|
DE3027775A1
(de)
*
|
1980-07-23 |
1982-02-04 |
Eckehardt Dipl.-Chem. 8550 Forchheim Strich |
Verfahren zur optischen ueberpruefung schnell bewegter homogener materialbahnen auf fehlerstellen
|
|
EP0056215B1
(de)
*
|
1981-01-12 |
1985-06-19 |
MANNESMANN Aktiengesellschaft |
Vorrichtung und Verfahren zur Inspektion von Gusssträngen in einer Stranggiessanlage
|
|
EP0058452B1
(fr)
*
|
1981-02-12 |
1985-05-29 |
CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif |
Procédé et dispositif pour la détection des défauts de surface des profilés et des demi-produits
|
|
US4463437A
(en)
*
|
1981-04-27 |
1984-07-31 |
Bethlehem Steel Corp. |
Furnace burden thermographic method and apparatus
|
|
US4481534A
(en)
*
|
1981-04-29 |
1984-11-06 |
Mitsubishi Denki Kabushiki Kaisha |
Configuration detecting device
|
|
US4561103A
(en)
*
|
1981-07-29 |
1985-12-24 |
Dai Nippon Insatsu Kabushiki Kaisha |
Print inspecting method and apparatus
|
|
US4692799A
(en)
*
|
1982-04-05 |
1987-09-08 |
Showa Electric Wire & Cable Co., Ltd. |
Automatic inspection system for detecting foreign matter
|
|
DE3236416A1
(de)
*
|
1982-10-01 |
1984-04-05 |
Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt |
Verfahren zur qualitaetsbeurteilung von stahloberflaechen
|
|
US4550376A
(en)
*
|
1983-02-14 |
1985-10-29 |
Maciejczak Robert A |
Inspection system for mechanical structures
|
|
US4581632A
(en)
*
|
1983-05-27 |
1986-04-08 |
Key Technology, Inc. |
Optical inspection apparatus for moving articles
|
|
USRE33357E
(en)
*
|
1983-05-27 |
1990-09-25 |
Key Technology, Inc. |
Optical inspection apparatus for moving articles
|
|
US4561104A
(en)
*
|
1984-01-16 |
1985-12-24 |
Honeywell Inc. |
Automated inspection of hot steel slabs
|
|
CA1229392A
(en)
*
|
1984-02-28 |
1987-11-17 |
Hirosato Yamane |
Method and apparatus for detection of surface defects of hot metal body
|
|
US4649426A
(en)
*
|
1984-06-12 |
1987-03-10 |
The United States Of America As Represented By The United States Department Of Energy |
Electronic imaging system and technique
|
|
JPS62138740A
(ja)
*
|
1985-12-13 |
1987-06-22 |
Hiyuutec:Kk |
シ−ト面の欠陥検出方法
|
|
EP0319533A4
(en)
*
|
1986-08-13 |
1991-09-11 |
The Broken Hill Proprietary Company Limited |
Determining a dimension of an article
|
|
FR2615765B1
(fr)
*
|
1987-05-29 |
1992-09-04 |
Usinor Aciers |
Procede et dispositif de determination du sabre d'une tole
|
|
US4814868A
(en)
*
|
1987-10-02 |
1989-03-21 |
Quadtek, Inc. |
Apparatus and method for imaging and counting moving particles
|
|
DE3819183A1
(de)
*
|
1988-06-06 |
1989-12-07 |
Sick Optik Elektronik Erwin |
Verfahren zur fehlererkennung bei laufenden materialbahnen
|
|
JP2856806B2
(ja)
*
|
1990-01-08 |
1999-02-10 |
株式会社リコー |
ピークホールド回路
|
|
US5120976A
(en)
*
|
1990-07-25 |
1992-06-09 |
The Boeing Company |
Strip lay-up verification system with width and centerline skew determination
|
|
JPH0739999B2
(ja)
*
|
1991-01-24 |
1995-05-01 |
肇産業株式会社 |
欠陥検出方法
|
|
JPH0678895B2
(ja)
*
|
1991-01-24 |
1994-10-05 |
肇産業株式会社 |
欠陥判別方法
|
|
US5146311A
(en)
*
|
1991-06-21 |
1992-09-08 |
Aluminum Company Of America |
Method of indentifying and quantifying oxides on rolled metal strip
|
|
DE9211860U1
(de)
*
|
1991-09-16 |
1992-11-05 |
Lisec, Peter, Amstetten-Hausmening |
Anordnung zum Prüfen der Versiegelung von Isolierglasscheiben
|
|
US5668887A
(en)
*
|
1992-05-29 |
1997-09-16 |
Eastman Kodak Company |
Coating density analyzer and method using non-synchronous TDI camera
|
|
JPH08154154A
(ja)
*
|
1994-09-29 |
1996-06-11 |
Minolta Co Ltd |
画像読み取り装置
|
|
US5654977A
(en)
*
|
1995-02-02 |
1997-08-05 |
Teledyne Industries Inc. |
Method and apparatus for real time defect inspection of metal at elevated temperature
|
|
US5604583A
(en)
*
|
1995-03-20 |
1997-02-18 |
Bausch & Lomb Incorporated |
Computer vision inspection station
|
|
EP0880023A1
(de)
*
|
1997-05-23 |
1998-11-25 |
Siemag Transplan Gmbh |
Verfahren und Vorrichtung zur automatischen Detektion von Oberflächenfehlern beim kontinuierlichen mechanischem Abtragen von Material von Stranggiessprodukten
|
|
US6859285B1
(en)
|
1999-08-31 |
2005-02-22 |
Og Technologies, Inc. |
Optical observation device and method for observing articles at elevated temperatures
|
|
US6950546B2
(en)
*
|
2002-12-03 |
2005-09-27 |
Og Technologies, Inc. |
Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
|
|
US7324681B2
(en)
|
2002-12-03 |
2008-01-29 |
Og Technologies, Inc. |
Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
|
|
US7460703B2
(en)
*
|
2002-12-03 |
2008-12-02 |
Og Technologies, Inc. |
Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
|
|
KR101439546B1
(ko)
*
|
2007-12-27 |
2014-09-30 |
주식회사 포스코 |
슬라브 측면 흠 검출 장치
|
|
JP5160993B2
(ja)
*
|
2008-07-25 |
2013-03-13 |
株式会社荏原製作所 |
基板処理装置
|
|
DE102012206221A1
(de)
|
2012-03-14 |
2013-09-19 |
Sms Siemag Ag |
Verfahren und Vorrichtung zur Oberflächeninspektion von metallurgischen Gießprodukten in einer Produktionslinie
|
|
US9689804B2
(en)
*
|
2013-12-23 |
2017-06-27 |
Kla-Tencor Corporation |
Multi-channel backside wafer inspection
|
|
JP6698661B2
(ja)
*
|
2014-12-29 |
2020-05-27 |
エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド |
アライメントフィーチャを用いた独立側部測定を介する適応部分プロファイル生成
|
|
US10244149B2
(en)
*
|
2015-06-09 |
2019-03-26 |
Lockheed Martin Corporation |
Imaging system with scan line titled off focal plane
|
|
JP6265253B1
(ja)
*
|
2016-12-15 |
2018-01-24 |
オムロン株式会社 |
検査装置および検査方法
|
