FR2764096B1 - Test d'une memoire en circuit integre pourvue d'au moins un element de redondance - Google Patents
Test d'une memoire en circuit integre pourvue d'au moins un element de redondanceInfo
- Publication number
- FR2764096B1 FR2764096B1 FR9706903A FR9706903A FR2764096B1 FR 2764096 B1 FR2764096 B1 FR 2764096B1 FR 9706903 A FR9706903 A FR 9706903A FR 9706903 A FR9706903 A FR 9706903A FR 2764096 B1 FR2764096 B1 FR 2764096B1
- Authority
- FR
- France
- Prior art keywords
- test
- integrated circuit
- memory provided
- circuit memory
- redundancy element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
- G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
- G11C29/848—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9706903A FR2764096B1 (fr) | 1997-05-30 | 1997-05-30 | Test d'une memoire en circuit integre pourvue d'au moins un element de redondance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9706903A FR2764096B1 (fr) | 1997-05-30 | 1997-05-30 | Test d'une memoire en circuit integre pourvue d'au moins un element de redondance |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2764096A1 FR2764096A1 (fr) | 1998-12-04 |
FR2764096B1 true FR2764096B1 (fr) | 1999-08-13 |
Family
ID=9507595
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9706903A Expired - Fee Related FR2764096B1 (fr) | 1997-05-30 | 1997-05-30 | Test d'une memoire en circuit integre pourvue d'au moins un element de redondance |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2764096B1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102479557A (zh) * | 2010-11-19 | 2012-05-30 | 阿尔特拉公司 | 带有冗余位及存储器元件表决电路的存储器阵列 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3728521A1 (de) * | 1987-08-26 | 1989-03-09 | Siemens Ag | Anordnung und verfahren zur feststellung und lokalisierung von fehlerhaften schaltkreisen eines speicherbausteins |
US5313424A (en) * | 1992-03-17 | 1994-05-17 | International Business Machines Corporation | Module level electronic redundancy |
EP0637034B1 (fr) * | 1993-07-26 | 1999-01-13 | STMicroelectronics S.r.l. | Procédé de détection d'éléments défectueux d'une mémoire redondante à semi-conducteur |
US5577050A (en) * | 1994-12-28 | 1996-11-19 | Lsi Logic Corporation | Method and apparatus for configurable build-in self-repairing of ASIC memories design |
-
1997
- 1997-05-30 FR FR9706903A patent/FR2764096B1/fr not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102479557A (zh) * | 2010-11-19 | 2012-05-30 | 阿尔特拉公司 | 带有冗余位及存储器元件表决电路的存储器阵列 |
US9582374B2 (en) | 2010-11-19 | 2017-02-28 | Altera Corporation | Memory array with redundant bits and memory element voting circuits |
CN102479557B (zh) * | 2010-11-19 | 2017-05-10 | 阿尔特拉公司 | 带有冗余位及存储器元件表决电路的存储器阵列 |
Also Published As
Publication number | Publication date |
---|---|
FR2764096A1 (fr) | 1998-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CL | Concession to grant licenses | ||
AV | Other act affecting the existence or the validity of an industrial property right | ||
ST | Notification of lapse |
Effective date: 20080131 |