GB1158239A - Improvements in and relating to Ion Sources. - Google Patents

Improvements in and relating to Ion Sources.

Info

Publication number
GB1158239A
GB1158239A GB3315368A GB3315368A GB1158239A GB 1158239 A GB1158239 A GB 1158239A GB 3315368 A GB3315368 A GB 3315368A GB 3315368 A GB3315368 A GB 3315368A GB 1158239 A GB1158239 A GB 1158239A
Authority
GB
United Kingdom
Prior art keywords
ionization chamber
electron beam
magnetic field
ionization
ion sources
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3315368A
Inventor
Jack Moreau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cegelec SA
Original Assignee
Cegelec SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cegelec SA filed Critical Cegelec SA
Priority to GB3315368A priority Critical patent/GB1158239A/en
Publication of GB1158239A publication Critical patent/GB1158239A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/20—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

1,158,239. Ion sources. SOC. GENERALE DE CONSTRUCTIONS ELECTRIQUE ET MECANIQUES (ALSTHOM). 11 July, 1968, No. 33153/68. Heading HID. In an electron beam bombardment ion source comprising cathode 13, reflector electrode 14, ionization chamber 11, ion extractor electrode 17 and permanent magnet or electromagnet 12 for creating a magnetic field H within the ionization chamber, the electron beam is injected into the ionization chamber at an angle α to the magnetic field so as to follow a helical path and thereby increase the probability of ionization. In another embodiment the ionization chamber is circular, the magnet cylindrical and the ions are removed in a direction parallel to the axis of the helical electron beam.
GB3315368A 1968-07-11 1968-07-11 Improvements in and relating to Ion Sources. Expired GB1158239A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB3315368A GB1158239A (en) 1968-07-11 1968-07-11 Improvements in and relating to Ion Sources.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB3315368A GB1158239A (en) 1968-07-11 1968-07-11 Improvements in and relating to Ion Sources.

Publications (1)

Publication Number Publication Date
GB1158239A true GB1158239A (en) 1969-07-16

Family

ID=10349236

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3315368A Expired GB1158239A (en) 1968-07-11 1968-07-11 Improvements in and relating to Ion Sources.

Country Status (1)

Country Link
GB (1) GB1158239A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2212655A (en) * 1987-11-13 1989-07-26 Vg Instr Group Ion source for a high sensitivity mass spectrometor
DE19919990A1 (en) * 1999-04-30 2000-11-16 Rayonic Sensor Systems Gmbh Measuring thickness of zinc layers on iron or steel comprises radiating primary photons onto the layer, measuring the intensity of secondary photons scattered from the layer, and determining the thickness

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2212655A (en) * 1987-11-13 1989-07-26 Vg Instr Group Ion source for a high sensitivity mass spectrometor
DE19919990A1 (en) * 1999-04-30 2000-11-16 Rayonic Sensor Systems Gmbh Measuring thickness of zinc layers on iron or steel comprises radiating primary photons onto the layer, measuring the intensity of secondary photons scattered from the layer, and determining the thickness
DE19919990B4 (en) * 1999-04-30 2004-07-01 Rayonic Sensor Systems Gmbh Method and device for measuring the thickness of a metal layer

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees