FI982171A0 - Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi - Google Patents

Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi

Info

Publication number
FI982171A0
FI982171A0 FI982171A FI982171A FI982171A0 FI 982171 A0 FI982171 A0 FI 982171A0 FI 982171 A FI982171 A FI 982171A FI 982171 A FI982171 A FI 982171A FI 982171 A0 FI982171 A0 FI 982171A0
Authority
FI
Finland
Prior art keywords
measuring
amount
silicone coating
moving substrate
substrate
Prior art date
Application number
FI982171A
Other languages
English (en)
Swedish (sv)
Other versions
FI110638B (fi
FI982171A (fi
Inventor
Markku Maentylae
Original Assignee
Valmet Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valmet Automation Inc filed Critical Valmet Automation Inc
Priority to FI982171A priority Critical patent/FI110638B/fi
Publication of FI982171A0 publication Critical patent/FI982171A0/fi
Priority to US09/806,068 priority patent/US6627043B1/en
Priority to EP99947501A priority patent/EP1119762A1/en
Priority to PCT/FI1999/000824 priority patent/WO2000020842A1/fi
Priority to AU60919/99A priority patent/AU6091999A/en
Priority to CA002346480A priority patent/CA2346480C/en
Publication of FI982171A publication Critical patent/FI982171A/fi
Application granted granted Critical
Publication of FI110638B publication Critical patent/FI110638B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Paper (AREA)
FI982171A 1998-10-06 1998-10-06 Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi FI110638B (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI982171A FI110638B (fi) 1998-10-06 1998-10-06 Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi
US09/806,068 US6627043B1 (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
EP99947501A EP1119762A1 (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
PCT/FI1999/000824 WO2000020842A1 (fi) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
AU60919/99A AU6091999A (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web
CA002346480A CA2346480C (en) 1998-10-06 1999-10-05 Measuring amount of silicone coating on paper web

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI982171 1998-10-06
FI982171A FI110638B (fi) 1998-10-06 1998-10-06 Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi

Publications (3)

Publication Number Publication Date
FI982171A0 true FI982171A0 (fi) 1998-10-06
FI982171A FI982171A (fi) 2000-04-07
FI110638B FI110638B (fi) 2003-02-28

Family

ID=8552656

Family Applications (1)

Application Number Title Priority Date Filing Date
FI982171A FI110638B (fi) 1998-10-06 1998-10-06 Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi

Country Status (6)

Country Link
US (1) US6627043B1 (fi)
EP (1) EP1119762A1 (fi)
AU (1) AU6091999A (fi)
CA (1) CA2346480C (fi)
FI (1) FI110638B (fi)
WO (1) WO2000020842A1 (fi)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025329C5 (de) * 2005-05-31 2009-10-01 Andritz Küsters Gmbh Verfahren und Vorrichtung zur qualitativen und quantitativen Flächen-Detektion in der Ausrüstung von Bahnwaren
US7482590B2 (en) * 2006-12-20 2009-01-27 Voith Patent Gmbh Method for determining the coating quantity on a material web
US7609366B2 (en) * 2007-11-16 2009-10-27 Honeywell International Inc. Material measurement system for obtaining coincident properties and related method
US9029776B2 (en) * 2008-09-05 2015-05-12 Metso Automation Oy Determining the amount of starch
DE102008055584B3 (de) 2008-12-23 2010-04-22 Gunther Prof. Dr.-Ing. Krieg Verfahren und Vorrichtung zum Beschichten von bedruckten Papierbahnen
ITUB20156830A1 (it) * 2015-11-23 2017-05-23 Iannone Antonio Sistema di verifica della stampa indelebile del codice di tracciabilita sul bollino farmaceutico.
FI128094B (fi) * 2016-07-13 2019-09-13 Valmet Automation Oy Mittausmenetelmä, mittausjärjestely ja mittalaite
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3631526A (en) 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US4818576A (en) * 1980-02-20 1989-04-04 Flexcon Co., Inc. Silicone releases, laminates and methods
FI68322C (fi) 1983-06-28 1985-08-12 Enso Gutzeit Oy Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong
JPS60184218A (ja) * 1984-03-01 1985-09-19 Fujikura Ltd 光フアイバ心線
US4631408A (en) 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
DE3638932A1 (de) 1986-11-14 1988-05-26 Kaemmerer Gmbh Verfahren zur messung von beschichtungsmengen, insbesondere von silikon-beschichtungen auf papier oder kunststoffolie
US4957770A (en) * 1989-01-27 1990-09-18 Measurex Corporation Coating weight measuring and control apparatus and method
DE19601923C1 (de) 1996-01-12 1997-07-24 Inst Chemo Biosensorik Verfahren und Vorrichtung zum Erkennen organischer Substanzen
JP3187315B2 (ja) 1996-03-04 2001-07-11 帝人株式会社 離型フイルム
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
FI108811B (fi) 1998-02-12 2002-03-28 Metso Paper Automation Oy Menetelmä ja laite liikkuvalla alustalla olevan päällysteen määrän mittaamiseksi
US6179918B1 (en) * 1998-11-20 2001-01-30 Honeywell International Inc. Silicone coat weight measuring and control apparatus

Also Published As

Publication number Publication date
CA2346480C (en) 2009-02-03
US6627043B1 (en) 2003-09-30
FI110638B (fi) 2003-02-28
WO2000020842A1 (fi) 2000-04-13
FI982171A (fi) 2000-04-07
AU6091999A (en) 2000-04-26
EP1119762A1 (en) 2001-08-01
CA2346480A1 (en) 2000-04-13

Similar Documents

Publication Publication Date Title
DE69839066D1 (de) Vorrichtung zur Substratbeschichtung
FI972639A (fi) Menetelmä ja laite alustakerroksen lakkaamista tai päällystystä varten
NO953298D0 (no) Belagt substrat og fremgangsmåte for dannelse derav
HK1023398A1 (en) Method and apparatus for measuring the thickness of a coated material.
BR9809200B1 (pt) aparelho e método para medir a temperatura de um substrato móvel.
NO20006700D0 (no) Innretning og fremgangsmåte for laserbelegging
DE60028709D1 (de) Verfahren und Vorrichtung für Schichtdickenmessung und Substratverarbeitung
EE200000774A (et) Seade ja meetod elektronseadmete talitlusparameetri reguleerimiseks
DE69911927D1 (de) Verfahren und vorrichtung zum messen der substrattemperatur
FI981802A0 (fi) Ohutkalvo-elektroluminesenssi-laite ja menetelmä sen valmistamiseksi
FI20000282A (fi) Menetelmä ja laite päällysteen mittaamiseksi
NO20022268D0 (no) Beleggingsmiddel og fremgangsmåte for belegging av overflaten av et substrat
DE69904676D1 (de) Beschichtungsverfahren und -vorrichtung
EE9900001A (et) Seade ja meetod anuma seina paksuse mõõtmiseks
FI982171A0 (fi) Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi
GB2292751B (en) Optical device and method for coating an optical substrate
FI980323A (fi) Menetelmä ja laite liikkuvalla alustalla olevan päällysteen määrän mit taamiseksi
DK1049382T3 (da) Fremgangsmåde og anordning til overtrækning af artikler
FI20020732A (fi) Menetelmä ja laitteisto paperirainalla olevan päällysteen määrän mittaamiseksi
BR0016114B1 (pt) mÉtodo e aparelho de revestimento de uma superfÍcie de substrato em movimento.
FI981517A0 (fi) Menetelmä ja laitteisto liikkuvan rainan kireyden mittaamiseksi
FI19992652A (fi) Menetelmä ja sovitelma päällystekerroksen profiilin määrittämiseksi
FI974498A (fi) Laitteisto ja menetelmä kapppaleiden pinnoittamiseksi
DE59904804D1 (de) Beschichtungs-Verfahren und -Vorrichtung
FI981296A0 (fi) Menetelmä ja laite rakennekosteuden mittaamiseksi

Legal Events

Date Code Title Description
MA Patent expired