FR2156511A1 - Semiconductor doping - process - by ion bombardment of dopant coating on semiconductor wafer - Google Patents

Semiconductor doping - process - by ion bombardment of dopant coating on semiconductor wafer

Info

Publication number
FR2156511A1
FR2156511A1 FR7147655A FR7147655A FR2156511A1 FR 2156511 A1 FR2156511 A1 FR 2156511A1 FR 7147655 A FR7147655 A FR 7147655A FR 7147655 A FR7147655 A FR 7147655A FR 2156511 A1 FR2156511 A1 FR 2156511A1
Authority
FR
France
Prior art keywords
semiconductor
ion bombardment
semiconductor wafer
doping
dopant coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7147655A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATOMIC ENERGY RESEARCH
Original Assignee
ATOMIC ENERGY RESEARCH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATOMIC ENERGY RESEARCH filed Critical ATOMIC ENERGY RESEARCH
Publication of FR2156511A1 publication Critical patent/FR2156511A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/02—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion materials in the solid state
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
    • H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
FR7147655A 1971-10-13 1971-12-30 Semiconductor doping - process - by ion bombardment of dopant coating on semiconductor wafer Withdrawn FR2156511A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR710001478 1971-10-13

Publications (1)

Publication Number Publication Date
FR2156511A1 true FR2156511A1 (en) 1973-06-01

Family

ID=19198621

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7147655A Withdrawn FR2156511A1 (en) 1971-10-13 1971-12-30 Semiconductor doping - process - by ion bombardment of dopant coating on semiconductor wafer

Country Status (2)

Country Link
DE (1) DE2165641A1 (fr)
FR (1) FR2156511A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108242392A (zh) * 2016-12-26 2018-07-03 东京毅力科创株式会社 基板及其处理方法、装置、系统及控制装置、制造方法
CN110491789A (zh) * 2018-05-14 2019-11-22 东京毅力科创株式会社 基片处理方法、基片处理装置和基片处理系统

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108242392A (zh) * 2016-12-26 2018-07-03 东京毅力科创株式会社 基板及其处理方法、装置、系统及控制装置、制造方法
CN108242392B (zh) * 2016-12-26 2023-12-22 东京毅力科创株式会社 基板及其处理方法、装置、系统及控制装置、制造方法
CN110491789A (zh) * 2018-05-14 2019-11-22 东京毅力科创株式会社 基片处理方法、基片处理装置和基片处理系统
CN110491789B (zh) * 2018-05-14 2024-04-19 东京毅力科创株式会社 基片处理方法、基片处理装置和基片处理系统

Also Published As

Publication number Publication date
DE2165641A1 (de) 1973-04-26

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Legal Events

Date Code Title Description
ST Notification of lapse