GB1238889A - - Google Patents

Info

Publication number
GB1238889A
GB1238889A GB5606768A GB1238889DA GB1238889A GB 1238889 A GB1238889 A GB 1238889A GB 5606768 A GB5606768 A GB 5606768A GB 1238889D A GB1238889D A GB 1238889DA GB 1238889 A GB1238889 A GB 1238889A
Authority
GB
United Kingdom
Prior art keywords
specimen
axis
lens
ray
gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5606768A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1238889A publication Critical patent/GB1238889A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Beam Exposure (AREA)
GB5606768A 1968-11-26 1968-11-26 Expired GB1238889A (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5606768 1968-11-26

Publications (1)

Publication Number Publication Date
GB1238889A true GB1238889A (enrdf_load_stackoverflow) 1971-07-14

Family

ID=10475637

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5606768A Expired GB1238889A (enrdf_load_stackoverflow) 1968-11-26 1968-11-26

Country Status (2)

Country Link
US (1) US3660657A (enrdf_load_stackoverflow)
GB (1) GB1238889A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4383176A (en) 1980-01-30 1983-05-10 International Precision Incorporated Objective lens for electron microscope
GB2118361A (en) * 1982-03-19 1983-10-26 Int Precision Inc Scanning electron beam apparatus

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5138578B2 (enrdf_load_stackoverflow) * 1972-10-23 1976-10-22
DE2541245A1 (de) * 1975-09-12 1977-03-24 Siemens Ag Korpuskularstrahl-rastermikroskop
DE2541915A1 (de) * 1975-09-19 1977-03-31 Max Planck Gesellschaft Korpuskularstrahlenmikroskop mit ringzonensegmentabbildung
TW200639901A (en) * 2005-05-09 2006-11-16 Li Bing Huan Device for operating gas in vacuum or low-pressure environment and for observation of the operation
GB201302624D0 (en) * 2013-02-14 2013-04-03 Univ Antwerpen High-resolution amplitude contrast imaging
JP6718782B2 (ja) * 2016-09-21 2020-07-08 日本電子株式会社 対物レンズおよび透過電子顕微鏡

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2499019A (en) * 1949-01-29 1950-02-28 Rca Corp Adjustable specimen support for electron-optical instruments
NL135016C (enrdf_load_stackoverflow) * 1960-02-22
NL282644A (enrdf_load_stackoverflow) * 1962-08-29 1964-12-28
NL145716B (nl) * 1964-06-06 1975-04-15 Philips Nv Elektronenstraalapparaat.
US3535514A (en) * 1966-05-24 1970-10-20 Rca Corp Positionable aperture for electron microscope
DE1614126B1 (de) * 1967-02-27 1970-11-19 Max Planck Gesellschaft Korpuskularstrahlmikroskop,insbesondere Elektronenmikroskop,mit einer durch das Vorfeld einer Objektivlinse gebildeten Kondensorlinse und einer Bereichsblende

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4383176A (en) 1980-01-30 1983-05-10 International Precision Incorporated Objective lens for electron microscope
GB2118361A (en) * 1982-03-19 1983-10-26 Int Precision Inc Scanning electron beam apparatus
GB2173945A (en) * 1982-03-19 1986-10-22 Int Precision Inc Scanning electron beam apparatus

Also Published As

Publication number Publication date
US3660657A (en) 1972-05-02

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee