CN117368700B - Automatic test system and automatic test method for circuit board in wireless equalizer - Google Patents
Automatic test system and automatic test method for circuit board in wireless equalizer Download PDFInfo
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- CN117368700B CN117368700B CN202311669911.9A CN202311669911A CN117368700B CN 117368700 B CN117368700 B CN 117368700B CN 202311669911 A CN202311669911 A CN 202311669911A CN 117368700 B CN117368700 B CN 117368700B
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- 238000010998 test method Methods 0.000 title claims abstract description 14
- 238000006243 chemical reaction Methods 0.000 claims abstract description 94
- 238000000034 method Methods 0.000 claims description 16
- 238000007599 discharging Methods 0.000 claims description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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Abstract
The invention discloses an automatic test system and an automatic test method for a circuit board in a wireless equalizer. When the host device sends a switching mode instruction to the jig and sends an instrument instruction corresponding to the switching mode instruction to the programmable power supply or the programmable load, the programmable power supply or the programmable load sends a signal value to the jig according to the instrument instruction; the jig performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value; the host equipment determines calibration parameters in a preset calibration parameter acquisition strategy according to the conversion value and the signal value, and updates the calibration parameter acquisition strategy based on the calibration parameters; and the host equipment performs testing according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result. By implementing the embodiment of the invention, the circuit board to be tested can be automatically and quickly calibrated and tested without consuming a great deal of manpower, the possibility of error caused by complicated operation is reduced, and the testing efficiency is further improved.
Description
Technical Field
The invention relates to the technical field of new energy automobile battery management, in particular to an automatic test system and an automatic test method for a circuit board in a wireless equalizer.
Background
Currently, the wireless equalizer is mainly applied to battery management of new energy automobiles and the like, and performs charge-discharge equalization management on a series or parallel power battery pack so as to improve the performance and service life of the whole battery pack, so that the calibration and test of a circuit board in the wireless equalizer produced by a factory are important problems. The wireless equalizer produced by the factory has differences among each circuit board and needs to be calibrated. If the parameters are calibrated by simply manually accessing the data values from outside, a large amount of manpower is required, the operation is complex and easy to make mistakes, and the problem of low testing efficiency is caused.
Disclosure of Invention
The embodiment of the invention provides an automatic test system and an automatic test method for a circuit board in a wireless equalizer, which aim to solve the problems that a great deal of labor is required to be consumed in the calibration and test of the circuit board in the existing wireless equalizer in the prior art, the operation is complicated, errors are easy to occur, and the test efficiency is low.
In order to solve the above problems, in a first aspect, an embodiment of the present invention provides an automatic test system for a circuit board in a wireless equalizer, which includes a host device, a programmable power supply, a programmable load, a circuit board to be tested, and a fixture; the programmable power supply, the programmable load, the jig and the circuit board to be tested are all connected with the host equipment; the programmable power supply, the programmable load and the circuit board to be tested are all connected with the jig; the circuit board to be tested is provided with a plurality of circuit board channels, and the jig is provided with jig channels corresponding to the circuit board channels; the host device controls the programmable power supply or the programmable load through instrument commands;
When the host device sends a switching mode instruction to the jig and sends an instrument instruction corresponding to the switching mode instruction to the programmable power supply or the programmable load, the programmable power supply or the programmable load sends a signal value to the jig according to the instrument instruction; the jig performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value; the host equipment determines calibration parameters in a preset calibration parameter acquisition strategy according to the conversion value and the signal value, and updates the calibration parameter acquisition strategy based on the calibration parameters; and the host equipment performs testing according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result.
In a second aspect, an embodiment of the present invention further provides an automatic test method for a circuit board in a wireless equalizer, where the method is applied to the automatic test system for a circuit board in a wireless equalizer according to the first aspect, and the method includes
The method comprises the steps that a host device sends a switching mode instruction to a jig and sends an instrument instruction corresponding to the switching mode instruction to a programmable power supply or a programmable load;
The programmable power supply or the programmable load sends a signal value to the jig according to the received instrument instruction;
the jig receives the switching mode instruction and the signal value, and performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value;
the circuit board to be tested sends the conversion value and the signal value to the host equipment;
the host equipment receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value and a preset calibration parameter acquisition strategy, and updates the calibration parameter acquisition strategy based on the calibration parameter;
the host equipment sends the calibration parameter acquisition strategy to the circuit board to be tested for corresponding storage;
and the host equipment performs testing according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result.
The embodiment of the invention provides an automatic test system and an automatic test method for a circuit board in a wireless equalizer. And sending different instructions to control the programmable power supply, the programmable load, the jig and the circuit board to be tested through the host equipment, calibrating each circuit board channel of the circuit board to be tested to obtain different calibration parameter acquisition strategies, and testing each circuit board channel of the circuit board to be tested based on the calibration parameter acquisition strategies to obtain the test result of each circuit board channel in different switching modes. Therefore, the test method can automatically and quickly calibrate and test the circuit board to be tested without consuming a great deal of manpower, reduces the possibility of error caused by complex operation, and further improves the test efficiency.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic block diagram of an automatic test system framework for a circuit board in a wireless equalizer according to an embodiment of the present invention;
fig. 2 is a flow chart of an automatic test method for a circuit board in a wireless equalizer according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the terms "comprises" and "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
Referring to fig. 1, fig. 1 is a schematic block diagram of an automatic test system framework for a circuit board in a wireless equalizer according to an embodiment of the present invention.
As shown in fig. 1, an embodiment of the present invention provides an automatic test system 1 for a circuit board in a wireless equalizer, including: the device comprises a host device 10, a programmable power supply 20, a programmable load 30, a circuit board 40 to be tested and a jig 50; the programmable power supply 20, the programmable load 30, the jig 50 and the circuit board under test 40 are all connected with the host device 10; the programmable power supply 20, the programmable load 30, and the circuit board 40 to be tested are all connected with the fixture 50; the circuit board 40 to be tested is provided with a plurality of circuit board channels, and the jig 50 is provided with jig channels corresponding to the circuit board channels; the host device 10 controls the programmable power supply 20 or the programmable load 30 through instrument commands;
When the host device 10 transmits a switching mode instruction to the jig 50 and transmits an instrument instruction corresponding to the switching mode instruction to the programmable power supply 20 or the programmable load 30, the programmable power supply 20 or the programmable load 30 transmits a signal value to the jig 50 according to the instrument instruction; the jig 50 performs a preset operation on the circuit board 40 to be tested according to the switching mode instruction and the signal value to obtain a conversion value; the host device 10 determines calibration parameters in a preset calibration parameter acquisition strategy according to the conversion value and the signal value, and updates the calibration parameter acquisition strategy based on the calibration parameters; the host device 10 performs a test according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result.
In this embodiment, as shown in fig. 1-2, the host device 10 may be a computer, a server, or the like, and is a device with specific software installed, and may control the programmable power supply 20, the programmable load 30, the circuit board under test 40, and the fixture 50; the programmable power supply 20 may sequentially send a plurality of different voltage values to the jig 50; the programmable load 30 may sequentially send a plurality of different current values to the fixture 50; the circuit board 40 to be tested is a circuit board in a wireless equalizer, and can be installed in the wireless equalizer after calibration and test; the jig 50 may be provided with an interface and a program, which may transmit a command to the circuit board 40 to be tested for the host device 10, so as to control the circuit board 40 to be tested, which may be understood that the jig 50 assists in calibrating and testing the circuit board 40 to be tested.
The wireless equalizer is characterized in that a plurality of circuit boards can be arranged on the wireless equalizer, and can be installed on the wireless equalizer after the calibration and the test are carried out on the circuit boards. The host device 10 is connected to the programmable power supply 20 and the programmable load 30 via USB (Universal Serial Bus ); the programmable power supply 20 is connected with the jig 50 through a power output line; the programmable load 30 is connected to the jig 50 through a load output line.
According to the above embodiment, the system can automatically and rapidly calibrate and test the circuit board 40 to be tested without consuming a lot of manpower, thereby reducing the possibility of error caused by complicated operation and further improving the test efficiency.
In an embodiment, the circuit board 40 to be tested is provided with four circuit board channels, and the jig 50 is provided with four jig channels, and the four jig channels are connected with the four circuit board channels in a one-to-one correspondence manner.
In this embodiment, the circuit board 40 to be tested may be provided with a first circuit board channel, a second circuit board channel, a third circuit board channel and a fourth circuit board channel; the jig 50 may be provided with a first jig channel, a second jig channel, a third jig channel and a fourth jig channel; the first circuit board channel is connected with the first jig channel through a cable, the second circuit board channel is connected with the second jig channel through a cable, the third circuit board channel is connected with the third jig channel through a cable, and the fourth circuit board channel is connected with the fourth jig channel through a cable.
Specifically, the switching mode instruction generated by the host device 10 may correspondingly open the jig channel and the circuit board channel, and calibrate and test each circuit board channel in turn, that is, the host device 10 may sequentially select the circuit board channel and the jig channel corresponding to the circuit board channel, and then place the serial number of the selected circuit board channel into the switching mode instruction, so that three switching mode instructions may be sequentially sent to each circuit board channel to calibrate and test for three times, so that each circuit board channel of the circuit board 40 to be tested may obtain a test result. If the serial number of the circuit board channel is 1, the serial number of the jig channel is also 1, namely the serial numbers correspond to the first circuit board channel and the first jig channel, and other serial numbers are analogized in sequence.
According to the above embodiment, the circuit board channels of the circuit board 40 to be tested and the jig channels of the jig 50 are connected in one-to-one correspondence, and each circuit board channel of the host device 10 sequentially sends three switching mode instructions for three times to perform calibration and testing so as to ensure that the circuit board 40 to be tested can be used normally, which improves the testing Zhou Mixing of the system and further improves the testing efficiency.
In an embodiment, the host device 10 is connected to the circuit board under test 40 and the fixture 50 through serial ports, respectively.
In this embodiment, the host device 10 may be connected to the circuit board under test 40 through a first serial port and a corresponding cable, and the host device 10 may be connected to the jig 50 through a second serial port and a corresponding cable; namely, the serial port (serial interface is abbreviated as serial port, is an expansion interface adopting a serial communication mode) comprises the first serial port and the second serial port; the first serial port may be a 485 serial port, and the second serial port may also be a 485 serial port.
As can be seen from the above embodiments, the host device 10 may be connected to the circuit board 40 to be tested through a first serial port and a corresponding cable, and the host device 10 may be connected to the jig 50 through a second serial port and a corresponding cable, so that the device is connected through the serial port and the cable, and the manner of physically connecting the device may ensure the test stability.
The embodiment of the invention also provides an automatic test method for the circuit board in the wireless equalizer, and fig. 2 is a flow chart of the automatic test method for the circuit board in the wireless equalizer. The test method is applied to the automatic test system 1 of the circuit board in the wireless equalizer. As shown in fig. 2, the method includes the following steps S110 to S170.
S110, the host equipment sends a switching mode instruction to the jig and sends an instrument instruction corresponding to the switching mode instruction to the programmable power supply or the programmable load.
In an embodiment, the host device sends a switching mode instruction to a fixture, and sends an instrument instruction corresponding to the switching mode instruction to a programmable power supply or a programmable load, including:
if the host device sends a first switching mode instruction to the jig, the host device sends a first instrument instruction to the programmable power supply so that the programmable power supply generates a first signal value and a second signal value based on the first instrument instruction;
if the host device sends a second switching mode instruction to the jig, the host device sends a second instrument instruction to the programmable load so that the programmable load generates a third signal value and a fourth signal value based on the second instrument instruction;
and if the host equipment sends a third switching mode instruction to the jig, the host equipment sends a third instrument instruction to the programmable load so that the programmable load generates a fifth signal value and a sixth signal value based on the third instrument instruction.
In this embodiment, the host device may set three switching modes, that is, the host device may generate the first switching mode instruction, the second switching mode instruction, and the third switching mode instruction; the first switching mode instruction corresponds to the first instrument instruction, the second switching mode instruction corresponds to the second instrument instruction, the third switching mode instruction corresponds to the third instrument instruction, and the fourth switching mode instruction corresponds to the fourth instrument instruction.
The first switching mode instruction is used for testing the voltage condition of the circuit board to be tested, the second switching mode instruction is used for testing the charging current condition of the circuit board to be tested, and the third switching mode instruction is used for testing the discharging current condition of the circuit board to be tested.
Wherein the first instrument instruction, the second instrument instruction, and the third instrument instruction may each be a programmable instrument standard command (Standard Commands for Programmable Instruments, SCPI).
Wherein the first signal value and the second signal value may be voltage signal values generated by the programmable power supply based on the first instrument instructions, and the range of values of the first signal value and the second signal value may be 1V to 25V; the third signal value and the fourth signal value may be charging current signal values generated by the programmable load based on the second instrument instructions, and the range of values of the third signal value and the fourth signal value may be 0.1A to 6A; the fifth signal value and the sixth signal value may be discharge current signal values generated by the programmable power supply based on the first instrument instructions, and the range of values of the fifth signal value and the sixth signal value may be 0.1A to 6A.
Specifically, before the step of the host device sending a switching mode instruction to a jig and sending an instrument instruction corresponding to the switching mode instruction to a programmable power supply or a programmable load, the method includes:
the host device sends a reset instruction to the jig;
the jig receives the reset instruction, and closes a jig channel of the jig and a circuit board channel of the circuit board to be tested according to the reset instruction.
According to the above embodiment, it can be seen that the host device sends three different switching mode instructions to the jig, and sends an instrument instruction corresponding to the switching mode instruction to a programmable power supply or a programmable load, so as to perform subsequent targeted processing according to the switching mode instruction and the instrument instruction.
And S120, the programmable power supply or the programmable load sends a signal value to the jig according to the received instrument instruction.
In an embodiment, the programmable power supply or the programmable load sends a signal value to the jig according to the received instrument instruction, including:
if the programmable power supply receives the first instrument instruction, the programmable power supply sequentially sends the first signal value and the second signal value to the jig;
If the programmable power supply receives the second instrument instruction, the programmable power supply sequentially sends the third signal value and the fourth signal value to the jig;
and if the programmable power supply receives the third instrument instruction, the programmable power supply sequentially sends the fifth signal value and the sixth signal value to the jig.
In this embodiment, if the host device sends the first switching mode instruction to the jig, the host device sends the first instrument instruction to the programmable power supply, so that the programmable power supply generates the first signal value and the second signal value based on the first instrument instruction, and the programmable power supply sends the first signal value and the second signal value to the jig in sequence; if the host device sends the second switching mode instruction to the jig, the host device sends the second instrument instruction to the programmable load, so that the programmable load generates the third signal value and the fourth signal value based on the second instrument instruction, and the programmable load sequentially sends the third signal value and the fourth signal value to the jig; if the host device sends the third switching mode instruction to the jig, the host device sends the third instrument instruction to the programmable load, so that the programmable load generates the fifth signal value and the sixth signal value based on the third instrument instruction, and the programmable load sequentially sends the fifth signal value and the sixth signal value to the jig.
According to the above embodiment, the host device sends the instrument instruction to the programmable power supply or the programmable load based on the switching mode instruction, so that the programmable power supply or the programmable load sends the corresponding signal value to the jig, so that targeted processing can be performed according to the signal value.
S130, the jig receives the switching mode instruction and the signal value, and performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value.
In an embodiment, the fixture receives the switching mode instruction and the signal value, and performs a preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value, including:
if the jig receives the first switching mode instruction, the first signal value and the second signal value, the jig controls corresponding circuit board channels in the circuit board to be tested to be opened according to the first switching mode instruction, and sends the first signal value and the second signal value to the circuit board to be tested;
and if the circuit board to be tested receives the first signal value and the second signal value, the circuit board to be tested acquires a first conversion value for the first time according to the first signal value, and acquires a second conversion value for the second time according to the second signal value to serve as a preset operation.
In this embodiment, four circuit board channels are provided on the circuit board to be tested, four jig channels are provided on the jig, and the four jig channels are connected with the four circuit board channels in a one-to-one correspondence manner; namely, the four circuit board channels on the circuit board to be tested are automatically tested so as to ensure the normal operation and use of the wireless equalizer. Specifically, each circuit board channel of the circuit board to be tested needs to be calibrated in three switching modes, so as to obtain calibration parameters of each switching mode.
In this embodiment, if the jig receives the first switching mode instruction, the first signal value and the second signal value, the jig controls the jig channel corresponding to the circuit board channel to be opened according to the first switching mode instruction, controls the circuit board channel in the circuit board to be tested to be opened, and sends the first signal value and the second signal value to the circuit board to be tested through the jig channel and the circuit board channel;
if the circuit board to be tested receives the first signal value and the second signal value, the circuit board to be tested acquires a first conversion value through the circuit board channel according to the first signal value, and acquires a second conversion value as a preset operation through the circuit board channel according to the second signal value.
If the jig receives the second switching mode instruction, the third signal value and the fourth signal value, the jig controls corresponding circuit board channels in the circuit board to be tested to be opened according to the second switching mode instruction, and sends the third signal value and the fourth signal value to the circuit board to be tested;
and if the circuit board to be tested receives the third signal value and the fourth signal value, the circuit board to be tested acquires a third conversion value for the third time according to the third signal value, and acquires a fourth conversion value for the fourth time according to the fourth signal value to serve as a preset operation.
If the jig receives the third switching mode instruction, the fifth signal value and the sixth signal value, the jig controls corresponding circuit board channels in the circuit board to be tested to be opened according to the third switching mode instruction, and sends the fifth signal value and the sixth signal value to the circuit board to be tested;
and if the circuit board to be tested receives the fifth signal value and the sixth signal value, the circuit board to be tested acquires a fifth conversion value for the fifth time according to the fifth signal value, and acquires a sixth conversion value for the sixth time according to the sixth signal value to serve as a preset operation.
According to the above embodiment, the jig controls the circuit board to be tested according to the switching mode instruction and the signal value to obtain the conversion value corresponding to the signal value, so as to perform targeted processing according to the signal value and the conversion value.
And S140, the circuit board to be tested sends the conversion value and the signal value to the host equipment.
In this embodiment, the circuit board to be tested sends the signal value and the conversion value obtained by corresponding acquisition to the host device.
Specifically, when the circuit board to be tested receives the first signal value and the second signal value, performing first acquisition according to the first signal value to obtain a first conversion value, and performing second acquisition according to the second signal value to obtain a second conversion value, that is, the circuit board to be tested sends the first signal value, the second signal value, the first conversion value and the second conversion value to the host device; when the circuit board to be tested receives the third signal value and the fourth signal value, acquiring the third signal value for the third time according to the third signal value to obtain a third conversion value, acquiring the fourth signal value for the fourth time according to the fourth signal value to obtain a fourth conversion value, namely, the circuit board to be tested sends the third signal value, the fourth signal value, the third conversion value and the fourth conversion value to the host equipment; and when the circuit board to be tested receives the fifth signal value and the sixth signal value, performing fifth acquisition according to the fifth signal value to obtain a fifth conversion value, and performing sixth acquisition according to the sixth signal value to obtain a sixth conversion value, namely, the circuit board to be tested sends the fifth signal value, the sixth signal value, the fifth conversion value and the sixth conversion value to the host equipment.
S150, the host equipment receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value and a preset calibration parameter acquisition strategy, and updates the calibration parameter acquisition strategy based on the calibration parameter.
In an embodiment, the host device receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value, and a preset calibration parameter acquisition policy, and updates the calibration parameter acquisition policy based on the calibration parameter, including:
if the host device receives the first conversion value, the second conversion value, the first signal value and the second signal value;
the host device determining a first acquisition strategy based on the calibration parameter acquisition strategy from the first conversion value and the first signal value; the host device determining a second acquisition strategy based on the calibration parameter acquisition strategy from the second conversion value and the second signal value; the host device determining a first calibration parameter and a second calibration parameter based on the first acquisition policy and the second acquisition policy; the host device updates the calibration parameter acquisition policy based on the first calibration parameter and the second calibration parameter.
In this embodiment, when the host device sends a second switching mode instruction and an instrument instruction corresponding to the second switching mode instruction, the host device receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value and a preset calibration parameter acquisition policy, updates the calibration parameter acquisition policy based on the calibration parameter, and further includes: if the host device receives the third conversion value, the fourth conversion value, the third signal value and the fourth signal value; the host device determining a third acquisition strategy based on the calibration parameter acquisition strategy from the third conversion value and the third signal value; the host device determining a fourth acquisition strategy based on the calibration parameter acquisition strategy from the fourth conversion value and the fourth signal value; the host device determining a third calibration parameter and a fourth calibration parameter based on the third acquisition policy and the fourth acquisition policy; the host device updates the calibration parameter acquisition policy based on the third calibration parameter and the fourth calibration parameter.
In this embodiment, when the host device sends a third switching mode instruction and an instrument instruction corresponding to the third switching mode instruction, the host device receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value, and a calibration parameter acquisition policy, updates the calibration parameter acquisition policy based on the calibration parameter, and further includes: if the host device receives the fifth conversion value, the sixth conversion value, the fifth signal value and the sixth signal value; the host device determining a fifth acquisition strategy based on the calibration parameter acquisition strategy from the fifth conversion value and the fifth signal value; the host device determining a sixth acquisition strategy based on the calibration parameter acquisition strategy from the sixth conversion value and the sixth signal value; the host device determining a fifth calibration parameter and a sixth calibration parameter based on the fifth acquisition policy and the sixth acquisition policy; the host device updates the calibration parameter acquisition policy based on the fifth calibration parameter and the sixth calibration parameter.
In this embodiment, the switching mode instruction generated by the host device may correspondingly open the jig channel and the circuit board channel, and calibrate and test each circuit board channel in turn, that is, the host device may sequentially select the circuit board channel and the jig channel corresponding to the circuit board channel, and then place the serial number of the selected circuit board channel into the switching mode instruction, so that three kinds of switching mode instructions may be sequentially sent to each circuit board channel for three times of calibration and testing, so that each circuit board channel of the circuit board to be tested may obtain a test result. If the serial number of the circuit board channel is 1, the serial number of the jig channel is also 1, namely the serial numbers correspond to the first circuit board channel and the first jig channel, and other serial numbers are analogized in sequence.
