FR2578347B1 - Procede et appareil d'essai fonctionnels rapides de memoires a acces direct - Google Patents

Procede et appareil d'essai fonctionnels rapides de memoires a acces direct

Info

Publication number
FR2578347B1
FR2578347B1 FR858517408A FR8517408A FR2578347B1 FR 2578347 B1 FR2578347 B1 FR 2578347B1 FR 858517408 A FR858517408 A FR 858517408A FR 8517408 A FR8517408 A FR 8517408A FR 2578347 B1 FR2578347 B1 FR 2578347B1
Authority
FR
France
Prior art keywords
direct access
access memories
functional test
quick functional
quick
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR858517408A
Other languages
English (en)
Other versions
FR2578347A1 (fr
Inventor
David Merrill Jacobson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Publication of FR2578347A1 publication Critical patent/FR2578347A1/fr
Application granted granted Critical
Publication of FR2578347B1 publication Critical patent/FR2578347B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
FR858517408A 1985-03-04 1985-11-25 Procede et appareil d'essai fonctionnels rapides de memoires a acces direct Expired - Fee Related FR2578347B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/708,749 US4715034A (en) 1985-03-04 1985-03-04 Method of and system for fast functional testing of random access memories

Publications (2)

Publication Number Publication Date
FR2578347A1 FR2578347A1 (fr) 1986-09-05
FR2578347B1 true FR2578347B1 (fr) 1992-09-04

Family

ID=24847047

Family Applications (1)

Application Number Title Priority Date Filing Date
FR858517408A Expired - Fee Related FR2578347B1 (fr) 1985-03-04 1985-11-25 Procede et appareil d'essai fonctionnels rapides de memoires a acces direct

Country Status (6)

Country Link
US (1) US4715034A (fr)
JP (1) JPS61202255A (fr)
CN (1) CN1006095B (fr)
DE (1) DE3607015A1 (fr)
FR (1) FR2578347B1 (fr)
GB (1) GB2172128B (fr)

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DE3634352A1 (de) * 1986-10-08 1988-04-21 Siemens Ag Verfahren und anordnung zum testen von mega-bit-speicherbausteinen mit beliebigen testmustern im multi-bit-testmodus
US4891811A (en) * 1987-02-13 1990-01-02 International Business Machines Corporation Efficient address test for large memories
US4782486A (en) * 1987-05-14 1988-11-01 Digital Equipment Corporation Self-testing memory
US4782487A (en) * 1987-05-15 1988-11-01 Digital Equipment Corporation Memory test method and apparatus
DE3718182A1 (de) * 1987-05-29 1988-12-15 Siemens Ag Verfahren und anordnung zur ausfuehrung eines selbsttestes eines wortweise organisierten rams
US4873705A (en) * 1988-01-27 1989-10-10 John Fluke Mfg. Co., Inc. Method of and system for high-speed, high-accuracy functional testing of memories in microprocessor-based units
US4876684A (en) * 1988-02-11 1989-10-24 John Fluke Mfg. Co., Inc. Method of and apparatus for diagnosing failures in read only memory systems and the like
WO1989009471A2 (fr) * 1988-04-01 1989-10-05 Digital Equipment Corporation Procede et appareil d'autotest de memoire
US5033048A (en) * 1988-04-01 1991-07-16 Digital Equipment Corporation Memory selftest method and apparatus same
US4903266A (en) * 1988-04-29 1990-02-20 International Business Machines Corporation Memory self-test
US4965799A (en) * 1988-08-05 1990-10-23 Microcomputer Doctors, Inc. Method and apparatus for testing integrated circuit memories
GB2222461B (en) * 1988-08-30 1993-05-19 Mitsubishi Electric Corp On chip testing of semiconductor memory devices
US4980888A (en) * 1988-09-12 1990-12-25 Digital Equipment Corporation Memory testing system
GB2228113B (en) * 1989-02-10 1993-01-27 Plessey Co Plc Circuit arrangement for verifying data stored in a random access memory
US5222067A (en) * 1990-03-08 1993-06-22 Terenix Co., Ltd. Detection of pattern-sensitive faults in RAM by use of M-sequencers
EP0446534A3 (en) * 1990-03-16 1992-08-05 John Fluke Mfg. Co., Inc. Method of functionally testing cache tag rams in limited-access processor systems
DE69114183T2 (de) * 1990-06-07 1996-05-30 Ibm System zur Reduzierung von Prüfdatenspeichern.
JPH04271445A (ja) * 1990-08-02 1992-09-28 Internatl Business Mach Corp <Ibm> メモリ・テスト装置
US5377148A (en) * 1990-11-29 1994-12-27 Case Western Reserve University Apparatus and method to test random access memories for a plurality of possible types of faults
US5974570A (en) * 1990-12-01 1999-10-26 Hitachi, Ltd. Method for managing data processing system and high-reliability memory
AU660011B2 (en) * 1991-04-26 1995-06-08 Nec Corporation Method and system for fault coverage testing memory
DE4227281C1 (de) * 1992-08-18 1994-02-10 Siemens Ag Anordnung zum Testen eines Speichers nach dem Selbsttestprinzip
JP3645578B2 (ja) * 1992-09-17 2005-05-11 テキサス インスツルメンツ インコーポレイテツド スマート・メモリの組込み自己検査のための装置と方法
FR2697663B1 (fr) * 1992-10-30 1995-01-13 Hewett Packard Cy Circuit de test de mémoire.
US5471482A (en) * 1994-04-05 1995-11-28 Unisys Corporation VLSI embedded RAM test
US5511164A (en) * 1995-03-01 1996-04-23 Unisys Corporation Method and apparatus for determining the source and nature of an error within a computer system
US5757915A (en) * 1995-08-25 1998-05-26 Intel Corporation Parameterized hash functions for access control
US5588046A (en) * 1995-10-23 1996-12-24 Casio Phonemate, Inc. Digital telephone answering device and method of testing message storage memory therein
US5883844A (en) * 1997-05-23 1999-03-16 Stmicroelectronics, Inc. Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof
US6339834B1 (en) * 1998-05-28 2002-01-15 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Industry Through The Communication Research Centre Interleaving with golden section increments
GB2370126B (en) * 2000-07-18 2004-01-21 Sgs Thomson Microelectronics Memory testing
US6694461B1 (en) * 1999-07-26 2004-02-17 Ati International Srl System and method for testing integrated memories
US6532571B1 (en) * 2000-01-21 2003-03-11 International Business Machines Corporation Method to improve a testability analysis of a hierarchical design
US6728911B1 (en) 2000-11-16 2004-04-27 Utstarcom, Inc. System and method for testing memory systems
US6799291B1 (en) * 2000-11-20 2004-09-28 International Business Machines Corporation Method and system for detecting a hard failure in a memory array
US7200759B2 (en) * 2001-06-08 2007-04-03 Safenet B.V. Method and device for making information contents of a volatile semiconductor memory irretrievable
DE10161042B4 (de) * 2001-12-12 2004-02-05 Infineon Technologies Ag Verfahren zum Betreiben eines Halbleiterspeichers und Halbleiterspeicher
US7216270B1 (en) * 2004-05-14 2007-05-08 National Semiconductor Corporation System and method for providing testing and failure analysis of integrated circuit memory devices
US7346816B2 (en) * 2004-09-29 2008-03-18 Yen-Fu Liu Method and system for testing memory using hash algorithm
US7634696B2 (en) * 2005-03-03 2009-12-15 Sigmatel, Inc. System and method for testing memory
US7472337B2 (en) * 2005-03-22 2008-12-30 Cummins, Inc. Method and system for detecting faults in an electronic engine control module
JP2007241840A (ja) * 2006-03-10 2007-09-20 Toshiba Corp メモリ診断装置、メモリ診断方法、及びメモリ診断システム
JP5302050B2 (ja) * 2009-03-04 2013-10-02 富士通株式会社 障害解析のためのトレース装置およびトレース方法
ITTO20110355A1 (it) * 2011-04-21 2012-10-22 Red S R L Struttura di appoggio, in particolare per un veicolo
JP5986474B2 (ja) * 2012-09-28 2016-09-06 株式会社東芝 メモリ故障診断装置、メモリ故障診断方法
US9418759B2 (en) * 2014-05-06 2016-08-16 Intel IP Corporation Assist circuits for SRAM testing
CN105702299B (zh) * 2015-12-30 2018-09-28 工业和信息化部电子第五研究所 存储器单元失效检测方法与系统
CN106201434B (zh) * 2016-07-05 2018-07-10 南通理工学院 可逆随机数生成器
US10510431B2 (en) * 2017-09-22 2019-12-17 Qualcomm Incorporated Detecting random telegraph noise defects in memory
US10658067B2 (en) 2018-05-14 2020-05-19 Micron Technology, Inc. Managing data disturbance in a memory with asymmetric disturbance effects
CN112098770A (zh) * 2020-08-20 2020-12-18 深圳市宏旺微电子有限公司 针对动态耦合故障模拟极端环境下的测试方法和装置

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US3579199A (en) * 1969-02-03 1971-05-18 Gen Motors Corp Method and apparatus for fault testing a digital computer memory
US3751649A (en) * 1971-05-17 1973-08-07 Marcrodata Co Memory system exerciser
US3719929A (en) * 1971-08-11 1973-03-06 Litton Systems Inc Memory analyzers
US3719885A (en) * 1971-12-13 1973-03-06 Ibm Statistical logic test system having a weighted random test pattern generator
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
NL7416755A (nl) * 1974-12-23 1976-06-25 Philips Nv Werkwijze en inrichting voor het testen van een digitaal geheugen.
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
GB2028517A (en) * 1978-08-22 1980-03-05 Catt I Testing digital circuits
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FR2474226B1 (fr) * 1980-01-22 1985-10-11 Thomson Csf Dispositif de test pour enregistreur numerique multipiste
US4342084A (en) * 1980-08-11 1982-07-27 International Business Machines Corporation Main storage validation means
US4429389A (en) * 1981-05-26 1984-01-31 Burroughs Corporation Test pattern address generator
US4442519A (en) * 1982-03-05 1984-04-10 International Business Machines Corporation Memory address sequence generator
US4503537A (en) * 1982-11-08 1985-03-05 International Business Machines Corporation Parallel path self-testing system
US4513418A (en) * 1982-11-08 1985-04-23 International Business Machines Corporation Simultaneous self-testing system

Also Published As

Publication number Publication date
CN86102265A (zh) 1986-09-03
GB8528483D0 (en) 1985-12-24
CN1006095B (zh) 1989-12-13
DE3607015A1 (de) 1986-09-04
JPS61202255A (ja) 1986-09-08
GB2172128A (en) 1986-09-10
FR2578347A1 (fr) 1986-09-05
GB2172128B (en) 1989-05-17
US4715034A (en) 1987-12-22

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