FR2269718A1 - Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current - Google Patents
Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable currentInfo
- Publication number
- FR2269718A1 FR2269718A1 FR7413818A FR7413818A FR2269718A1 FR 2269718 A1 FR2269718 A1 FR 2269718A1 FR 7413818 A FR7413818 A FR 7413818A FR 7413818 A FR7413818 A FR 7413818A FR 2269718 A1 FR2269718 A1 FR 2269718A1
- Authority
- FR
- France
- Prior art keywords
- transfer
- semiconductor components
- involves
- variable current
- integrated circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The p-n transfer which admits a variable current is used to determine a parameter from which a conclusion can be drawn about the quality of the semiconductor components and circuits which are being tested. This parameter is a deflection factor occurring in the passage of current through a real current-voltage characteristic in relation to an idealised characteristic. The current is admitted in the pass direction in a range determined by a particular ratio and increments of the voltage proportional to the deflection factor, which are caused by these currents, are measured at the p-n transfer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7413818A FR2269718A1 (en) | 1974-04-19 | 1974-04-19 | Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7413818A FR2269718A1 (en) | 1974-04-19 | 1974-04-19 | Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2269718A1 true FR2269718A1 (en) | 1975-11-28 |
FR2269718B1 FR2269718B1 (en) | 1977-01-07 |
Family
ID=9137897
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7413818A Granted FR2269718A1 (en) | 1974-04-19 | 1974-04-19 | Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2269718A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117368700A (en) * | 2023-12-07 | 2024-01-09 | 深圳市易检车服科技有限公司 | Automatic test system and automatic test method for circuit board in wireless equalizer |
-
1974
- 1974-04-19 FR FR7413818A patent/FR2269718A1/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117368700A (en) * | 2023-12-07 | 2024-01-09 | 深圳市易检车服科技有限公司 | Automatic test system and automatic test method for circuit board in wireless equalizer |
CN117368700B (en) * | 2023-12-07 | 2024-02-09 | 深圳市易检车服科技有限公司 | Automatic test system and automatic test method for circuit board in wireless equalizer |
Also Published As
Publication number | Publication date |
---|---|
FR2269718B1 (en) | 1977-01-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |