FR2867936B1 - METHOD AND IMAGE SENSOR FOR PERFORMING CORRELATED DOUBLE SUBSCANTILLATION (CDSS) OF PIXELS IN ACTIVE PIXEL SENSOR (APS) MATRIX - Google Patents

METHOD AND IMAGE SENSOR FOR PERFORMING CORRELATED DOUBLE SUBSCANTILLATION (CDSS) OF PIXELS IN ACTIVE PIXEL SENSOR (APS) MATRIX

Info

Publication number
FR2867936B1
FR2867936B1 FR0502545A FR0502545A FR2867936B1 FR 2867936 B1 FR2867936 B1 FR 2867936B1 FR 0502545 A FR0502545 A FR 0502545A FR 0502545 A FR0502545 A FR 0502545A FR 2867936 B1 FR2867936 B1 FR 2867936B1
Authority
FR
France
Prior art keywords
subscantillation
cdss
aps
pixels
matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0502545A
Other languages
French (fr)
Other versions
FR2867936A1 (en
Inventor
Su Hun Lim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020040017675A external-priority patent/KR100994993B1/en
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2867936A1 publication Critical patent/FR2867936A1/en
Application granted granted Critical
Publication of FR2867936B1 publication Critical patent/FR2867936B1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/447—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by preserving the colour pattern with or without loss of information
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
FR0502545A 2004-03-16 2005-03-15 METHOD AND IMAGE SENSOR FOR PERFORMING CORRELATED DOUBLE SUBSCANTILLATION (CDSS) OF PIXELS IN ACTIVE PIXEL SENSOR (APS) MATRIX Expired - Fee Related FR2867936B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020040017675A KR100994993B1 (en) 2004-03-16 2004-03-16 Solid state image sensing device and driving method thereof outputting digital image signals of averaged sub-sampled analog signals
US11/068,205 US7554584B2 (en) 2004-03-16 2005-02-28 Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array

Publications (2)

Publication Number Publication Date
FR2867936A1 FR2867936A1 (en) 2005-09-23
FR2867936B1 true FR2867936B1 (en) 2009-04-17

Family

ID=34921821

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0502545A Expired - Fee Related FR2867936B1 (en) 2004-03-16 2005-03-15 METHOD AND IMAGE SENSOR FOR PERFORMING CORRELATED DOUBLE SUBSCANTILLATION (CDSS) OF PIXELS IN ACTIVE PIXEL SENSOR (APS) MATRIX

Country Status (5)

Country Link
JP (1) JP4764036B2 (en)
CN (1) CN100594709C (en)
DE (1) DE102005012509A1 (en)
FR (1) FR2867936B1 (en)
TW (1) TWI256840B (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101305602B (en) * 2005-11-08 2011-11-09 松下电器产业株式会社 Correlating double sampling circuit and sample hold circuit
JP4546563B2 (en) * 2006-03-01 2010-09-15 富士通セミコンダクター株式会社 Semiconductor integrated circuit
JP5142749B2 (en) * 2008-02-14 2013-02-13 キヤノン株式会社 IMAGING DEVICE, IMAGING DEVICE CONTROL METHOD, AND IMAGING SYSTEM
CN101557456B (en) * 2008-04-10 2010-12-29 联咏科技股份有限公司 Correlated duplex-sampling circuit and complementary metal oxide semiconductor (CMOS) image sensing unit
JP5311954B2 (en) * 2008-09-30 2013-10-09 キヤノン株式会社 Driving method of solid-state imaging device
US20100137143A1 (en) 2008-10-22 2010-06-03 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
US20100301398A1 (en) 2009-05-29 2010-12-02 Ion Torrent Systems Incorporated Methods and apparatus for measuring analytes
EP2342552B1 (en) * 2008-10-22 2022-09-14 Life Technologies Corporation Floating gate chemical field effect transistor array with bilayer gate dielectric
JP5426587B2 (en) * 2011-01-31 2014-02-26 株式会社東芝 Solid-state imaging device and pixel averaging processing method thereof
US8749656B2 (en) 2011-03-16 2014-06-10 Analog Devices, Inc. Apparatus and method for image decimation for image sensors
CN104137534B (en) * 2011-12-27 2017-12-05 株式会社尼康 Solid-state imaging element and camera device
CN103872065B (en) * 2014-03-10 2016-09-21 北京空间机电研究所 Vertical electric charge transfer imaging detector pixel merges method
TWI559768B (en) * 2015-06-22 2016-11-21 友達光電股份有限公司 Sampling control circuit for passive pixel and method thereof
CN113493735B (en) * 2020-04-02 2023-06-16 成都今是科技有限公司 Gene sequencing array structure and gene sequencing device
CN113612948B (en) * 2021-08-27 2024-03-05 锐芯微电子股份有限公司 Readout circuit and image sensor

