FR2808333B1 - Procede et appareil de calibrage pour corriger des erreurs de synchronisation de largeur d'impulsion lors de tests de circuits integres - Google Patents
Procede et appareil de calibrage pour corriger des erreurs de synchronisation de largeur d'impulsion lors de tests de circuits integresInfo
- Publication number
- FR2808333B1 FR2808333B1 FR0103388A FR0103388A FR2808333B1 FR 2808333 B1 FR2808333 B1 FR 2808333B1 FR 0103388 A FR0103388 A FR 0103388A FR 0103388 A FR0103388 A FR 0103388A FR 2808333 B1 FR2808333 B1 FR 2808333B1
- Authority
- FR
- France
- Prior art keywords
- event
- pulse width
- data
- integrated circuit
- timing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/526,407 US6496953B1 (en) | 2000-03-15 | 2000-03-15 | Calibration method and apparatus for correcting pulse width timing errors in integrated circuit testing |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2808333A1 FR2808333A1 (fr) | 2001-11-02 |
FR2808333B1 true FR2808333B1 (fr) | 2004-08-20 |
Family
ID=24097209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0103388A Expired - Fee Related FR2808333B1 (fr) | 2000-03-15 | 2001-03-13 | Procede et appareil de calibrage pour corriger des erreurs de synchronisation de largeur d'impulsion lors de tests de circuits integres |
Country Status (6)
Country | Link |
---|---|
US (1) | US6496953B1 (fr) |
JP (1) | JP2001305197A (fr) |
KR (1) | KR20010092312A (fr) |
DE (1) | DE10112311A1 (fr) |
FR (1) | FR2808333B1 (fr) |
TW (1) | TW508446B (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6985840B1 (en) * | 2000-07-31 | 2006-01-10 | Novas Software, Inc. | Circuit property verification system |
US20030099139A1 (en) * | 2001-08-24 | 2003-05-29 | Abrosimov Igor Anatolievich | Memory test apparatus and method of testing |
US7089135B2 (en) * | 2002-05-20 | 2006-08-08 | Advantest Corp. | Event based IC test system |
US7810005B1 (en) * | 2006-11-01 | 2010-10-05 | Credence Systems Corporation | Method and system for correcting timing errors in high data rate automated test equipment |
US7904755B2 (en) * | 2008-05-30 | 2011-03-08 | Infineon Technologies Ag | Embedded software testing using a single output |
US8683164B2 (en) | 2009-02-04 | 2014-03-25 | Micron Technology, Inc. | Stacked-die memory systems and methods for training stacked-die memory systems |
US8310885B2 (en) | 2010-04-28 | 2012-11-13 | International Business Machines Corporation | Measuring SDRAM control signal timing |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5212443A (en) | 1990-09-05 | 1993-05-18 | Schlumberger Technologies, Inc. | Event sequencer for automatic test equipment |
US5225772A (en) | 1990-09-05 | 1993-07-06 | Schlumberger Technologies, Inc. | Automatic test equipment system using pin slice architecture |
US6060898A (en) * | 1997-09-30 | 2000-05-09 | Credence Systems Corporation | Format sensitive timing calibration for an integrated circuit tester |
US6360343B1 (en) * | 1999-02-26 | 2002-03-19 | Advantest Corp. | Delta time event based test system |
-
2000
- 2000-03-15 US US09/526,407 patent/US6496953B1/en not_active Expired - Lifetime
-
2001
- 2001-03-09 JP JP2001067243A patent/JP2001305197A/ja active Pending
- 2001-03-13 FR FR0103388A patent/FR2808333B1/fr not_active Expired - Fee Related
- 2001-03-14 KR KR1020010013100A patent/KR20010092312A/ko not_active Application Discontinuation
- 2001-03-14 DE DE10112311A patent/DE10112311A1/de not_active Withdrawn
- 2001-04-09 TW TW090105048A patent/TW508446B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US6496953B1 (en) | 2002-12-17 |
FR2808333A1 (fr) | 2001-11-02 |
JP2001305197A (ja) | 2001-10-31 |
KR20010092312A (ko) | 2001-10-24 |
TW508446B (en) | 2002-11-01 |
DE10112311A1 (de) | 2002-01-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CD | Change of name or company name | ||
TP | Transmission of property | ||
TP | Transmission of property | ||
ST | Notification of lapse |
Effective date: 20081125 |
|
TP | Transmission of property |