FR2184328A5 - - Google Patents

Info

Publication number
FR2184328A5
FR2184328A5 FR7316487A FR7316487A FR2184328A5 FR 2184328 A5 FR2184328 A5 FR 2184328A5 FR 7316487 A FR7316487 A FR 7316487A FR 7316487 A FR7316487 A FR 7316487A FR 2184328 A5 FR2184328 A5 FR 2184328A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7316487A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ALBERT RICHARD US
Original Assignee
ALBERT RICHARD US
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ALBERT RICHARD US filed Critical ALBERT RICHARD US
Application granted granted Critical
Publication of FR2184328A5 publication Critical patent/FR2184328A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes

Landscapes

  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Medicines Containing Plant Substances (AREA)
  • Radiation-Therapy Devices (AREA)
  • Dc-Dc Converters (AREA)
  • Electron Tubes For Measurement (AREA)
FR7316487A 1972-05-08 1973-05-08 Expired FR2184328A5 (xx)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US25137872A 1972-05-08 1972-05-08
US353451A US3925660A (en) 1972-05-08 1973-04-24 Selectable wavelength X-ray source, spectrometer and assay method

Publications (1)

Publication Number Publication Date
FR2184328A5 true FR2184328A5 (xx) 1973-12-21

Family

ID=26941572

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7316487A Expired FR2184328A5 (xx) 1972-05-08 1973-05-08

Country Status (6)

Country Link
US (1) US3925660A (xx)
CA (1) CA1021072A (xx)
DE (1) DE2323610A1 (xx)
FR (1) FR2184328A5 (xx)
GB (3) GB1436871A (xx)
NL (1) NL7306391A (xx)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2429425A1 (fr) * 1978-06-21 1980-01-18 Baecklund Nils Johannes Procede et appareil de mesure de la teneur ou valeur d'un element donne au moyen d'un rayonnement de rayons x
EP0014580A1 (en) * 1979-02-09 1980-08-20 Martin Marietta Corporation Element analysis unit
FR2454619A1 (fr) * 1979-04-20 1980-11-14 Kernforschungsz Karlsruhe Procede et dispositif de mesure continue de teneurs en elements
FR2548371A1 (fr) * 1983-06-28 1985-01-04 Enso Gutzeit Oy Procede de mesure de la quantite de revetement en silicium du papier ou du carton
FR2555887A1 (fr) * 1983-12-06 1985-06-07 Thomson Cgr Installation de radiodiagnostic pour examens stereoscopiques ou conventionnels
FR2565140A1 (fr) * 1984-05-23 1985-12-06 Inst Tekh Kibernet An Brus Dispositif planetaire de distribution de fil metallique
EP0461776A2 (en) * 1990-05-30 1991-12-18 Hitachi, Ltd. X-ray analysis apparatus, especially computer tomography apparatus

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4007375A (en) * 1975-07-14 1977-02-08 Albert Richard D Multi-target X-ray source
US4260885A (en) * 1978-02-24 1981-04-07 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US4362935A (en) * 1979-02-09 1982-12-07 Martin Marietta Corporation Field portable element analysis unit
NL8004727A (nl) * 1980-08-21 1982-03-16 Philips Nv Stralingsonderzoekapparaat met spleetvormige bundel.
ATE14953T1 (de) * 1981-04-21 1985-08-15 Robert S Ledley Mikrofokus-roentgenroehre.
US4558220A (en) * 1981-10-02 1985-12-10 Gearhart Industries, Inc. Radioactivity well logging
US4519092A (en) * 1982-10-27 1985-05-21 Albert Richard D Scanning x-ray spectrometry method and apparatus
JPS6034018A (ja) * 1983-08-06 1985-02-21 Canon Inc Ｘ線コリメ−タと露光装置
US4974247A (en) * 1987-11-24 1990-11-27 The Boeing Company System for radiographically inspecting an object using backscattered radiation and related method
US5257303A (en) * 1992-08-03 1993-10-26 Kamalaksha Das Gupta Surface channeled X-ray tube
US5651047A (en) * 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
US5550378A (en) * 1993-04-05 1996-08-27 Cardiac Mariners, Incorporated X-ray detector
US5682412A (en) * 1993-04-05 1997-10-28 Cardiac Mariners, Incorporated X-ray source
JP3249316B2 (ja) * 1993-12-20 2002-01-21 株式会社東芝 全反射蛍光ｘ線分析が行われる被測定体の表面処理方法
US6183139B1 (en) 1998-10-06 2001-02-06 Cardiac Mariners, Inc. X-ray scanning method and apparatus
US6118853A (en) * 1998-10-06 2000-09-12 Cardiac Mariners, Inc. X-ray target assembly
US6208709B1 (en) 1998-10-06 2001-03-27 Cardiac Mariners, Inc. Detection processing system
US6234671B1 (en) 1998-10-06 2001-05-22 Cardiac Mariners, Inc. X-ray system with scanning beam x-ray source below object table
US6118854A (en) * 1998-10-06 2000-09-12 Cardiac Mariners, Inc. Method of making x-ray beam hardening filter and assembly
US6157703A (en) * 1998-10-06 2000-12-05 Cardiac Mariners, Inc. Beam hardening filter for x-ray source
US6198802B1 (en) 1998-10-06 2001-03-06 Cardiac Mariners, Inc. Scanning beam x-ray source and assembly
US20050190882A1 (en) * 2003-04-04 2005-09-01 Mcguire Edward L. Multi-spectral x-ray image processing
US20040240618A1 (en) * 2003-04-04 2004-12-02 Mcguire Edward L. Multi-spectrum X-ray generation
US7078712B2 (en) * 2004-03-18 2006-07-18 Axcelis Technologies, Inc. In-situ monitoring on an ion implanter
US7200203B2 (en) * 2004-04-06 2007-04-03 Duke University Devices and methods for targeting interior cancers with ionizing radiation
US7711089B2 (en) * 2007-04-11 2010-05-04 The Invention Science Fund I, Llc Scintillator aspects of compton scattered X-ray visualization, imaging, or information providing
US7627085B2 (en) * 2007-04-11 2009-12-01 Searete Llc Compton scattered X-ray depth visualization, imaging, or information provider
US20080253522A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Tool associated with compton scattered X-ray visualization, imaging, or information provider
US8041006B2 (en) * 2007-04-11 2011-10-18 The Invention Science Fund I Llc Aspects of compton scattered X-ray visualization, imaging, or information providing
US20080253525A1 (en) * 2007-04-11 2008-10-16 Boyden Edward S Compton scattered x-ray visualizing, imaging, or information providing of at least some dissimilar matter
US8837677B2 (en) * 2007-04-11 2014-09-16 The Invention Science Fund I Llc Method and system for compton scattered X-ray depth visualization, imaging, or information provider
US20080253527A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Limiting compton scattered x-ray visualizing, imaging, or information providing at particular regions
US7593509B2 (en) * 2007-09-27 2009-09-22 Varian Medical Systems, Inc. Analytical x-ray tube for close coupled sample analysis
GB2460089A (en) * 2008-05-16 2009-11-18 Elekta Ab Coincident treatment and imaging source
US8204174B2 (en) * 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
US8315358B2 (en) * 2009-06-04 2012-11-20 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
US7972062B2 (en) * 2009-07-16 2011-07-05 Edax, Inc. Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis
DE102010007777A1 (de) * 2010-02-12 2011-08-18 Carl Zeiss NTS GmbH, 73447 Teilchenstrahlsystem
JP6096419B2 (ja) * 2012-04-12 2017-03-15 株式会社堀場製作所 Ｘ線検出装置
JP6096418B2 (ja) * 2012-04-12 2017-03-15 株式会社堀場製作所 Ｘ線検出装置
GB2517671A (en) * 2013-03-15 2015-03-04 Nikon Metrology Nv X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target and rotary vacuum seal
CN104034741B (zh) * 2014-06-10 2016-10-05 深圳大学 用于x射线光栅微分相衬成像的x射线源
EP3312868A1 (en) * 2016-10-21 2018-04-25 Excillum AB Structured x-ray target
KR20210028608A (ko) * 2018-07-04 2021-03-12 가부시키가이샤 리가쿠 형광 x선 분석 장치
CN114127534A (zh) * 2019-07-08 2022-03-01 赛默科技便携式分析仪器有限公司 用于检测样品中的元素的装置和方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2963585A (en) * 1955-07-21 1960-12-06 Daystrom Inc Non-contacting thickness gauges
US2925497A (en) * 1956-08-09 1960-02-16 Philips Corp Fluorescence analysis
US3114832A (en) * 1960-07-28 1963-12-17 Radiation Counter Lab Inc X-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity
US3671744A (en) * 1970-10-05 1972-06-20 Minnesota Mining & Mfg Digital differential emission x-ray gauge

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2429425A1 (fr) * 1978-06-21 1980-01-18 Baecklund Nils Johannes Procede et appareil de mesure de la teneur ou valeur d'un element donne au moyen d'un rayonnement de rayons x
EP0014580A1 (en) * 1979-02-09 1980-08-20 Martin Marietta Corporation Element analysis unit
FR2454619A1 (fr) * 1979-04-20 1980-11-14 Kernforschungsz Karlsruhe Procede et dispositif de mesure continue de teneurs en elements
FR2548371A1 (fr) * 1983-06-28 1985-01-04 Enso Gutzeit Oy Procede de mesure de la quantite de revetement en silicium du papier ou du carton
FR2555887A1 (fr) * 1983-12-06 1985-06-07 Thomson Cgr Installation de radiodiagnostic pour examens stereoscopiques ou conventionnels
EP0144272A1 (fr) * 1983-12-06 1985-06-12 Thomson-Cgr Installation de radiodiagnostic pour examens stéréoscopiques ou conventionnels
FR2565140A1 (fr) * 1984-05-23 1985-12-06 Inst Tekh Kibernet An Brus Dispositif planetaire de distribution de fil metallique
EP0461776A2 (en) * 1990-05-30 1991-12-18 Hitachi, Ltd. X-ray analysis apparatus, especially computer tomography apparatus
EP0461776A3 (en) * 1990-05-30 1992-04-08 Hitachi, Ltd. X-ray analysis apparatus, especially computer tomography apparatus and x-ray target and collimator therefor

Also Published As

Publication number Publication date
US3925660A (en) 1975-12-09
GB1436873A (en) 1976-05-26
GB1436872A (en) 1976-05-26
NL7306391A (xx) 1973-11-12
DE2323610A1 (de) 1973-11-22
GB1436871A (en) 1976-05-26
CA1021072A (en) 1977-11-15

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Legal Events

Date Code Title Description
ST Notification of lapse