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1013746A (en) * 1996-06-27 1998-01-16 Sony Corp Solid-state image pickup device
JP2001036816A (en) * 1999-06-23 2001-02-09 Taiwan Advanced Sensors Corp Automatic calibration of a/d converter in cmos-type image sensor
JP2002165132A (en) * 2000-11-22 2002-06-07 Innotech Corp Solid-state image pickup device and its drive method
KR100498594B1 (en) * 2000-12-30 2005-07-01 매그나칩 반도체 유한회사 Cmos image sensor
JP2002330349A (en) * 2001-04-26 2002-11-15 Fujitsu Ltd Xy address type solid-state image pickup device
US6914227B2 (en) * 2001-06-25 2005-07-05 Canon Kabushiki Kaisha Image sensing apparatus capable of outputting image by converting resolution by adding and reading out a plurality of pixels, its control method, and image sensing system
US20040246354A1 (en) * 2003-06-04 2004-12-09 Hongli Yang CMOS image sensor having high speed sub sampling

Also Published As

Publication number Publication date
JP4764036B2 (en) 2011-08-31
CN100594709C (en) 2010-03-17
TWI256840B (en) 2006-06-11
JP2005269646A (en) 2005-09-29
DE102005012509A1 (en) 2005-10-13
TW200533191A (en) 2005-10-01
FR2867936A1 (en) 2005-09-23
CN1681290A (en) 2005-10-12

Similar Documents

Publication Publication Date Title
FR2867936B1 (en) METHOD AND IMAGE SENSOR FOR PERFORMING CORRELATED DOUBLE SUBSCANTILLATION (CDSS) OF PIXELS IN ACTIVE PIXEL SENSOR (APS) MATRIX
JP2010509804A5 (en)
JP2008219594A5 (en)
EP0939544A3 (en) Method for driving solid-state image pickup apparatus, solid-state image pickup device and camera
EP1577836A3 (en) Image deformation estimating method and apparatus
JP2007259155A5 (en)
FR2907569B1 (en) METHOD AND DEVICE FOR VIRTUAL SIMULATION OF A VIDEO IMAGE SEQUENCE
EP1918850A3 (en) Method and apparatus for detecting faces in digital images
JP2011511508A5 (en)
WO2008091207A8 (en) Border region processing in images
TW200631169A (en) Technique for increased exposure range in image sensors
TW200719148A (en) Imaging device, imaging method and computer-readable recording medium
WO2006076180A3 (en) White balance correction in digital camera images
TW200715248A (en) Liquid crystal display apparatus
EP1684527A3 (en) Apparatus and method for reducing blocking artifacts in an image display device
EP1394767A3 (en) Method and apparatus for rendering color image on delta-structured displays
KR100837459B1 (en) Image pickup method of display panel and image pickup apparatus of display panel
JP2017129857A5 (en) Image display system, operation method of image display system
EP2408194A3 (en) Image sensor using CMOS technology with high video rate
FR2788188B1 (en) DEVICE AND METHOD FOR DETECTION AND CORRECTION OF DEFECTIVE PIXELS IN AN IMAGE SENSOR
TW200709158A (en) Method for adjusting the resolution quality of images displayed on a monitor and related monitor
WO2008008293A3 (en) Method and device for enhancing images in display devices
JP2009094632A (en) Solid-state imaging apparatus
FR2866180B1 (en) METHOD OF PROCESSING INFORMATION DELIVERED BY AN ACTIVE PIXEL MATRIX OF A SENSOR PROVIDING EXTENDED DYNAMIC AND GAIN, AND CORRESPONDING SENSOR.
FR2848011B1 (en) ACTIVE MATRIX STRUCTURE FOR DISPLAY SCREEN AND SCREEN HAVING SUCH A MATRIX

Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20091130