FI943815A0 - Röntgensäteillä fluoresoiva tutkimuslaite - Google Patents
Röntgensäteillä fluoresoiva tutkimuslaiteInfo
- Publication number
- FI943815A0 FI943815A0 FI943815A FI943815A FI943815A0 FI 943815 A0 FI943815 A0 FI 943815A0 FI 943815 A FI943815 A FI 943815A FI 943815 A FI943815 A FI 943815A FI 943815 A0 FI943815 A0 FI 943815A0
- Authority
- FI
- Finland
- Prior art keywords
- examination device
- rays fluorescent
- fluorescent examination
- rays
- fluorescent
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB939317371A GB9317371D0 (en) | 1993-08-20 | 1993-08-20 | X-ray fluorescence inspection apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FI943815A0 true FI943815A0 (fi) | 1994-08-19 |
| FI943815A FI943815A (fi) | 1995-02-21 |
Family
ID=10740804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI943815A FI943815A (fi) | 1993-08-20 | 1994-08-19 | Röntgensäteillä fluoresoiva tutkimuslaite |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5528647A (fi) |
| EP (1) | EP0639766A1 (fi) |
| JP (1) | JPH0763713A (fi) |
| FI (1) | FI943815A (fi) |
| GB (1) | GB9317371D0 (fi) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI102697B (fi) * | 1997-06-26 | 1999-01-29 | Metorex Internat Oy | Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki |
| DE19820321B4 (de) * | 1998-05-07 | 2004-09-16 | Bruker Axs Gmbh | Kompaktes Röntgenspektrometer |
| DE19946679C2 (de) * | 1999-09-29 | 2002-04-04 | Knorr Bremse Systeme | Vorrichtung zur Regelung eines Luftdruckes in Eisenbahnbremssystemen sowie Druckregelventil hierfür |
| DE10011115A1 (de) * | 2000-03-09 | 2001-09-27 | Merck Patent Gmbh | Verfahren zur Röntgenfluoreszenzanalyse |
| JP3525188B2 (ja) * | 2001-06-06 | 2004-05-10 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| NL1029645C2 (nl) * | 2005-07-29 | 2007-01-30 | Panalytical Bv | Inrichting en werkwijze voor het uitvoeren van röntgenanalyse. |
| US7700820B2 (en) * | 2006-11-30 | 2010-04-20 | Kimberly-Clark Worldwide, Inc. | Process for controlling the quality of an absorbent article including a wetness sensing system |
| JP2007132955A (ja) * | 2007-02-21 | 2007-05-31 | Jeol Ltd | Ｘ線分析装置 |
| JP5709721B2 (ja) * | 2011-02-16 | 2015-04-30 | 新日本非破壊検査株式会社 | ベルトコンベアのベルトの検査装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3079499A (en) * | 1959-06-19 | 1963-02-26 | Hilger & Watts Ltd | X-ray beam intensity responsive sequential spectrometer |
| US3920984A (en) * | 1974-04-08 | 1975-11-18 | Machlett Lab Inc | X-ray energy analyzer |
| US4189645A (en) * | 1978-06-28 | 1980-02-19 | Advanced Instrument Development, Inc. | X-ray measuring system |
| GB2089499A (en) * | 1980-12-15 | 1982-06-23 | Ramsey Eng Co | X-ray Radiation Analyser |
| US4393512A (en) * | 1981-07-07 | 1983-07-12 | The United States Of America As Represented By The United States Department Of Energy | Hyper-filter-fluorescer spectrometer for x-rays above 120 keV |
| JPH0715442B2 (ja) * | 1988-01-28 | 1995-02-22 | エックスライド株式会社 | Ｘ線検査方法及び装置 |
-
1993
- 1993-08-20 GB GB939317371A patent/GB9317371D0/en active Pending
-
1994
- 1994-07-05 EP EP94304943A patent/EP0639766A1/en not_active Ceased
- 1994-07-20 US US08/277,768 patent/US5528647A/en not_active Expired - Lifetime
- 1994-07-27 JP JP6175004A patent/JPH0763713A/ja active Pending
- 1994-08-19 FI FI943815A patent/FI943815A/fi unknown
Also Published As
| Publication number | Publication date |
|---|---|
| FI943815A (fi) | 1995-02-21 |
| GB9317371D0 (en) | 1993-10-06 |
| EP0639766A1 (en) | 1995-02-22 |
| US5528647A (en) | 1996-06-18 |
| JPH0763713A (ja) | 1995-03-10 |
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