GB1284645A - Then film device - Google Patents

Then film device

Info

Publication number
GB1284645A
GB1284645A GB4683/70A GB468370A GB1284645A GB 1284645 A GB1284645 A GB 1284645A GB 4683/70 A GB4683/70 A GB 4683/70A GB 468370 A GB468370 A GB 468370A GB 1284645 A GB1284645 A GB 1284645A
Authority
GB
United Kingdom
Prior art keywords
gold
deposit
areas
aluminium
jan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4683/70A
Inventor
John Henry Slater
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Welwyn Electric Ltd
Original Assignee
Welwyn Electric Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Welwyn Electric Ltd filed Critical Welwyn Electric Ltd
Priority to GB4683/70A priority Critical patent/GB1284645A/en
Publication of GB1284645A publication Critical patent/GB1284645A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20Multistable switching devices, e.g. memristors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/011Manufacture or treatment of multistable switching devices
    • H10N70/021Formation of switching materials, e.g. deposition of layers
    • H10N70/028Formation of switching materials, e.g. deposition of layers by conversion of electrode material, e.g. oxidation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/821Device geometry
    • H10N70/826Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/881Switching materials
    • H10N70/883Oxides or nitrides
    • H10N70/8833Binary metal oxides, e.g. TaOx

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

1284645 Junctionless switching elements WELWYN ELECTRIC Ltd 18 Jan 1971 [30 Jan 1970] 4683/70 Heading H1K A multiple junetionless solid-state switching device is made by the process which follows. A high-alumina ceramic substrate 1 is sensitized with a stannous solution and activated with a palladium solution to receive an electroless deposit of nickel-phosphorus or cobalt phosphorus. The deposit is polished smooth and the greater part selectively etched away to leave areas 7-10 The structure is then heated in oxygen air or other oxygen-containing atmosphere to convert the upper surface of each deposit to oxide wile leaving that part in contact with the substrate to form an electrode. A common evaporated aluminium top-surface electrode 6 is provided by masked deposition and gold is evaporated on to area 11 of the aluminium and on to areas 2, 3, 4, 5 at which the oxide has been removed by abrasion to expose the underlying alloy. Leads are attached to the gold areas by soldering. The unit is protected by epoxy lacquer. Materials for top-surface contacts include aluminium, gold and silver applied by evaporation or sputtering; flame spraying may be used; and conductive epoxy resin and fired-on conductive glazes are suitable. Ultrasonic welding may be used for lead attachment.
GB4683/70A 1970-01-30 1970-01-30 Then film device Expired GB1284645A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB4683/70A GB1284645A (en) 1970-01-30 1970-01-30 Then film device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4683/70A GB1284645A (en) 1970-01-30 1970-01-30 Then film device

Publications (1)

Publication Number Publication Date
GB1284645A true GB1284645A (en) 1972-08-09

Family

ID=9781824

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4683/70A Expired GB1284645A (en) 1970-01-30 1970-01-30 Then film device

Country Status (1)

Country Link
GB (1) GB1284645A (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009005699A1 (en) * 2007-06-29 2009-01-08 Sandisk 3D, Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US7808810B2 (en) 2006-03-31 2010-10-05 Sandisk 3D Llc Multilevel nonvolatile memory cell comprising a resistivity-switching oxide or nitride and an antifuse
US7812404B2 (en) 2005-05-09 2010-10-12 Sandisk 3D Llc Nonvolatile memory cell comprising a diode and a resistance-switching material
US7816659B2 (en) 2005-11-23 2010-10-19 Sandisk 3D Llc Devices having reversible resistivity-switching metal oxide or nitride layer with added metal
US7824956B2 (en) 2007-06-29 2010-11-02 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US7829875B2 (en) 2006-03-31 2010-11-09 Sandisk 3D Llc Nonvolatile rewritable memory cell comprising a resistivity-switching oxide or nitride and an antifuse
US7834338B2 (en) 2005-11-23 2010-11-16 Sandisk 3D Llc Memory cell comprising nickel-cobalt oxide switching element
US7846785B2 (en) 2007-06-29 2010-12-07 Sandisk 3D Llc Memory cell that employs a selectively deposited reversible resistance-switching element and methods of forming the same
US7875871B2 (en) 2006-03-31 2011-01-25 Sandisk 3D Llc Heterojunction device comprising a semiconductor and a resistivity-switching oxide or nitride
US7902537B2 (en) 2007-06-29 2011-03-08 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8233308B2 (en) 2007-06-29 2012-07-31 Sandisk 3D Llc Memory cell that employs a selectively deposited reversible resistance-switching element and methods of forming the same

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7812404B2 (en) 2005-05-09 2010-10-12 Sandisk 3D Llc Nonvolatile memory cell comprising a diode and a resistance-switching material
US8687410B2 (en) 2005-05-09 2014-04-01 Sandisk 3D Llc Nonvolatile memory cell comprising a diode and a resistance-switching material
US7816659B2 (en) 2005-11-23 2010-10-19 Sandisk 3D Llc Devices having reversible resistivity-switching metal oxide or nitride layer with added metal
US7834338B2 (en) 2005-11-23 2010-11-16 Sandisk 3D Llc Memory cell comprising nickel-cobalt oxide switching element
US8227787B2 (en) 2006-03-31 2012-07-24 Sandisk 3D Llc Heterojunction device comprising a semiconductor and a resistivity-switching oxide or nitride
US7808810B2 (en) 2006-03-31 2010-10-05 Sandisk 3D Llc Multilevel nonvolatile memory cell comprising a resistivity-switching oxide or nitride and an antifuse
US7829875B2 (en) 2006-03-31 2010-11-09 Sandisk 3D Llc Nonvolatile rewritable memory cell comprising a resistivity-switching oxide or nitride and an antifuse
US8592792B2 (en) 2006-03-31 2013-11-26 Sandisk 3D Llc Heterojunction device comprising a semiconductor oxide and a resistivity-switching oxide or nitride
US7875871B2 (en) 2006-03-31 2011-01-25 Sandisk 3D Llc Heterojunction device comprising a semiconductor and a resistivity-switching oxide or nitride
US8173486B2 (en) 2007-06-29 2012-05-08 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8507315B2 (en) 2007-06-29 2013-08-13 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
CN101720508B (en) * 2007-06-29 2012-05-23 桑迪士克3D公司 Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US7902537B2 (en) 2007-06-29 2011-03-08 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8233308B2 (en) 2007-06-29 2012-07-31 Sandisk 3D Llc Memory cell that employs a selectively deposited reversible resistance-switching element and methods of forming the same
CN102709471A (en) * 2007-06-29 2012-10-03 桑迪士克3D公司 Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8373150B2 (en) 2007-06-29 2013-02-12 Sandisk 3D, Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
WO2009005699A1 (en) * 2007-06-29 2009-01-08 Sandisk 3D, Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US7846785B2 (en) 2007-06-29 2010-12-07 Sandisk 3D Llc Memory cell that employs a selectively deposited reversible resistance-switching element and methods of forming the same
US7824956B2 (en) 2007-06-29 2010-11-02 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8809114B2 (en) 2007-06-29 2014-08-19 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8816315B2 (en) 2007-06-29 2014-08-26 Sandisk 3D Llc Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same
US8913417B2 (en) 2007-06-29 2014-12-16 Sandisk 3D Llc Memory cell that employs a selectively deposited reversible resistance-switching element and methods of forming the same
CN102709471B (en) * 2007-06-29 2014-12-24 桑迪士克3D公司 Memory cell that employs a selectively grown reversible resistance-switching element and methods of forming the same

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees