FR2410271A1 - Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x - Google Patents

Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x

Info

Publication number
FR2410271A1
FR2410271A1 FR7735901A FR7735901A FR2410271A1 FR 2410271 A1 FR2410271 A1 FR 2410271A1 FR 7735901 A FR7735901 A FR 7735901A FR 7735901 A FR7735901 A FR 7735901A FR 2410271 A1 FR2410271 A1 FR 2410271A1
Authority
FR
France
Prior art keywords
radiation
photoelectrons
microanalysis
processes involving
brush
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7735901A
Other languages
English (en)
Other versions
FR2410271B1 (fr
Inventor
Jacques Cazaux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Priority to FR7735901A priority Critical patent/FR2410271A1/fr
Priority to CH1186378A priority patent/CH628437A5/fr
Priority to GB7845407A priority patent/GB2009494B/en
Priority to DE19782850748 priority patent/DE2850748A1/de
Priority to US05/964,031 priority patent/US4218617A/en
Priority to JP14613478A priority patent/JPS5483893A/ja
Publication of FR2410271A1 publication Critical patent/FR2410271A1/fr
Application granted granted Critical
Publication of FR2410271B1 publication Critical patent/FR2410271B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PROCEDE ET DISPOSITIF DE MICRO-ANALYSE SUIVANT LEQUEL ON BALAIE, A L'AIDE D'UN PINCEAU D'ELECTRONS 14, UNE COUCHE MINCE DE MATERIAU ANTICATHODE. LE RAYONNEMENT X FORME EST RECU PAR UNE COUCHE MINCE DE CONVERTISSEUR OU IL DONNE NAISSANCE A UN COURANT DE PHOTOELECTRONS QU'ON SOUMET A UNE MESURE D'INTENSITE PAR UN ANALYSEUR 17. ON DEDUIT DE LA MESURE D'INTENSITE DES PHOTOELECTRONS LES PROPRIETES DE LA ZONE DE L'ANTICATHODE QUI RECOIT LE PINCEAU. APPLICATIONS COURANTES.
FR7735901A 1977-11-29 1977-11-29 Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x Granted FR2410271A1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR7735901A FR2410271A1 (fr) 1977-11-29 1977-11-29 Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x
CH1186378A CH628437A5 (fr) 1977-11-29 1978-11-20 Procede de micro-analyse faisant intervenir un rayonnement x.
GB7845407A GB2009494B (en) 1977-11-29 1978-11-21 Micro analysis using x-rays
DE19782850748 DE2850748A1 (de) 1977-11-29 1978-11-23 Verfahren und vorrichtung zur mikroanalyse mittels einer roentgenstrahlung
US05/964,031 US4218617A (en) 1977-11-29 1978-11-27 Micro-analysis processes using X-rays
JP14613478A JPS5483893A (en) 1977-11-29 1978-11-28 Microanalysis method that use xxrays radiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7735901A FR2410271A1 (fr) 1977-11-29 1977-11-29 Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x

Publications (2)

Publication Number Publication Date
FR2410271A1 true FR2410271A1 (fr) 1979-06-22
FR2410271B1 FR2410271B1 (fr) 1980-08-22

Family

ID=9198207

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7735901A Granted FR2410271A1 (fr) 1977-11-29 1977-11-29 Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x

Country Status (6)

Country Link
US (1) US4218617A (fr)
JP (1) JPS5483893A (fr)
CH (1) CH628437A5 (fr)
DE (1) DE2850748A1 (fr)
FR (1) FR2410271A1 (fr)
GB (1) GB2009494B (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102180A (ja) * 1981-12-14 1983-06-17 Nippon Telegr & Teleph Corp <Ntt> Ｘ線分光法
JPS58102181A (ja) * 1981-12-14 1983-06-17 Nippon Telegr & Teleph Corp <Ntt> Ｘ線分光法
JPS58102178A (ja) * 1981-12-14 1983-06-17 Nippon Telegr & Teleph Corp <Ntt> Ｘ線分光法
JPS58102179A (ja) * 1981-12-14 1983-06-17 Nippon Telegr & Teleph Corp <Ntt> Ｘ線分光法
JPS58105076A (ja) * 1981-12-17 1983-06-22 Nippon Telegr & Teleph Corp <Ntt> Ｘ線分光法
IE58049B1 (en) * 1985-05-21 1993-06-16 Tekscan Ltd Surface analysis microscopy apparatus
DE3820549A1 (de) * 1988-06-16 1989-12-21 Fraunhofer Ges Forschung Verfahren und vorrichtung zur untersuchung von membranoberflaechen
IT1223998B (it) * 1988-12-16 1990-09-29 Sip Sistema di rivelazione per analisi in catodoluminescenza
DE9107788U1 (de) * 1991-06-25 1991-09-12 TRW Repa GmbH, 7077 Alfdorf Befestigung für das Gehäuse eines Sicherheitsgurtaufrollers
US6184523B1 (en) 1998-07-14 2001-02-06 Board Of Regents Of The University Of Nebraska High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use
DE19933650C1 (de) * 1999-07-17 2001-03-08 Bruker Saxonia Analytik Gmbh Ionisationskammer mit einer nicht- radioaktiven Ionisationsquelle
US20060219956A1 (en) * 2005-03-09 2006-10-05 Bergman Joshua J Device and method for generating characteristic radiation or energy

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1327572A (en) * 1971-03-23 1973-08-22 Ass Elect Ind Apparatus for use in charged particle spectroscopy
DE2151167C3 (de) * 1971-10-14 1974-05-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Elektronenstrahl-Mikroanalysator mit Auger-Elektronen-Nachweis
US3866044A (en) * 1974-02-01 1975-02-11 Nuclear Equipment Corp Apparatus for determining concentration profile of an element

Also Published As

Publication number Publication date
CH628437A5 (fr) 1982-02-26
GB2009494A (en) 1979-06-13
FR2410271B1 (fr) 1980-08-22
DE2850748A1 (de) 1979-05-31
JPS5483893A (en) 1979-07-04
GB2009494B (en) 1982-09-02
US4218617A (en) 1980-08-19

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Legal Events

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