode ray display intensity control circuit |
US3786305A (en) * | 1972-05-15 | 1974-01-15 | Hitachi Ltd | Field emission electron gun |
US3794878A (en) * | 1972-12-11 | 1974-02-26 | Ford Motor Co | Electron beam regulator |
-
1972
- 1972-07-17 JP JP7148972A patent/JPS557656B2/ja not_active Expired
-
1973
- 1973-07-10 GB GB3291873A patent/GB1431069A/en not_active Expired
- 1973-07-10 US US377932A patent/US3887839A/en not_active Expired - Lifetime
- 1973-07-16 FR FR7326053A patent/FR2193248B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2193248B1 (en) | 1977-02-18 |
FR2193248A1 (en) | 1974-02-15 |
DE2336155A1 (en) | 1974-02-07 |
US3887839A (en) | 1975-06-03 |
JPS557656B2 (en) | 1980-02-27 |
JPS4929766A (en) | 1974-03-16 |
DE2336155B2 (en) | 1975-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |