FR2284984A1 - Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnements - Google Patents
Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnementsInfo
- Publication number
- FR2284984A1 FR2284984A1 FR7431139A FR7431139A FR2284984A1 FR 2284984 A1 FR2284984 A1 FR 2284984A1 FR 7431139 A FR7431139 A FR 7431139A FR 7431139 A FR7431139 A FR 7431139A FR 2284984 A1 FR2284984 A1 FR 2284984A1
- Authority
- FR
- France
- Prior art keywords
- zone
- mos transistor
- charge carrier
- potential
- carrier collecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 title abstract 3
- 239000002800 charge carrier Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- 230000003321 amplification Effects 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 abstract 1
- 238000003199 nucleic acid amplification method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/112—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
- H01L31/113—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor
- H01L31/1136—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor the device being a metal-insulator-semiconductor field-effect transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7431139A FR2284984A1 (fr) | 1974-09-13 | 1974-09-13 | Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnements |
CH1155675A CH596671A5 (fr) | 1974-09-13 | 1975-09-05 | |
NL7510655A NL7510655A (nl) | 1974-09-13 | 1975-09-10 | Werkwijze en detectie-inrichting van stralingen. |
JP50110844A JPS5154790A (fr) | 1974-09-13 | 1975-09-12 | |
DE19752541117 DE2541117A1 (de) | 1974-09-13 | 1975-09-15 | Verfahren zum abtasten von strahlung und vorrichtung zur durchfuehrung des verfahrens |
US05/900,088 US4143266A (en) | 1974-09-13 | 1978-04-26 | Method and device for detecting radiatons |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7431139A FR2284984A1 (fr) | 1974-09-13 | 1974-09-13 | Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnements |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2284984A1 true FR2284984A1 (fr) | 1976-04-09 |
FR2284984B1 FR2284984B1 (fr) | 1978-12-29 |
Family
ID=9143081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7431139A Granted FR2284984A1 (fr) | 1974-09-13 | 1974-09-13 | Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnements |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS5154790A (fr) |
CH (1) | CH596671A5 (fr) |
DE (1) | DE2541117A1 (fr) |
FR (1) | FR2284984A1 (fr) |
NL (1) | NL7510655A (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5574293A (en) * | 1993-03-23 | 1996-11-12 | Tdk Corp. | Solid state imaging device using disilane |
JP3126661B2 (ja) | 1996-06-25 | 2001-01-22 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
JP3634089B2 (ja) | 1996-09-04 | 2005-03-30 | 株式会社半導体エネルギー研究所 | 表示装置 |
-
1974
- 1974-09-13 FR FR7431139A patent/FR2284984A1/fr active Granted
-
1975
- 1975-09-05 CH CH1155675A patent/CH596671A5/xx not_active IP Right Cessation
- 1975-09-10 NL NL7510655A patent/NL7510655A/xx not_active Application Discontinuation
- 1975-09-12 JP JP50110844A patent/JPS5154790A/ja active Pending
- 1975-09-15 DE DE19752541117 patent/DE2541117A1/de not_active Withdrawn
Non-Patent Citations (1)
Title |
---|
NEANT * |
Also Published As
Publication number | Publication date |
---|---|
NL7510655A (nl) | 1976-03-16 |
DE2541117A1 (de) | 1976-03-25 |
FR2284984B1 (fr) | 1978-12-29 |
JPS5154790A (fr) | 1976-05-14 |
CH596671A5 (fr) | 1978-03-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5495116A (en) | Solid image pickup unit | |
JPS5755672A (en) | Solid-state image pickup device and its driving method | |
FR2284984A1 (fr) | Procede de realisation de transistors m.o.s. sur isolant pour la detection de rayonnements | |
FR2441264A1 (fr) | Ecran sensible aux radiations | |
JPS5395581A (en) | Manufacture for semiconductor device | |
JPS5630371A (en) | Semiconductor image pickup unit | |
JPS5724578A (en) | Infrared ray detecting element | |
JPS5586274A (en) | Charge transfer pickup unit and its driving method | |
JPS5244194A (en) | Photoelectric conversion device | |
JPS5610958A (en) | Semiconductor circuit | |
JPS5588372A (en) | Lateral type transistor | |
JPS5390781A (en) | Semiconductor radiation detector | |
JPS568873A (en) | Bipolar transistor | |
JPS57193073A (en) | Semiconductor radioactive ray detector | |
JPS5588378A (en) | Semiconductor device | |
SU646706A1 (ru) | Способ обработки полупроводниковых детекторов | |
Shah et al. | High efficiency detection of tritium using silicon avalanche photodiodes | |
Borel et al. | Method and device for detecting radiatons | |
JPS5518035A (en) | Infrared ray detector | |
Arai | Charge-storage junction field-effect transistor | |
SU128539A1 (ru) | Преобразователь лучистой энергии в электрическую | |
NL7611138A (en) | Photosensitive detector device in magneto=optical memory - has semiconductor body with electrode generating charges in depletion layer which drift to detector | |
JPS6457753A (en) | Charge transfer device | |
JPS55110079A (en) | Field-effect transistor | |
JPS5698855A (en) | Semiconductor memory device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |