FR2269718A1 - Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current - Google Patents

Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Info

Publication number
FR2269718A1
FR2269718A1 FR7413818A FR7413818A FR2269718A1 FR 2269718 A1 FR2269718 A1 FR 2269718A1 FR 7413818 A FR7413818 A FR 7413818A FR 7413818 A FR7413818 A FR 7413818A FR 2269718 A1 FR2269718 A1 FR 2269718A1
Authority
FR
France
Prior art keywords
transfer
semiconductor components
involves
variable current
integrated circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7413818A
Other languages
French (fr)
Other versions
FR2269718B1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MODEL EVGENIA
Original Assignee
MODEL EVGENIA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MODEL EVGENIA filed Critical MODEL EVGENIA
Priority to FR7413818A priority Critical patent/FR2269718A1/en
Publication of FR2269718A1 publication Critical patent/FR2269718A1/en
Application granted granted Critical
Publication of FR2269718B1 publication Critical patent/FR2269718B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

The p-n transfer which admits a variable current is used to determine a parameter from which a conclusion can be drawn about the quality of the semiconductor components and circuits which are being tested. This parameter is a deflection factor occurring in the passage of current through a real current-voltage characteristic in relation to an idealised characteristic. The current is admitted in the pass direction in a range determined by a particular ratio and increments of the voltage proportional to the deflection factor, which are caused by these currents, are measured at the p-n transfer.
FR7413818A 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current Granted FR2269718A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7413818A FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7413818A FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Publications (2)

Publication Number Publication Date
FR2269718A1 true FR2269718A1 (en) 1975-11-28
FR2269718B1 FR2269718B1 (en) 1977-01-07

Family

ID=9137897

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7413818A Granted FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Country Status (1)

Country Link
FR (1) FR2269718A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117368700A (en) * 2023-12-07 2024-01-09 深圳市易检车服科技有限公司 Automatic test system and automatic test method for circuit board in wireless equalizer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117368700A (en) * 2023-12-07 2024-01-09 深圳市易检车服科技有限公司 Automatic test system and automatic test method for circuit board in wireless equalizer
CN117368700B (en) * 2023-12-07 2024-02-09 深圳市易检车服科技有限公司 Automatic test system and automatic test method for circuit board in wireless equalizer

Also Published As

Publication number Publication date
FR2269718B1 (en) 1977-01-07

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Legal Events

Date Code Title Description
ST Notification of lapse