FR2494868B1 - Circuit logique permettant une operation d'essai - Google Patents

Circuit logique permettant une operation d'essai

Info

Publication number
FR2494868B1
FR2494868B1 FR8121981A FR8121981A FR2494868B1 FR 2494868 B1 FR2494868 B1 FR 2494868B1 FR 8121981 A FR8121981 A FR 8121981A FR 8121981 A FR8121981 A FR 8121981A FR 2494868 B1 FR2494868 B1 FR 2494868B1
Authority
FR
France
Prior art keywords
logic circuit
test operation
test
logic
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8121981A
Other languages
English (en)
Other versions
FR2494868A1 (fr
Inventor
Masato Kawai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Publication of FR2494868A1 publication Critical patent/FR2494868A1/fr
Application granted granted Critical
Publication of FR2494868B1 publication Critical patent/FR2494868B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
FR8121981A 1980-11-25 1981-11-24 Circuit logique permettant une operation d'essai Expired FR2494868B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55166074A JPS5789154A (en) 1980-11-25 1980-11-25 Logical integrated circuit

Publications (2)

Publication Number Publication Date
FR2494868A1 FR2494868A1 (fr) 1982-05-28
FR2494868B1 true FR2494868B1 (fr) 1988-04-08

Family

ID=15824492

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8121981A Expired FR2494868B1 (fr) 1980-11-25 1981-11-24 Circuit logique permettant une operation d'essai

Country Status (4)

Country Link
US (1) US4424581A (fr)
JP (1) JPS5789154A (fr)
DE (1) DE3146721A1 (fr)
FR (1) FR2494868B1 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0196083B1 (fr) * 1985-03-26 1992-07-22 Kabushiki Kaisha Toshiba Circuit logique
US4937770A (en) * 1986-02-07 1990-06-26 Teradyne, Inc. Simulation system
US4926320A (en) * 1987-04-07 1990-05-15 Nec Corporation Information processing system having microprogram-controlled type arithmetic processing unit
JPS63286781A (ja) * 1987-05-19 1988-11-24 Mitsubishi Electric Corp 回路の試験方法
JPH03260739A (ja) * 1990-03-09 1991-11-20 Advantest Corp 順序動作型論理回路
US5130568A (en) * 1990-11-05 1992-07-14 Vertex Semiconductor Corporation Scannable latch system and method
JPH05199080A (ja) * 1992-01-17 1993-08-06 Sony Corp 相補型論理回路
JPH05232196A (ja) * 1992-02-25 1993-09-07 Mitsubishi Electric Corp テスト回路
US5774738A (en) * 1993-05-03 1998-06-30 Texas Instruments Incorporated State machines
JP3346827B2 (ja) * 1993-05-25 2002-11-18 三菱電機株式会社 同期型半導体記憶装置
TW222725B (en) * 1993-07-09 1994-04-21 Philips Electronics Nv Testing sequential logic circuit upon changing into combinatorial logic circuit
US5416362A (en) * 1993-09-10 1995-05-16 Unisys Corporation Transparent flip-flop
JP3321926B2 (ja) * 1993-09-17 2002-09-09 株式会社日立製作所 自己同期型半導体集積回路装置
US6011744A (en) * 1997-07-16 2000-01-04 Altera Corporation Programmable logic device with multi-port memory
US7042756B2 (en) * 2002-10-18 2006-05-09 Viciciv Technology Configurable storage device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
DD123129A1 (fr) * 1975-12-16 1976-11-20
US4051352A (en) * 1976-06-30 1977-09-27 International Business Machines Corporation Level sensitive embedded array logic system
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
DE3009945A1 (de) * 1979-03-15 1980-09-18 Nippon Electric Co Integrierter, logischer schaltkreis mit funktionspruefung
JPS5665395A (en) 1979-10-30 1981-06-03 Fujitsu Ltd Bit-line voltage level setting circuit

Also Published As

Publication number Publication date
DE3146721C2 (fr) 1989-12-14
DE3146721A1 (de) 1982-09-16
JPS6117022B2 (fr) 1986-05-06
JPS5789154A (en) 1982-06-03
US4424581A (en) 1984-01-03
FR2494868A1 (fr) 1982-05-28

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Legal Events

Date Code Title Description
ST Notification of lapse