BR9809200B1 - aparelho e método para medir a temperatura de um substrato móvel. - Google Patents
aparelho e método para medir a temperatura de um substrato móvel.Info
- Publication number
- BR9809200B1 BR9809200B1 BRPI9809200-6A BR9809200A BR9809200B1 BR 9809200 B1 BR9809200 B1 BR 9809200B1 BR 9809200 A BR9809200 A BR 9809200A BR 9809200 B1 BR9809200 B1 BR 9809200B1
- Authority
- BR
- Brazil
- Prior art keywords
- measuring
- temperature
- moving substrate
- substrate
- moving
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/20—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using thermoluminescent materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Radiation Pyrometers (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Luminescent Compositions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/850,239 US6123455A (en) | 1997-05-02 | 1997-05-02 | Phosphor thermometry system |
PCT/US1998/004868 WO1998050767A1 (en) | 1997-05-02 | 1998-03-16 | Phosphor thermometry system |
Publications (2)
Publication Number | Publication Date |
---|---|
BR9809200A BR9809200A (pt) | 2000-06-27 |
BR9809200B1 true BR9809200B1 (pt) | 2010-05-18 |
Family
ID=25307626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI9809200-6A BR9809200B1 (pt) | 1997-05-02 | 1998-03-16 | aparelho e método para medir a temperatura de um substrato móvel. |
Country Status (8)
Country | Link |
---|---|
US (1) | US6123455A (pt) |
EP (1) | EP0979395A1 (pt) |
JP (1) | JP2001525926A (pt) |
KR (1) | KR100508712B1 (pt) |
AU (1) | AU736752C (pt) |
BR (1) | BR9809200B1 (pt) |
CA (1) | CA2287384C (pt) |
WO (1) | WO1998050767A1 (pt) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6575620B1 (en) * | 2000-02-15 | 2003-06-10 | The United States Of America As Represented By The Secretary Of The Air Force | Method and device for visually measuring structural fatigue using a temperature sensitive coating |
US20020110180A1 (en) * | 2001-02-09 | 2002-08-15 | Barney Alfred A. | Temperature-sensing composition |
US6648506B2 (en) | 2001-09-07 | 2003-11-18 | Board Of Trustees Of Michigan State University | Fluorescence emission ratio imaging thermography for use in heat transfer analysis |
EP1338878A3 (de) * | 2002-02-21 | 2003-09-03 | Mahlo GmbH & Co. KG | Verfahren zur Messung der Umgebungstemperatur sowie Temperaturmessanordnung |
US20060274813A9 (en) * | 2002-06-06 | 2006-12-07 | Wei Chen | Nanoparticle thermometry and pressure sensors |
US20070189359A1 (en) * | 2002-06-12 | 2007-08-16 | Wei Chen | Nanoparticle thermometry and pressure sensors |
US20050063450A1 (en) * | 2003-09-24 | 2005-03-24 | Siemens Aktiengesellschaft | Optical monitoring of thermal barrier coatings |
GB0323372D0 (en) * | 2003-10-07 | 2003-11-05 | Rolls Royce Plc | An apparatus for measuring temperature using luminescence thermometry |
US20060176930A1 (en) * | 2005-02-07 | 2006-08-10 | Yoo Jung Y | Method for measuring temperature in microscale |
US20060291532A1 (en) * | 2005-06-27 | 2006-12-28 | Intel Corporation | Method and apparatus for measurement of skin temperature |
US8072587B2 (en) | 2006-01-20 | 2011-12-06 | Newport Corporation | Machine and method for measuring a characteristic of an optical signal |
JP5001119B2 (ja) * | 2007-11-22 | 2012-08-15 | アズビル株式会社 | 温度センサプローブ、及びその製造方法 |
JP4972707B2 (ja) * | 2008-07-08 | 2012-07-11 | 株式会社日立製作所 | 光計測装置 |
EP2485636A4 (en) * | 2009-10-09 | 2013-07-03 | Univ Maryland | NON-INVASIVE DETECTION SYSTEM OF REMOTE PARAMETER AND ASSOCIATED METHOD |
DE102010006326A1 (de) * | 2010-01-29 | 2011-08-04 | Asml Netherlands B.V. | Anordnung zur Verwendung in einer Projektionsbelichtungsanlage für die Mikrolithographie mit einem reflektiven optischen Element |
DE102010053723A1 (de) * | 2010-11-30 | 2012-05-31 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur zerstörungsfreien Überwachung oder den Nachweis der Durchführung einer Behandlung sowie ein System zur Durchführung des Verfahrens |
US9560974B2 (en) | 2011-06-29 | 2017-02-07 | University Of Maryland Baltimore County | Luminescence based noninvasive remote parameter sensor and sensing method |
US20130171903A1 (en) * | 2012-01-03 | 2013-07-04 | Andrew Zsinko | Electroluminescent devices and their manufacture |
WO2016012269A1 (en) * | 2014-07-23 | 2016-01-28 | Koninklijke Philips N.V. | Characterization apparatus for characterizing scintillator material |
US9642212B1 (en) | 2015-06-11 | 2017-05-02 | Darkside Scientific, Llc | Electroluminescent system and process |
AU2017302241B2 (en) | 2016-07-28 | 2022-06-23 | Darkside Scientific, Inc. | Electroluminescent system and process |
US11047747B2 (en) * | 2017-03-27 | 2021-06-29 | Firouzeh Sabri | Light weight flexible temperature sensor kit |
US20200398305A1 (en) * | 2019-06-18 | 2020-12-24 | National Technology & Engineering Solutions Of Sandia, Llc | Aerosol Deposition of Thermographic Phosphor Coatings |
US11718917B2 (en) * | 2019-11-27 | 2023-08-08 | University Of Central Florida Research Foundation, Inc. | Phosphor thermometry device for synchronized acquisition of luminescence lifetime decay and intensity on thermal barrier coatings |
US11346006B2 (en) | 2019-11-27 | 2022-05-31 | University Of Central Florida Research Foundation, Inc. | Rare-earth doped thermal barrier coating bond coat for thermally grown oxide luminescence sensing |
US10793772B1 (en) | 2020-03-13 | 2020-10-06 | Accelovant Technologies Corporation | Monolithic phosphor composite for sensing systems |
US11359976B2 (en) | 2020-10-23 | 2022-06-14 | Accelovant Technologies Corporation | Multipoint surface temperature measurement system and method thereof |
CA3137183C (en) | 2020-11-05 | 2024-02-20 | Accelovant Technologies Corporation | Optoelectronic transducer module for thermographic temperature measurements |
KR102711811B1 (ko) | 2023-08-04 | 2024-09-30 | 박재식 | 품질 및 생산성 향상 구성을 포함하는 소성로 |
Family Cites Families (37)
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DE208414C (pt) * | ||||
US31832A (en) * | 1861-03-26 | Machineey foe making elastic shieeed goods | ||
GB675043A (en) * | 1949-02-11 | 1952-07-02 | Eastman Kodak Co | Measurement of temperature distribution on a solid surface |
US2551650A (en) * | 1949-02-11 | 1951-05-08 | Eastman Kodak Co | Measurement of temperature distribution on the surface of solid bodies |
GB1270928A (en) * | 1968-04-18 | 1972-04-19 | Hawker Siddeley Dynamics Ltd | Improved temperature sensing device |
US3752404A (en) * | 1971-11-08 | 1973-08-14 | Curtis Helene Ind Inc | Compressed air spray apparatus |
US4075493A (en) * | 1976-12-16 | 1978-02-21 | Ronald Alves | Optical temperature measurement technique utilizing phosphors |
US4215275A (en) * | 1977-12-07 | 1980-07-29 | Luxtron Corporation | Optical temperature measurement technique utilizing phosphors |
US4223226A (en) * | 1978-07-26 | 1980-09-16 | Rockwell International Corporation | Fiber optic temperature sensor |
DE3063621D1 (en) * | 1979-11-21 | 1983-07-07 | Gen Electric Co Plc | Optical systems for sensing and measuring physical quantities |
SE418904B (sv) * | 1979-12-28 | 1981-06-29 | Asea Ab | Fiberoptiskt metdon for metning av fysikaliska storheter sasom lege, hastighet, acceleration, kraft, tryck, tojning och temperatur |
US4459044A (en) * | 1981-02-09 | 1984-07-10 | Luxtron Corporation | Optical system for an instrument to detect the temperature of an optical fiber phosphor probe |
US4374328A (en) * | 1981-04-27 | 1983-02-15 | Gould Inc. | Photoluminescent indicator |
US4433003A (en) * | 1981-10-13 | 1984-02-21 | Energy Innovations, Inc. | Electrogasdynamic coating system |
US4819658A (en) * | 1982-02-11 | 1989-04-11 | American Telephone And Telegraph Company, At&T Bell Laboratories | Method and apparatus for measuring the temperature profile of a surface |
US4455741A (en) * | 1982-02-11 | 1984-06-26 | At&T Bell Laboratories | Fabrication of solid state electronic devices using fluorescent imaging of surface temperature profiles |
US5222810A (en) * | 1982-08-06 | 1993-06-29 | Kleinerman Marcos Y | Fiber optic systems for sensing temperature and other physical variables |
SE448186B (sv) * | 1983-04-12 | 1987-01-26 | Asea Ab | Fiberoptisk givare |
JPS6061634A (ja) * | 1983-09-14 | 1985-04-09 | Omron Tateisi Electronics Co | 温度測定装置 |
US4652143A (en) * | 1984-11-29 | 1987-03-24 | Luxtron Corporation | Optical temperature measurement techniques |
US4789992A (en) * | 1985-10-15 | 1988-12-06 | Luxtron Corporation | Optical temperature measurement techniques |
GB8621077D0 (en) * | 1986-09-01 | 1986-10-08 | Gen Electric Co Plc | Temperature sensing system |
US4759033A (en) * | 1987-07-01 | 1988-07-19 | Weyerhaeuser Company | Temperature measurement of hot mineral product by induced fluorescence |
US4885633A (en) * | 1988-06-13 | 1989-12-05 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Quantitative surface temperature measurement using two-color thermographic phosphors and video equipment |
US5063297A (en) * | 1989-06-08 | 1991-11-05 | Minnesota Mining And Manufacturing Company | Apparatus for detecting fluorescence of a luminescent material |
US5315993A (en) * | 1990-02-16 | 1994-05-31 | The Boc Group, Inc. | Luminescence monitoring with modulation frequency multiplexing |
US5140609A (en) * | 1990-10-18 | 1992-08-18 | Rosemount Inc. | Trd temperature sensor |
US5211480A (en) * | 1990-10-18 | 1993-05-18 | Rosemount Inc. | TRD temperature sensor and electronics |
US5255980A (en) * | 1990-10-18 | 1993-10-26 | Rosemount Inc. | Black body TRD temperature sensor |
US5173121A (en) * | 1990-11-09 | 1992-12-22 | The Board Of Trustees Of The University Of Little Rock | Apparatus for the deposition and film formation of silicon on substrates |
US5107445A (en) * | 1990-12-04 | 1992-04-21 | Luxtron Corporation | Modular luminescence-based measuring system using fast digital signal processing |
US5800867A (en) * | 1992-08-13 | 1998-09-01 | Nordson Corporation | Deflection control of liquid or powder stream during dispensing |
US5304809A (en) * | 1992-09-15 | 1994-04-19 | Luxtron Corporation | Luminescent decay time measurements by use of a CCD camera |
US5470155A (en) * | 1993-06-11 | 1995-11-28 | Luxtron Corporation | Apparatus and method for measuring temperatures at a plurality of locations using luminescent-type temperature sensors which are excited in a time sequence |
DE4343076C2 (de) * | 1993-12-16 | 1997-04-03 | Phototherm Dr Petry Gmbh | Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes |
US5882404A (en) * | 1995-02-25 | 1999-03-16 | Gummer; Edward Christopher | Powder coating apparatus |
US5858466A (en) * | 1996-06-24 | 1999-01-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Photoresist supply system with air venting |
-
1997
- 1997-05-02 US US08/850,239 patent/US6123455A/en not_active Expired - Lifetime
-
1998
- 1998-03-16 WO PCT/US1998/004868 patent/WO1998050767A1/en not_active Application Discontinuation
- 1998-03-16 AU AU64608/98A patent/AU736752C/en not_active Ceased
- 1998-03-16 KR KR10-1999-7010127A patent/KR100508712B1/ko not_active IP Right Cessation
- 1998-03-16 CA CA002287384A patent/CA2287384C/en not_active Expired - Fee Related
- 1998-03-16 BR BRPI9809200-6A patent/BR9809200B1/pt not_active IP Right Cessation
- 1998-03-16 EP EP98910347A patent/EP0979395A1/en not_active Withdrawn
- 1998-03-16 JP JP54805398A patent/JP2001525926A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0979395A1 (en) | 2000-02-16 |
AU6460898A (en) | 1998-11-27 |
KR20010012178A (ko) | 2001-02-15 |
JP2001525926A (ja) | 2001-12-11 |
AU736752B2 (en) | 2001-08-02 |
CA2287384C (en) | 2009-10-13 |
KR100508712B1 (ko) | 2005-08-17 |
AU736752C (en) | 2002-10-10 |
BR9809200A (pt) | 2000-06-27 |
US6123455A (en) | 2000-09-26 |
WO1998050767A1 (en) | 1998-11-12 |
CA2287384A1 (en) | 1998-11-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06A | Notification to applicant to reply to the report for non-patentability or inadequacy of the application [chapter 6.1 patent gazette] | ||
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted |
Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 18/05/2010, OBSERVADAS AS CONDICOES LEGAIS. |
|
B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE A 17A ANUIDADE. |
|
B24J | Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12) |
Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2308 DE 31-03-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |