FR2588416B1 - Procede de formation selective d'un film depose - Google Patents
Procede de formation selective d'un film deposeInfo
- Publication number
- FR2588416B1 FR2588416B1 FR868613927A FR8613927A FR2588416B1 FR 2588416 B1 FR2588416 B1 FR 2588416B1 FR 868613927 A FR868613927 A FR 868613927A FR 8613927 A FR8613927 A FR 8613927A FR 2588416 B1 FR2588416 B1 FR 2588416B1
- Authority
- FR
- France
- Prior art keywords
- deposited film
- selective formation
- selective
- formation
- deposited
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/763—Polycrystalline semiconductor regions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02636—Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
- H01L21/02639—Preparation of substrate for selective deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/32055—Deposition of semiconductive layers, e.g. poly - or amorphous silicon layers
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22339585A JPS6281711A (ja) | 1985-10-07 | 1985-10-07 | 堆積膜の選択形成方法 |
JP22339485A JPS6281728A (ja) | 1985-10-07 | 1985-10-07 | 素子分離領域の形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2588416A1 FR2588416A1 (fr) | 1987-04-10 |
FR2588416B1 true FR2588416B1 (fr) | 1991-06-21 |
Family
ID=26525448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR868613927A Expired - Lifetime FR2588416B1 (fr) | 1985-10-07 | 1986-10-07 | Procede de formation selective d'un film depose |
Country Status (4)
Country | Link |
---|---|
US (1) | US5393646A (fr) |
DE (1) | DE3634140A1 (fr) |
FR (1) | FR2588416B1 (fr) |
GB (1) | GB2183090B (fr) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0828357B2 (ja) * | 1986-04-28 | 1996-03-21 | キヤノン株式会社 | 多層構造の形成方法 |
US5324536A (en) * | 1986-04-28 | 1994-06-28 | Canon Kabushiki Kaisha | Method of forming a multilayered structure |
JP2505754B2 (ja) * | 1986-07-11 | 1996-06-12 | キヤノン株式会社 | 光電変換装置の製造方法 |
US5296087A (en) * | 1987-08-24 | 1994-03-22 | Canon Kabushiki Kaisha | Crystal formation method |
EP0312202A1 (fr) * | 1987-08-24 | 1989-04-19 | Canon Kabushiki Kaisha | Procédé pour former un cristal |
AU623863B2 (en) * | 1987-08-24 | 1992-05-28 | Canon Kabushiki Kaisha | Method of forming crystals |
DE68912638T2 (de) * | 1988-03-27 | 1994-06-16 | Canon Kk | Verfahren zur Herstellung einer Kristallschicht auf einem Substrat. |
US4847214A (en) * | 1988-04-18 | 1989-07-11 | Motorola Inc. | Method for filling trenches from a seed layer |
US4952026A (en) * | 1988-10-14 | 1990-08-28 | Corning Incorporated | Integral optical element and method |
US5304461A (en) * | 1989-01-10 | 1994-04-19 | Kabushiki Kaisha Kobe Seiko Sho | Process for the selective deposition of thin diamond film by gas phase synthesis |
GB2228745B (en) * | 1989-01-10 | 1993-09-08 | Kobe Steel Ltd | Process for the selective deposition of thin diamond film by gas phase synthesis |
JP4310076B2 (ja) * | 2001-05-31 | 2009-08-05 | キヤノン株式会社 | 結晶性薄膜の製造方法 |
JP6953480B2 (ja) * | 2019-07-31 | 2021-10-27 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、およびプログラム |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1229093B (de) * | 1963-01-23 | 1966-11-24 | Basf Ag | Verfahren zur Herstellung von Hexahydropyrimidinderivaten |
US3370995A (en) * | 1965-08-02 | 1968-02-27 | Texas Instruments Inc | Method for fabricating electrically isolated semiconductor devices in integrated circuits |
GB1191102A (en) * | 1966-06-29 | 1970-05-06 | Dom Holdings Ltd | Improvements in or relating to Clips for a Pipe or the like |
CH490515A (de) * | 1967-11-22 | 1970-05-15 | Battelle Development Corp | Verfahren zur Erzeugung von kristallinen Abscheidungen in Form eines Musters auf einer elektrisch isolierenden amorphen, poly- oder einkristallinen Unterlage |
DE1769605A1 (de) * | 1968-06-14 | 1971-07-01 | Siemens Ag | Verfahren zum Herstellen epitaktischer Aufwachsschichten aus Halbleitermaterial fuer elektrische Bauelemente |
US3697343A (en) * | 1970-12-16 | 1972-10-10 | Ibm | Method of selective chemical vapor deposition |
US3697342A (en) * | 1970-12-16 | 1972-10-10 | Ibm | Method of selective chemical vapor deposition |
DE2151127C3 (de) * | 1970-12-16 | 1981-04-16 | International Business Machines Corp., 10504 Armonk, N.Y. | Verfahren zum Abscheiden eines Metallisierungsmusters und seine Anwendung |
DE2151346C3 (de) * | 1971-10-15 | 1981-04-09 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Verfahren zum Herstellung einer aus Einkristallschichtteilen und Polykristallschichtteilen bestehenden Halbleiterschicht auf einem Einkristallkörper |
JPS53102628A (en) * | 1977-02-21 | 1978-09-07 | Canon Inc | Manufacture for parallel type stripe filter |
US4477308A (en) * | 1982-09-30 | 1984-10-16 | At&T Bell Laboratories | Heteroepitaxy of multiconstituent material by means of a _template layer |
JPS6050920A (ja) * | 1983-08-30 | 1985-03-22 | Toshiba Corp | 半導体装置の製造方法 |
NL8420336A (nl) * | 1983-12-19 | 1985-11-01 | Mobil Solar Energy Corp | Werkwijze voor het vervaardigen van zonnecellen. |
JPS60173842A (ja) * | 1984-02-20 | 1985-09-07 | Canon Inc | パタ−ン形成方法 |
US4595608A (en) * | 1984-11-09 | 1986-06-17 | Harris Corporation | Method for selective deposition of tungsten on silicon |
US4650695A (en) * | 1985-05-13 | 1987-03-17 | Mobil Solar Energy Corporation | Method of fabricating solar cells |
US4619038A (en) * | 1985-08-15 | 1986-10-28 | Motorola, Inc. | Selective titanium silicide formation |
US4617087A (en) * | 1985-09-27 | 1986-10-14 | International Business Machines Corporation | Method for differential selective deposition of metal for fabricating metal contacts in integrated semiconductor circuits |
JPS63237533A (ja) * | 1987-03-26 | 1988-10-04 | Canon Inc | 2−6族化合物膜の選択形成方法 |
-
1986
- 1986-10-06 GB GB8623956A patent/GB2183090B/en not_active Expired
- 1986-10-07 FR FR868613927A patent/FR2588416B1/fr not_active Expired - Lifetime
- 1986-10-07 DE DE19863634140 patent/DE3634140A1/de active Granted
-
1993
- 1993-01-19 US US08/003,693 patent/US5393646A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3634140C2 (fr) | 1988-10-27 |
GB2183090B (en) | 1989-09-13 |
US5393646A (en) | 1995-02-28 |
GB8623956D0 (en) | 1986-11-12 |
DE3634140A1 (de) | 1987-04-09 |
GB2183090A (en) | 1987-05-28 |
FR2588416A1 (fr) | 1987-04-10 |
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