FR2130141B1 - - Google Patents
Info
- Publication number
- FR2130141B1 FR2130141B1 FR7208209A FR7208209A FR2130141B1 FR 2130141 B1 FR2130141 B1 FR 2130141B1 FR 7208209 A FR7208209 A FR 7208209A FR 7208209 A FR7208209 A FR 7208209A FR 2130141 B1 FR2130141 B1 FR 2130141B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1757871U JPS5120680Y2 (ja) | 1971-03-16 | 1971-03-16 | |
JP10057771U JPS5127716Y2 (ja) | 1971-10-29 | 1971-10-29 | |
JP8740871A JPS5116252B2 (ja) | 1971-11-02 | 1971-11-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2130141A1 FR2130141A1 (ja) | 1972-11-03 |
FR2130141B1 true FR2130141B1 (ja) | 1976-06-11 |
Family
ID=27281891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7208209A Expired FR2130141B1 (ja) | 1971-03-16 | 1972-03-09 |
Country Status (4)
Country | Link |
---|---|
US (1) | US3761709A (ja) |
DE (1) | DE2211423C3 (ja) |
FR (1) | FR2130141B1 (ja) |
GB (1) | GB1391336A (ja) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3952203A (en) * | 1972-07-21 | 1976-04-20 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Object adjustment device for a charged particle beam apparatus |
US3858049A (en) * | 1973-09-17 | 1974-12-31 | Etec Corp | Method and apparatus for sem specimen coating and transfer |
US3885158A (en) * | 1973-10-23 | 1975-05-20 | Harris Corp | Specimen block and specimen block holder |
US3980885A (en) * | 1974-09-06 | 1976-09-14 | Vincent William Steward | Diagnosis by proton bombardment |
US3984683A (en) * | 1975-05-27 | 1976-10-05 | Rca Corporation | Apparatus and method for analyzing biological cells for malignancy |
JPS5478076A (en) * | 1977-12-05 | 1979-06-21 | Hitachi Ltd | Frozen sample observation device of scanning electron microscope and similar unit |
DE2906153C2 (de) * | 1979-02-17 | 1984-10-31 | C. Reichert Optische Werke Ag, Wien | Kühlkammer zur Aufnahme von zu bearbeitenden Objekten, insbesondere biologischen Objekten |
JPS56121151U (ja) * | 1980-02-15 | 1981-09-16 | ||
JPS6285840A (ja) * | 1985-10-11 | 1987-04-20 | Kureha Chem Ind Co Ltd | 走査型電子顕微鏡を用いた試料処理方法および装置 |
JPH0668962B2 (ja) * | 1987-12-21 | 1994-08-31 | 株式会社東芝 | 真空装置及びそれを用いてプロセスを行う方法 |
US4916314A (en) * | 1988-09-23 | 1990-04-10 | Amoco Corporation | Method and apparatus for analyzing components of selected fluid inclusions |
JPH0374036A (ja) * | 1989-08-11 | 1991-03-28 | Jeol Ltd | 電子顕微鏡における試料交換装置 |
DE4041029C1 (en) * | 1990-12-20 | 1992-02-06 | Siemens Nixdorf Informationssysteme Ag, 4790 Paderborn, De | Component cooler for vacuum chamber - has stamper-like heat sink inserted in sealed opening and directly contacting base of component |
US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
JP2000505944A (ja) * | 1996-12-23 | 2000-05-16 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 低温試料ホルダを含む粒子光学装置 |
NL1021376C1 (nl) * | 2002-09-02 | 2004-03-03 | Fei Co | Werkwijze voor het verkrijgen van een deeltjes-optische afbeelding van een sample in een deeltjes-optisch toestel. |
CN101461026B (zh) * | 2006-06-07 | 2012-01-18 | Fei公司 | 与包含真空室的装置一起使用的滑动轴承 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2417213A (en) * | 1944-12-28 | 1947-03-11 | Rca Corp | Device for indirect heating of materials |
US2826701A (en) * | 1954-09-01 | 1958-03-11 | Gen Electric | Low temperature chamber for electronoptics instruments |
FR1520418A (fr) * | 1965-11-25 | 1968-04-12 | Balzers Patent Beteilig Ag | Microscope à émission électronique |
US3483373A (en) * | 1966-07-28 | 1969-12-09 | Siemens Ag | Airlock assembly for corpuscular ray devices |
US3374349A (en) * | 1966-11-14 | 1968-03-19 | Victor G. Macres | Electron probe having a specific shortfocal length magnetic lens and light microscope |
-
1972
- 1972-03-07 US US00232405A patent/US3761709A/en not_active Expired - Lifetime
- 1972-03-09 FR FR7208209A patent/FR2130141B1/fr not_active Expired
- 1972-03-09 DE DE2211423A patent/DE2211423C3/de not_active Expired
- 1972-03-14 GB GB1190472A patent/GB1391336A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE2211423A1 (de) | 1972-09-21 |
US3761709A (en) | 1973-09-25 |
DE2211423C3 (de) | 1979-11-08 |
FR2130141A1 (ja) | 1972-11-03 |
GB1391336A (en) | 1975-04-23 |
DE2211423B2 (de) | 1979-03-15 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |