FR2756380B1 - Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests - Google Patents
Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de testsInfo
- Publication number
- FR2756380B1 FR2756380B1 FR9614510A FR9614510A FR2756380B1 FR 2756380 B1 FR2756380 B1 FR 2756380B1 FR 9614510 A FR9614510 A FR 9614510A FR 9614510 A FR9614510 A FR 9614510A FR 2756380 B1 FR2756380 B1 FR 2756380B1
- Authority
- FR
- France
- Prior art keywords
- measurement
- current
- row
- limit value
- consumption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9614510A FR2756380B1 (fr) | 1996-11-25 | 1996-11-25 | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests |
US09/284,939 US6263464B1 (en) | 1996-11-25 | 1997-11-06 | Device for controlling conformity of consumption of an electronic component in a testing machine |
PCT/FR1997/001987 WO1998024026A1 (fr) | 1996-11-25 | 1997-11-06 | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests |
EP97913259A EP1010079A1 (fr) | 1996-11-25 | 1997-11-06 | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests |
KR1019990703762A KR20000052898A (ko) | 1996-11-25 | 1997-11-06 | 테스트 기기에서 전자 부품(component)의 소비를 테스트하는 순응 (conformance) 테스트 장치 |
JP52434398A JP2001508565A (ja) | 1996-11-25 | 1997-11-06 | 試験機における電子素子の消費の規格適合性を制御する装置 |
TW086117365A TW368605B (en) | 1996-11-25 | 1997-11-20 | Conformance testing apparatus for testing electronic component consumption in a testing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9614510A FR2756380B1 (fr) | 1996-11-25 | 1996-11-25 | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2756380A1 FR2756380A1 (fr) | 1998-05-29 |
FR2756380B1 true FR2756380B1 (fr) | 1998-12-18 |
Family
ID=9498068
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9614510A Expired - Fee Related FR2756380B1 (fr) | 1996-11-25 | 1996-11-25 | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests |
Country Status (7)
Country | Link |
---|---|
US (1) | US6263464B1 (fr) |
EP (1) | EP1010079A1 (fr) |
JP (1) | JP2001508565A (fr) |
KR (1) | KR20000052898A (fr) |
FR (1) | FR2756380B1 (fr) |
TW (1) | TW368605B (fr) |
WO (1) | WO1998024026A1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7148421B2 (ja) * | 2019-01-22 | 2022-10-05 | ファナック株式会社 | 工作機械の予防保全システム |
JP7277152B2 (ja) | 2019-01-22 | 2023-05-18 | ファナック株式会社 | 工作機械の工具管理システム |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2944256B2 (ja) * | 1991-06-10 | 1999-08-30 | 三菱電機株式会社 | デバッグ用プログラム作成方法 |
US5543728A (en) * | 1993-06-15 | 1996-08-06 | Grace; James W. | Low leakage diode switches for a tester circuit for integrated circuits |
US5519335A (en) * | 1995-03-13 | 1996-05-21 | Unisys Corporation | Electronic tester for testing Iddq in an integrated circuit chip |
US5528603A (en) * | 1995-05-01 | 1996-06-18 | Micron Technology, Inc. | Apparatus and method for testing an integrated circuit using a voltage reference potential and a reference integrated circuit |
-
1996
- 1996-11-25 FR FR9614510A patent/FR2756380B1/fr not_active Expired - Fee Related
-
1997
- 1997-11-06 JP JP52434398A patent/JP2001508565A/ja active Pending
- 1997-11-06 US US09/284,939 patent/US6263464B1/en not_active Expired - Lifetime
- 1997-11-06 EP EP97913259A patent/EP1010079A1/fr not_active Ceased
- 1997-11-06 KR KR1019990703762A patent/KR20000052898A/ko not_active Application Discontinuation
- 1997-11-06 WO PCT/FR1997/001987 patent/WO1998024026A1/fr not_active Application Discontinuation
- 1997-11-20 TW TW086117365A patent/TW368605B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR20000052898A (ko) | 2000-08-25 |
FR2756380A1 (fr) | 1998-05-29 |
TW368605B (en) | 1999-09-01 |
JP2001508565A (ja) | 2001-06-26 |
EP1010079A1 (fr) | 2000-06-21 |
WO1998024026A1 (fr) | 1998-06-04 |
US6263464B1 (en) | 2001-07-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20100730 |