GB865050A - Improvements in or relating to x-ray shadow microscopes with adjustable optical focussing - Google Patents
Improvements in or relating to x-ray shadow microscopes with adjustable optical focussingInfo
- Publication number
- GB865050A GB865050A GB4756/58A GB475658A GB865050A GB 865050 A GB865050 A GB 865050A GB 4756/58 A GB4756/58 A GB 4756/58A GB 475658 A GB475658 A GB 475658A GB 865050 A GB865050 A GB 865050A
- Authority
- GB
- United Kingdom
- Prior art keywords
- fluorescent screen
- target
- lens
- reflected
- spot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
- H01J35/147—Spot size control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
- H01J35/116—Transmissive anodes
Landscapes
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Transforming Electric Information Into Light Information (AREA)
Abstract
865,050. X-ray tubes. PHILIPS ELECTRICAL INDUSTRIES Ltd. Feb. 13, 1958 [Feb. 16; 1957], No. 4756/58. Class 39(1). In an X-ray shadow microscope the correct focus 6, Fig. 1, of electrons upon the target 2 is secured by focusing electrons reflected from the target on to a fluorescent screen. An electron beam from gun 1, 3, 4 passes between the poles of a magnet 7, and is then focused on to a target 2 by means of electrostatic lens system 5. Reflected electrons return along their earlier path as far as the magnet 7 where they are deflected on to fluorescent screen 11, upon which an image of the focal spot 6 is formed at 10. By suitable adjustment the spot 10 is given its maximum definition and since this spot is an image of 6, the tube is correctly focused. In a modification, a skewed magnetic lens 5, Fig. 2, combines the effects of members 5 and 7, Fig. 1, so that the reflected beam is returned to a position on fluorescent screen 20 close to the aperture 21, through which the primary beam passes. A further electron lens may be. interposed between the gun and lens 5 producing an intermediate real or virtual image, which is reproduced on the fluorescent screen which is then nearer or further respectively from the symmetrical position. The fluorescent screen may be on the reverse side of the support which is then made very thin.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL359905X | 1957-02-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB865050A true GB865050A (en) | 1961-04-12 |
Family
ID=19785362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB4756/58A Expired GB865050A (en) | 1957-02-16 | 1958-02-13 | Improvements in or relating to x-ray shadow microscopes with adjustable optical focussing |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US2939954A (en) |
| BE (1) | BE564870A (en) |
| CH (1) | CH359905A (en) |
| DE (1) | DE1165779B (en) |
| FR (1) | FR1202180A (en) |
| GB (1) | GB865050A (en) |
| NL (2) | NL91617C (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1557864A1 (en) * | 2004-01-23 | 2005-07-27 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
| US7218703B2 (en) | 2003-11-21 | 2007-05-15 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
| US7221731B2 (en) | 2002-10-17 | 2007-05-22 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL108506C (en) * | 1958-09-13 | |||
| US3107297A (en) * | 1960-08-29 | 1963-10-15 | Applied Res Lab Inc | Electron probe X-ray analyzer wherein the emitted X-radiation passes through the objective lens |
| DE3477710D1 (en) * | 1984-02-18 | 1989-05-18 | Leybold Ag | Device for measuring the angular distribution of charged particles diffracted on a sample surface |
| US4979203A (en) * | 1989-06-19 | 1990-12-18 | Princeton X-Ray Laser | X-ray laser microscope apparatus |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE679857C (en) * | 1932-03-17 | 1939-08-15 | Bodo Von Borries Dr Ing | Arrangement for observation and control of the electron-optical images occurring in the beam path of an electron microscope with two or more electron-optical magnification levels |
| DE692336C (en) * | 1934-12-07 | 1940-06-18 | Bodo V Borries Dr Ing | Process for the imaging of surfaces by means of corpuscular rays |
| US2238577A (en) * | 1939-02-20 | 1941-04-15 | Gen Electric | Electron microscope |
| DE764608C (en) * | 1939-04-22 | 1953-01-26 | Aeg | Microscope based on the principle of the electron shadow microscope |
| US2356633A (en) * | 1939-10-19 | 1944-08-22 | Ardenne Manfred Von | Electronic microscope |
| US2348031A (en) * | 1941-04-30 | 1944-05-02 | Rca Corp | Method of focusing electron microscopes |
| US2440640A (en) * | 1946-11-27 | 1948-04-27 | Research Corp | Electron microanalyzer |
| BE509097A (en) * | 1951-02-10 | |||
| DE1006983B (en) * | 1955-02-01 | 1957-04-25 | Leitz Ernst Gmbh | Method and device for super-microscopic imaging by means of an ion microscope |
| US2814729A (en) * | 1956-10-01 | 1957-11-26 | Gen Electric | X-ray microscope |
-
0
- BE BE564870D patent/BE564870A/xx unknown
- NL NL214670D patent/NL214670A/xx unknown
- NL NL91617D patent/NL91617C/xx active
-
1958
- 1958-01-03 US US706924A patent/US2939954A/en not_active Expired - Lifetime
- 1958-02-12 DE DEN14661A patent/DE1165779B/en active Pending
- 1958-02-13 GB GB4756/58A patent/GB865050A/en not_active Expired
- 1958-02-13 CH CH359905D patent/CH359905A/en unknown
- 1958-02-14 FR FR1202180D patent/FR1202180A/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7221731B2 (en) | 2002-10-17 | 2007-05-22 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
| US7218703B2 (en) | 2003-11-21 | 2007-05-15 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
| EP1557864A1 (en) * | 2004-01-23 | 2005-07-27 | Tohken Co., Ltd. | X-ray microscopic inspection apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| BE564870A (en) | 1900-01-01 |
| NL91617C (en) | 1900-01-01 |
| US2939954A (en) | 1960-06-07 |
| NL214670A (en) | 1900-01-01 |
| FR1202180A (en) | 1960-01-08 |
| CH359905A (en) | 1962-01-31 |
| DE1165779B (en) | 1964-03-19 |
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