Specifically, the calibration parameter obtaining policy may be a linear regression equation, and the switching module instruction is the first switching module instruction, and the serial number of the circuit board channel carried in the first switching module instruction is 1, that is, the first circuit board channel is tested as an example; the host device sends a first switching module instruction to the jig, and the host device sends the first instrument instruction to the programmable power supply based on the first switching module instruction; the programmable power supply sends the first signal value and the second signal value to the jig based on the first instrument instruction; the jig opens the first circuit board channel and the first jig channel corresponding to the first circuit board channel based on the first switching module instruction, and the jig sends the first signal value and the second signal value to the circuit board to be tested through the first jig channel and the first circuit board channel; the circuit board to be tested acquires the first conversion value through the first circuit board channel and according to the first signal value, acquires the second conversion value through the first circuit board channel and according to the second signal value, and sends the first signal value, the second signal value, the first conversion value and the second conversion value to the host equipment; the host equipment obtains a strategy according to the first signal value, the second signal value, the first conversion value, the second conversion value and the preset calibration parameter; if the first signal value may be X1, the second signal value may be X2, the first conversion value may be Y1, the second conversion value may be Y2, the preset calibration parameter acquisition policy is y=a+bx, the first acquisition policy of the host device determining the first conversion value Y1 and the first signal value X1 based on the calibration parameter acquisition policy y=a+bx may be y1=a+bx1, and the second acquisition policy of the second conversion value Y2 and the second signal value X2 based on the calibration parameter acquisition policy y=a+bx 2 may be y2=a+bx2; in this way, the host device may further determine the first calibration parameter a and the second calibration parameter B by calculation based on the first acquisition policy y1=a+bx1 and the second acquisition policy y2=a+bx2, thereby updating the calibration parameter acquisition policy, and thus determining the calibration parameter acquisition policy of the first circuit board channel. It should be noted that, when the host device sends the second switching mode instruction or the third switching mode instruction to the first circuit board channel, the steps of the method performed by the host device for sending the first switching mode instruction to the first circuit board channel are the same, so that each circuit board channel can obtain different calibration parameter acquisition strategies under the respective three switching mode instructions. In this way, the host device sends three different switching mode instructions to each circuit board channel of a circuit board to be tested, that is, each circuit board channel of a circuit board to be tested has three different calibration parameter acquisition strategies, and one circuit board to be tested includes four circuit board channels, so twelve different calibration parameter acquisition strategies are stored on one circuit board to be tested.
According to the above embodiment, it can be known that the host device determines the calibration parameters under the three switching mode instructions of each circuit board channel according to the conversion value, the signal value and the calibration parameter acquisition strategy, and updates the calibration parameter acquisition strategy based on the calibration parameters to obtain different calibration parameter acquisition strategies under the respective three switching modes of each circuit board channel. Thus, the present embodiment improves the test tightness.
And S160, the host equipment sends the calibration parameter acquisition strategy to the circuit board to be tested for corresponding storage.
In this embodiment, the host device sends the updated calibration parameter acquisition policy to a corresponding channel in the circuit board to be tested for corresponding storage. Specifically, the host device sends the updated calibration parameter acquisition strategy to the circuit board channel corresponding to the serial number of the circuit board channel for corresponding storage based on the serial number of the circuit board channel carried in the switching mode instruction.
S170, the host equipment tests according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result.
In an embodiment, the host device performs a test according to the instrument instruction and the calibration parameter acquisition policy to obtain a test result, including:
the host device sending the instrument instructions to the programmable power supply or the programmable load;
the programmable power supply or the programmable load sends a test signal value to the circuit board to be tested according to the received instrument instruction and through the jig;
the circuit board to be tested determines a test conversion value based on the test signal value and the calibration parameter acquisition strategy;
the circuit board to be tested sends the test conversion value and the test signal value to the host equipment;
the host device performs a difference operation according to the received test conversion value and the received test signal value to obtain a test difference value;
the host equipment performs comparison operation on the test difference value and a preset difference value to determine a comparison result;
and the host equipment determines the test result according to the comparison result.
In an embodiment, the determining, by the host device, the test result according to the comparison result includes:
if the host equipment determines that the comparison result is that the test difference value is smaller than the preset difference value, the host equipment determines that the test result is that the test is successful;
And if the host equipment determines that the comparison result is that the test difference value is greater than or equal to the preset difference value, the host equipment determines that the test result is test failure.
In this embodiment, the host device sends the first switching mode instruction and the first instrument instruction to calibrate the first circuit board channel and obtain the corresponding calibration parameter acquisition policy, where the host device sends the first instrument instruction to the programmable power supply again; the programmable power supply sends the test signal value to a first circuit board channel opened in the circuit board to be tested according to the received first instrument instruction and through the first tool channel opened in the tool; the circuit board to be tested determines the test conversion value based on the test signal value and the calibration parameter acquisition strategy; the circuit board to be tested sends the test conversion value and the test signal value to the host equipment; the host device performs a difference operation according to the received test conversion value and the received test signal value to obtain a test difference value; the host device compares the test difference value with the preset difference value to determine a comparison result of the corresponding mode of the first circuit board channel; if the host equipment determines that the comparison result is that the test difference value is smaller than the preset difference value, the host equipment determines that the test result is that the test is successful; and if the host equipment determines that the comparison result is that the test difference value is greater than or equal to the preset difference value, the host equipment determines that the test result is test failure. It should be noted that, when the host device sends the second switching mode instruction or the third switching mode instruction to the first circuit board channel, the steps of the method performed by the host device for sending the first switching mode instruction to the first circuit board channel are the same, so that each circuit board channel can obtain different test results under the respective three switching mode instructions.
For example, the test conversion value is 1.100V, the test signal value is 1.150V, the preset difference value is 500mV, the difference operation is performed on the test conversion value and the test signal value to obtain the test difference value of 0.05V, that is, the test difference value is 50mV, so that the test difference value 50mV is smaller than the preset difference value of 500mV, it can be determined that the comparison result is that the test difference value is smaller than the preset difference value, and the test result is that the test is successful.
According to the embodiment, the host device sends different instructions to control the programmable power supply, the programmable load, the jig and the circuit board to be tested, so that each circuit board channel of the circuit board to be tested is calibrated to obtain different calibration parameter acquisition strategies, and each circuit board channel of the circuit board to be tested is tested based on the calibration parameter acquisition strategies to obtain the test result of each circuit board channel in different switching modes. Therefore, the test method can automatically and quickly calibrate and test the circuit board to be tested without consuming a great deal of manpower, reduces the possibility of error caused by complex operation, and further improves the test efficiency.
It should be noted that, as those skilled in the art can clearly understand, the specific implementation process of the automatic testing method for a circuit board in the infinite equalizer may refer to the corresponding description in the foregoing embodiment of the testing system, and for convenience and brevity of description, the description is omitted here.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (10)
1. An automatic test system for a circuit board in a wireless equalizer, comprising: the device comprises a host device, a programmable power supply, a programmable load, a circuit board to be tested and a jig; the programmable power supply, the programmable load, the jig and the circuit board to be tested are all connected with the host equipment; the programmable power supply, the programmable load and the circuit board to be tested are all connected with the jig; the circuit board to be tested is provided with a plurality of circuit board channels, and the jig is provided with jig channels corresponding to the circuit board channels; the host device controls the programmable power supply or the programmable load through instrument commands;
When the host device sends a switching mode instruction to the jig and sends an instrument instruction corresponding to the switching mode instruction to the programmable power supply or the programmable load, the programmable power supply or the programmable load sends a signal value to the jig according to the instrument instruction; the jig performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value; the host equipment determines calibration parameters in a preset calibration parameter acquisition strategy according to the conversion value and the signal value, and updates the calibration parameter acquisition strategy based on the calibration parameters; the host equipment tests according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result; the switching mode instruction comprises an instruction for testing the voltage, the charging current and the discharging current of the circuit board to be tested;
the jig receives the switching mode instruction and the signal value, and performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value, including:
if the jig receives a first switching mode instruction, a first signal value and a second signal value, the jig controls corresponding circuit board channels in the circuit board to be tested to be opened according to the first switching mode instruction, and sends the first signal value and the second signal value to the circuit board to be tested;
If the circuit board to be tested receives the first signal value and the second signal value, the circuit board to be tested acquires a first conversion value for the first time according to the first signal value, and acquires a second conversion value for the second time according to the second signal value to serve as a preset operation;
the calibration parameter acquisition strategy is a linear regression equation.
2. The system of claim 1, wherein the circuit board to be tested is provided with four circuit board channels, the jig is provided with four jig channels, and the four jig channels are connected in one-to-one correspondence with the four circuit board channels.
3. The system of claim 1, wherein the host device is connected to the circuit board under test and the fixture through serial ports, respectively.
