FR2842295B1 - Equipement de detection de grandeur physique - Google Patents

Equipement de detection de grandeur physique

Info

Publication number
FR2842295B1
FR2842295B1 FR0308266A FR0308266A FR2842295B1 FR 2842295 B1 FR2842295 B1 FR 2842295B1 FR 0308266 A FR0308266 A FR 0308266A FR 0308266 A FR0308266 A FR 0308266A FR 2842295 B1 FR2842295 B1 FR 2842295B1
Authority
FR
France
Prior art keywords
equipment
physical size
detecting physical
detecting
size
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR0308266A
Other languages
English (en)
Other versions
FR2842295A1 (fr
Inventor
Yasuaki Makino
Toshio Ikuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Publication of FR2842295A1 publication Critical patent/FR2842295A1/fr
Application granted granted Critical
Publication of FR2842295B1 publication Critical patent/FR2842295B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
    • H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
    • H03F3/45982—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedforward circuit
    • H03F3/45986—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedforward circuit using switching means, e.g. sample and hold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/024—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation for range change; Arrangements for substituting one sensing member by another

Landscapes

  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Measuring Fluid Pressure (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
FR0308266A 2002-07-11 2003-07-07 Equipement de detection de grandeur physique Expired - Lifetime FR2842295B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002202902A JP4224993B2 (ja) 2002-07-11 2002-07-11 物理量検出装置

Publications (2)

Publication Number Publication Date
FR2842295A1 FR2842295A1 (fr) 2004-01-16
FR2842295B1 true FR2842295B1 (fr) 2006-08-18

Family

ID=29774564

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0308266A Expired - Lifetime FR2842295B1 (fr) 2002-07-11 2003-07-07 Equipement de detection de grandeur physique

Country Status (4)

Country Link
US (1) US6826503B2 (fr)
JP (1) JP4224993B2 (fr)
DE (1) DE10331078B4 (fr)
FR (1) FR2842295B1 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4059056B2 (ja) 2002-10-18 2008-03-12 株式会社デンソー センサ装置およびセンサ装置の出力特性切換方法
JP4437531B2 (ja) * 2004-02-20 2010-03-24 アイシン精機株式会社 能動型防振制御システムにおける制御データの設定方法及び制御方法
ES2579428T3 (es) 2004-05-07 2016-08-11 Kistler Holding Ag Sistema de medición con salidas de sensibilidades diferentes
DE102005006402B3 (de) * 2005-02-11 2006-08-31 Siemens Ag Sensorvorrichtung und System
JP2007278725A (ja) * 2006-04-03 2007-10-25 Denso Corp 物理量センサ
JP4835727B2 (ja) * 2009-06-09 2011-12-14 株式会社デンソー センサシステム
WO2012055029A1 (fr) 2010-10-29 2012-05-03 Orpyx Medical Technologies Inc. Système de remplacement sensoriel et extrasensoriel périphérique
JP6102377B2 (ja) * 2013-03-15 2017-03-29 オムロン株式会社 センサ
EP2999398B8 (fr) * 2013-05-21 2020-12-16 Orpyx Medical Technologies Inc. Ensemble d'acquisition de données de pression
CN104883134B (zh) * 2014-02-27 2018-11-27 无锡华润上华科技有限公司 一种陀螺仪前置放大电路和电子装置
CN104075735B (zh) * 2014-07-03 2017-02-15 湖北航天技术研究院总体设计所 惯性测量装置自诊断方法及装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4263803A (en) * 1978-05-09 1981-04-28 Ex-Cell-O Corporation Calibration system and method of using same
JPS5733311A (en) * 1980-08-06 1982-02-23 Yokogawa Hokushin Electric Corp Ranging system of converter for process
US4365511A (en) * 1981-01-06 1982-12-28 Edo-Aire Mitchell Data rate generator
DE3134985A1 (de) * 1981-08-08 1983-02-24 Robert Bosch Gmbh, 7000 Stuttgart Vorrichtung zum betrieb von resonanzdurchflussmessern
JPS59133425A (ja) * 1983-01-20 1984-07-31 Rion Co Ltd デ−タの処理方法及び処理装置
US4763973A (en) * 1985-02-27 1988-08-16 Omron Tateisi Electronics Co. Waveguide-type optical sensor
DE3926617A1 (de) * 1989-08-11 1991-02-14 Philips Patentverwaltung Adaptive drehzahlmessvorrichtung
US6314823B1 (en) * 1991-09-20 2001-11-13 Kazuhiro Okada Force detector and acceleration detector and method of manufacturing the same
US5422478A (en) * 1992-04-17 1995-06-06 Fiberoptic Sensor Technologies, Inc. Fiberoptic pressure sensor having drift correction means for insitu calibration
DE19638373B8 (de) * 1995-09-19 2007-08-09 Denso Corp., Kariya Halbleitersensor und sein Herstellungsverfahren
US6188340B1 (en) * 1997-08-10 2001-02-13 Hitachi, Ltd. Sensor adjusting circuit
JPH11241858A (ja) 1998-02-24 1999-09-07 Noritz Corp 給湯システムおよびその水漏れ検査方法
US6377110B1 (en) * 1999-09-10 2002-04-23 Keystone Thermometrics Low-cost temperature sensor providing relatively high accuracy, a wide dynamic range and high linearity
DE19964002A1 (de) * 1999-12-30 2001-07-12 Micronas Gmbh Sensor
GB2371869B (en) * 2001-01-31 2005-10-05 Abb Automation Ltd Flowmeter fault detection

Also Published As

Publication number Publication date
JP4224993B2 (ja) 2009-02-18
US20040010389A1 (en) 2004-01-15
DE10331078A1 (de) 2004-01-22
FR2842295A1 (fr) 2004-01-16
DE10331078B4 (de) 2012-03-01
JP2004045209A (ja) 2004-02-12
US6826503B2 (en) 2004-11-30

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