GB848982A - Improvements in x-ray microscopes - Google Patents
Improvements in x-ray microscopesInfo
- Publication number
- GB848982A GB848982A GB30335/57A GB3033557A GB848982A GB 848982 A GB848982 A GB 848982A GB 30335/57 A GB30335/57 A GB 30335/57A GB 3033557 A GB3033557 A GB 3033557A GB 848982 A GB848982 A GB 848982A
- Authority
- GB
- United Kingdom
- Prior art keywords
- lens
- spacing
- elements
- target
- potentials
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
- H01J35/147—Spot size control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
- H01J35/186—Windows used as targets or X-ray converters
Landscapes
- Electron Sources, Ion Sources (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
848,982. X-ray tubes. GENERAL ELECTRIC CO. Sept. 27, 1957 [Oct. 1, 1956], No. 30335/57. Class 39(1). An X-ray shadow microscope has an asymmetric electrostatic lens system for focusing the electron beam on to the target which is arranged to cause multiple cross-over of the beam, and whose principal plane is positioned between the lens mid-plane and the target. The microscope of Fig. 1 (not shown), is substantially identical with that shown and described in Specification 780,682, except for the objective or focusing lens assembly shown in more detail in Fig. 2, and which comprises three elements 17, 18, 19. The target window 20 is secured to the last element 19, flush with the inner surface. With the object of reducing the focal length, the lens is designed so that multiple crossing of the optical axis A by the electron rays occurs. This is achieved by suitably controlling the potentials in the centre of the element apertures, and also by the spacing and geometry. The spacing S between elements 18 and 19 must be less than the spacing Zo between elements 17 and 18, and the thickness t and aperture radius R 1 of element 18 are such that S / t/2 > 0À5 and t/2 /R 1 > 1. Equations are also given for deriving the potentials at the centres of the apertures, in terms of the applied voltages and the lens dimensions. The arrangement shown has three cross-over points, and it is stated that a focal length of as low as 1 mm. can be obtained.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US613149A US2814729A (en) | 1956-10-01 | 1956-10-01 | X-ray microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
GB848982A true GB848982A (en) | 1960-09-21 |
Family
ID=24456069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB30335/57A Expired GB848982A (en) | 1956-10-01 | 1957-09-27 | Improvements in x-ray microscopes |
Country Status (3)
Country | Link |
---|---|
US (1) | US2814729A (en) |
FR (1) | FR1189217A (en) |
GB (1) | GB848982A (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE564870A (en) * | 1957-02-16 | 1900-01-01 | ||
US2922904A (en) * | 1957-12-30 | 1960-01-26 | Gen Electric | Target window for x-ray microscopes |
US3023311A (en) * | 1958-07-30 | 1962-02-27 | Philips Electronics Inc | X-ray diffractometry |
US3141993A (en) * | 1959-12-24 | 1964-07-21 | Zeiss Jena Veb Carl | Very fine beam electron gun |
CH391128A (en) * | 1961-11-22 | 1965-04-30 | Trueb Taeuber & Co Ag | Electrostatic immersion lens |
US3860819A (en) * | 1970-06-29 | 1975-01-14 | Nikolai Vasilievich Rabodzei | Closed-circuit-tv-x-ray microscope |
US9291578B2 (en) | 2012-08-03 | 2016-03-22 | David L. Adler | X-ray photoemission microscope for integrated devices |
US9129715B2 (en) | 2012-09-05 | 2015-09-08 | SVXR, Inc. | High speed x-ray inspection microscope |
JP6264145B2 (en) * | 2014-03-28 | 2018-01-24 | 株式会社島津製作所 | X-ray generator |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2569872A (en) * | 1949-12-24 | 1951-10-02 | Machlett Lab Inc | Electron discharge tube |
-
1956
- 1956-10-01 US US613149A patent/US2814729A/en not_active Expired - Lifetime
-
1957
- 1957-09-27 FR FR1189217D patent/FR1189217A/en not_active Expired
- 1957-09-27 GB GB30335/57A patent/GB848982A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US2814729A (en) | 1957-11-26 |
FR1189217A (en) | 1959-10-01 |
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