FR2361628A1 - Procede interferometrique - Google Patents
Procede interferometriqueInfo
- Publication number
- FR2361628A1 FR2361628A1 FR7720042A FR7720042A FR2361628A1 FR 2361628 A1 FR2361628 A1 FR 2361628A1 FR 7720042 A FR7720042 A FR 7720042A FR 7720042 A FR7720042 A FR 7720042A FR 2361628 A1 FR2361628 A1 FR 2361628A1
- Authority
- FR
- France
- Prior art keywords
- grating
- diffraction
- measured
- diffracted
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02032—Interferometers characterised by the beam path configuration generating a spatial carrier frequency, e.g. by creating lateral or angular offset between reference and object beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/30—Grating as beam-splitter
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Optical Transform (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Procédé interférométrique de mesure relative à la surface. Un faisceau de lumière cohérente monochromatique et collimatée frappe un réseau 1 disposé parallèlement à la surface à mesurer. Un ordre de diffraction S1 de la lumière réfléchie par le réseau est toujours parallèle à trois autres ordres de diffraction du rayonnement S2 à S4 qui après avoir été diffracté puis réfléchie par la surface à mesurer sont à nouveau diffractés par le réseau. Les quatre composantes engendrent deux champs d'interférence dont la combinaison crée une configuration de battement En choisissant convenablement theta o et h, la résolution des franges d'interférence est en relation avec lambda /4 et le système permet une très grande précision. Peut être utilisé pour toute mesure optique, électronique, rayon X, relative à la surface.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762636211 DE2636211C2 (de) | 1976-08-12 | 1976-08-12 | Interferometrisches Verfahren zur Abstands- oder Ebenheitsmessung |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2361628A1 true FR2361628A1 (fr) | 1978-03-10 |
FR2361628B1 FR2361628B1 (fr) | 1980-12-19 |
Family
ID=5985252
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7720042A Granted FR2361628A1 (fr) | 1976-08-12 | 1977-06-21 | Procede interferometrique |
Country Status (6)
Country | Link |
---|---|
US (1) | US4188124A (fr) |
JP (1) | JPS6036003B2 (fr) |
DE (1) | DE2636211C2 (fr) |
FR (1) | FR2361628A1 (fr) |
GB (1) | GB1582661A (fr) |
IT (1) | IT1125790B (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2413632A1 (fr) * | 1977-12-27 | 1979-07-27 | Ibm | Procede interferometrique a resolution 1/4 servant notamment pour la fabrication des circuits integres |
FR2504256A1 (fr) * | 1981-04-16 | 1982-10-22 | Euromask | Procede et dispositif de mesure optique de deplacement et application aux photorepeteurs sur tranche |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0066030B1 (fr) * | 1981-05-29 | 1986-08-27 | Ibm Deutschland Gmbh | Dispositif et procédé pour la mesure interférométrique de planéité |
US4656347A (en) * | 1984-01-30 | 1987-04-07 | Nippon Telegraph & Telephone Public Corporation | Diffraction grating position adjuster using a grating and a reflector |
US4641972A (en) * | 1984-09-14 | 1987-02-10 | New York Institute Of Technology | Method and apparatus for surface profilometry |
US4657394A (en) * | 1984-09-14 | 1987-04-14 | New York Institute Of Technology | Apparatus and method for obtaining three dimensional surface contours |
US5636025A (en) * | 1992-04-23 | 1997-06-03 | Medar, Inc. | System for optically measuring the surface contour of a part using more fringe techniques |
CA2067400A1 (fr) * | 1992-04-28 | 1993-10-29 | Robert E. Bredberg | Dispositif de mesure d'epaisseur au laser |
GB9405457D0 (en) * | 1994-03-19 | 1994-05-04 | British Aerospace | Testing a metal component for cold compression of the metal |
JP3158878B2 (ja) * | 1994-07-28 | 2001-04-23 | 松下電器産業株式会社 | 光学式エンコーダ |
US5953448A (en) * | 1996-03-01 | 1999-09-14 | Textile/Clothing Technology Corporation | Contour measurement of an object having a discontinuous surface using block point identification techniques |
WO1999046602A1 (fr) | 1998-03-09 | 1999-09-16 | Gou Lite Ltd. | Mesure de la translation par voie optique |
MXPA00009038A (es) * | 1998-03-09 | 2002-06-04 | Gou Lite Ltd | Medicion de traslacion optica. |
US6424407B1 (en) | 1998-03-09 | 2002-07-23 | Otm Technologies Ltd. | Optical translation measurement |
WO2002079718A1 (fr) * | 2001-03-29 | 2002-10-10 | Georgia Tech Research Corporation | Systeme et procede de profilage de surface |
US6643025B2 (en) | 2001-03-29 | 2003-11-04 | Georgia Tech Research Corporation | Microinterferometer for distance measurements |
US7518737B2 (en) * | 2002-03-29 | 2009-04-14 | Georgia Tech Research Corp. | Displacement-measuring optical device with orifice |
US7116430B2 (en) * | 2002-03-29 | 2006-10-03 | Georgia Technology Research Corporation | Highly-sensitive displacement-measuring optical device |
US7440117B2 (en) * | 2002-03-29 | 2008-10-21 | Georgia Tech Research Corp. | Highly-sensitive displacement-measuring optical device |
US7485847B2 (en) * | 2004-12-08 | 2009-02-03 | Georgia Tech Research Corporation | Displacement sensor employing discrete light pulse detection |
CN106908325B (zh) * | 2017-01-13 | 2020-09-01 | 西南交通大学 | 基于光栅衍射的杨氏模量微小伸长量测量装置及测量方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2150037A5 (fr) * | 1971-08-09 | 1973-03-30 | Ibm |
-
1976
- 1976-08-12 DE DE19762636211 patent/DE2636211C2/de not_active Expired
-
1977
- 1977-06-21 FR FR7720042A patent/FR2361628A1/fr active Granted
- 1977-07-20 JP JP52086179A patent/JPS6036003B2/ja not_active Expired
- 1977-07-26 IT IT26097/77A patent/IT1125790B/it active
- 1977-07-27 GB GB31581/77A patent/GB1582661A/en not_active Expired
- 1977-08-01 US US05/820,985 patent/US4188124A/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2413632A1 (fr) * | 1977-12-27 | 1979-07-27 | Ibm | Procede interferometrique a resolution 1/4 servant notamment pour la fabrication des circuits integres |
FR2504256A1 (fr) * | 1981-04-16 | 1982-10-22 | Euromask | Procede et dispositif de mesure optique de deplacement et application aux photorepeteurs sur tranche |
EP0065429A1 (fr) * | 1981-04-16 | 1982-11-24 | Euromask | Procédé et dispositif de mesure optique de déplacement et application aux photorépéteurs sur tranche |
Also Published As
Publication number | Publication date |
---|---|
JPS5337090A (en) | 1978-04-05 |
JPS6036003B2 (ja) | 1985-08-17 |
IT1125790B (it) | 1986-05-14 |
DE2636211C2 (de) | 1978-01-26 |
GB1582661A (en) | 1981-01-14 |
US4188124A (en) | 1980-02-12 |
DE2636211B1 (de) | 1977-06-02 |
FR2361628B1 (fr) | 1980-12-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |