GB1242791A - A circuit arrangement for measuring steady-state characteristics of semiconductor devices - Google Patents

A circuit arrangement for measuring steady-state characteristics of semiconductor devices

Info

Publication number
GB1242791A
GB1242791A GB507/69A GB50769A GB1242791A GB 1242791 A GB1242791 A GB 1242791A GB 507/69 A GB507/69 A GB 507/69A GB 50769 A GB50769 A GB 50769A GB 1242791 A GB1242791 A GB 1242791A
Authority
GB
United Kingdom
Prior art keywords
current
voltage
semiconductor devices
source
circuit arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB507/69A
Inventor
Jurgen Treetz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elektromat VEB
Original Assignee
Elektromat VEB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elektromat VEB filed Critical Elektromat VEB
Priority to GB507/69A priority Critical patent/GB1242791A/en
Publication of GB1242791A publication Critical patent/GB1242791A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1,242,791. Testing characteristics of semiconductor devices. ELEKTROMAT VEB. Jan.3, 1969, No.507/69. Heading G1U. To test the steady state current voltage characteristics of a semi-conductor device 2 without over-loading, the device is arranged in a series circuit with a pre-adjustable voltage source 1 and a pre-adjustable current source 3. A rectifier 4 and an indicating instrument 5 are connected across output terminals of the current source. The current source 3 will provide constant current up to a level set by the reverse current of the diode 4 under the action of the voltage source 1. The instrument 5 indicates the voltage across the component 2 due to the flow of constant current. The adjustable voltage and current may be derived from suitable batteries (8, 8<SP>1</SP>) and applied to the device 2 via operational amplifiers (6, 6<SP>1</SP>, 6<SP>11</SP>) Fig.3 (not shown).
GB507/69A 1969-01-03 1969-01-03 A circuit arrangement for measuring steady-state characteristics of semiconductor devices Expired GB1242791A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB507/69A GB1242791A (en) 1969-01-03 1969-01-03 A circuit arrangement for measuring steady-state characteristics of semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB507/69A GB1242791A (en) 1969-01-03 1969-01-03 A circuit arrangement for measuring steady-state characteristics of semiconductor devices

Publications (1)

Publication Number Publication Date
GB1242791A true GB1242791A (en) 1971-08-11

Family

ID=9705570

Family Applications (1)

Application Number Title Priority Date Filing Date
GB507/69A Expired GB1242791A (en) 1969-01-03 1969-01-03 A circuit arrangement for measuring steady-state characteristics of semiconductor devices

Country Status (1)

Country Link
GB (1) GB1242791A (en)

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