TW368605B - Conformance testing apparatus for testing electronic component consumption in a testing machine - Google Patents

Conformance testing apparatus for testing electronic component consumption in a testing machine

Info

Publication number
TW368605B
TW368605B TW086117365A TW86117365A TW368605B TW 368605 B TW368605 B TW 368605B TW 086117365 A TW086117365 A TW 086117365A TW 86117365 A TW86117365 A TW 86117365A TW 368605 B TW368605 B TW 368605B
Authority
TW
Taiwan
Prior art keywords
testing
measurement
conformance
current
row
Prior art date
Application number
TW086117365A
Other languages
English (en)
Inventor
Gilles Iafrate
Jean-Pascal Mallet
Roland Petit
Original Assignee
Schlumberger Ind Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Ind Sa filed Critical Schlumberger Ind Sa
Application granted granted Critical
Publication of TW368605B publication Critical patent/TW368605B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
TW086117365A 1996-11-25 1997-11-20 Conformance testing apparatus for testing electronic component consumption in a testing machine TW368605B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9614510A FR2756380B1 (fr) 1996-11-25 1996-11-25 Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests

Publications (1)

Publication Number Publication Date
TW368605B true TW368605B (en) 1999-09-01

Family

ID=9498068

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086117365A TW368605B (en) 1996-11-25 1997-11-20 Conformance testing apparatus for testing electronic component consumption in a testing machine

Country Status (7)

Country Link
US (1) US6263464B1 (zh)
EP (1) EP1010079A1 (zh)
JP (1) JP2001508565A (zh)
KR (1) KR20000052898A (zh)
FR (1) FR2756380B1 (zh)
TW (1) TW368605B (zh)
WO (1) WO1998024026A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7148421B2 (ja) * 2019-01-22 2022-10-05 ファナック株式会社 工作機械の予防保全システム
JP7277152B2 (ja) 2019-01-22 2023-05-18 ファナック株式会社 工作機械の工具管理システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2944256B2 (ja) * 1991-06-10 1999-08-30 三菱電機株式会社 デバッグ用プログラム作成方法
US5543728A (en) * 1993-06-15 1996-08-06 Grace; James W. Low leakage diode switches for a tester circuit for integrated circuits
US5519335A (en) * 1995-03-13 1996-05-21 Unisys Corporation Electronic tester for testing Iddq in an integrated circuit chip
US5528603A (en) * 1995-05-01 1996-06-18 Micron Technology, Inc. Apparatus and method for testing an integrated circuit using a voltage reference potential and a reference integrated circuit

Also Published As

Publication number Publication date
FR2756380B1 (fr) 1998-12-18
US6263464B1 (en) 2001-07-17
KR20000052898A (ko) 2000-08-25
EP1010079A1 (fr) 2000-06-21
FR2756380A1 (fr) 1998-05-29
JP2001508565A (ja) 2001-06-26
WO1998024026A1 (fr) 1998-06-04

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