4. An automatic test method for a circuit board in a wireless equalizer, applied to an automatic test system for a circuit board in a wireless equalizer according to any one of claims 1 to 3, the method comprising:
the method comprises the steps that a host device sends a switching mode instruction to a jig and sends an instrument instruction corresponding to the switching mode instruction to a programmable power supply or a programmable load;
The programmable power supply or the programmable load sends a signal value to the jig according to the received instrument instruction;
the jig receives the switching mode instruction and the signal value, and performs preset operation on the circuit board to be tested according to the switching mode instruction and the signal value to obtain a conversion value;
the circuit board to be tested sends the conversion value and the signal value to the host equipment;
the host equipment receives the conversion value and the signal value, determines a calibration parameter according to the conversion value, the signal value and a preset calibration parameter acquisition strategy, and updates the calibration parameter acquisition strategy based on the calibration parameter;
the host equipment sends the calibration parameter acquisition strategy to the circuit board to be tested for corresponding storage;
and the host equipment performs testing according to the instrument instruction and the calibration parameter acquisition strategy to obtain a test result.
5. The method of claim 4, wherein the host device sending a switch mode instruction to a fixture and sending an instrument instruction corresponding to the switch mode instruction to a programmable power supply or programmable load, comprising:
If the host device sends a first switching mode instruction to the jig, the host device sends a first instrument instruction to the programmable power supply so that the programmable power supply generates a first signal value and a second signal value based on the first instrument instruction;
if the host device sends a second switching mode instruction to the jig, the host device sends a second instrument instruction to the programmable load so that the programmable load generates a third signal value and a fourth signal value based on the second instrument instruction;
and if the host equipment sends a third switching mode instruction to the jig, the host equipment sends a third instrument instruction to the programmable load so that the programmable load generates a fifth signal value and a sixth signal value based on the third instrument instruction.
6. The method of claim 5, wherein the programmable power supply or the programmable load sends a signal value to the jig according to the received instrument instructions, comprising:
if the programmable power supply receives the first instrument instruction, the programmable power supply sequentially sends the first signal value and the second signal value to the jig;
If the programmable power supply receives the second instrument instruction, the programmable power supply sequentially sends the third signal value and the fourth signal value to the jig;
and if the programmable power supply receives the third instrument instruction, the programmable power supply sequentially sends the fifth signal value and the sixth signal value to the jig.
7. The method of claim 6, wherein the jig receiving the switching mode command and the signal value and performing a preset operation on the circuit board to be tested according to the switching mode command and the signal value to obtain a conversion value comprises:
if the jig receives the first switching mode instruction, the first signal value and the second signal value, the jig controls corresponding circuit board channels in the circuit board to be tested to be opened according to the first switching mode instruction, and sends the first signal value and the second signal value to the circuit board to be tested;
and if the circuit board to be tested receives the first signal value and the second signal value, the circuit board to be tested acquires a first conversion value for the first time according to the first signal value, and acquires a second conversion value for the second time according to the second signal value to serve as a preset operation.
8. The method of claim 7, wherein the host device receives the converted value and the signal value, and determines a calibration parameter according to the converted value, the signal value, and a preset calibration parameter acquisition policy, and updating the calibration parameter acquisition policy based on the calibration parameter, comprising:
if the host device receives the first conversion value, the second conversion value, the first signal value and the second signal value;
the host device determining a first acquisition strategy based on the calibration parameter acquisition strategy from the first conversion value and the first signal value; the host device determining a second acquisition strategy based on the calibration parameter acquisition strategy from the second conversion value and the second signal value; the host device determining a first calibration parameter and a second calibration parameter based on the first acquisition policy and the second acquisition policy; the host device updates the calibration parameter acquisition policy based on the first calibration parameter and the second calibration parameter.
9. The method of claim 8, wherein the host device performing a test according to the instrument instructions and the calibration parameter acquisition strategy to obtain test results comprises:
The host device sending the instrument instructions to the programmable power supply or the programmable load;
the programmable power supply or the programmable load sends a test signal value to the circuit board to be tested according to the received instrument instruction and through the jig;
the circuit board to be tested determines a test conversion value based on the test signal value and the calibration parameter acquisition strategy;
the circuit board to be tested sends the test conversion value and the test signal value to the host equipment;
the host device performs a difference operation according to the received test conversion value and the received test signal value to obtain a test difference value;
the host equipment performs comparison operation on the test difference value and a preset difference value to determine a comparison result;
and the host equipment determines the test result according to the comparison result.
10. The method of claim 9, wherein the host device determining the test result from the comparison result comprises:
if the host equipment determines that the comparison result is that the test difference value is smaller than the preset difference value, the host equipment determines that the test result is that the test is successful;
And if the host equipment determines that the comparison result is that the test difference value is greater than or equal to the preset difference value, the host equipment determines that the test result is test failure.
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Denomination of invention: Automatic testing system and method for circuit board in wireless equalizer Granted publication date: 20240209 Pledgee: Societe Generale Bank Limited by Share Ltd. Shenzhen branch Pledgor: Shenzhen Yijian Car Service Technology Co.,Ltd. Registration number: Y2024980026280 |