FI69370C - Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning - Google Patents

Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning Download PDF

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Publication number
FI69370C
FI69370C FI812546A FI812546A FI69370C FI 69370 C FI69370 C FI 69370C FI 812546 A FI812546 A FI 812546A FI 812546 A FI812546 A FI 812546A FI 69370 C FI69370 C FI 69370C
Authority
FI
Finland
Prior art keywords
radiation
detector
plastic
band
filter
Prior art date
Application number
FI812546A
Other languages
English (en)
Finnish (fi)
Other versions
FI812546L (fi
FI69370B (fi
Inventor
Sauli Toermaelae
Original Assignee
Topwave Instr Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topwave Instr Oy filed Critical Topwave Instr Oy
Priority to FI812546A priority Critical patent/FI69370C/fi
Priority to US06/407,386 priority patent/US4490612A/en
Priority to DE19823230442 priority patent/DE3230442A1/de
Priority to JP57143176A priority patent/JPS5839931A/ja
Publication of FI812546L publication Critical patent/FI812546L/fi
Publication of FI69370B publication Critical patent/FI69370B/fi
Application granted granted Critical
Publication of FI69370C publication Critical patent/FI69370C/fi
Priority to JP1990095031U priority patent/JPH0348705U/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Radiation Pyrometers (AREA)
FI812546A 1981-08-18 1981-08-18 Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning FI69370C (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI812546A FI69370C (fi) 1981-08-18 1981-08-18 Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning
US06/407,386 US4490612A (en) 1981-08-18 1982-08-12 Method for the measurement of the properties of a plastic film by means of infra-red radiation
DE19823230442 DE3230442A1 (de) 1981-08-18 1982-08-16 Verfahren zur messung der eigenschaften einer kunststoff-folie mittels infrarotstrahlung
JP57143176A JPS5839931A (ja) 1981-08-18 1982-08-18 赤外線を使用してプラスチツクフイルムの特性を測定する方法
JP1990095031U JPH0348705U (ja) 1981-08-18 1990-09-10

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI812546A FI69370C (fi) 1981-08-18 1981-08-18 Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning
FI812546 1981-08-18

Publications (3)

Publication Number Publication Date
FI812546L FI812546L (fi) 1983-02-19
FI69370B FI69370B (fi) 1985-09-30
FI69370C true FI69370C (fi) 1986-01-10

Family

ID=8514637

Family Applications (1)

Application Number Title Priority Date Filing Date
FI812546A FI69370C (fi) 1981-08-18 1981-08-18 Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning

Country Status (4)

Country Link
US (1) US4490612A (ja)
JP (2) JPS5839931A (ja)
DE (1) DE3230442A1 (ja)
FI (1) FI69370C (ja)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
US4634625A (en) * 1984-10-25 1987-01-06 E. I. Du Pont De Nemours And Company New fabrics, yarns and process
US4649711A (en) * 1985-09-03 1987-03-17 Carrier Corporation Apparatus and method for infrared optical electronic qualitative analysis of a fluid independent of the temperature thereof
US4766315A (en) * 1986-07-14 1988-08-23 Accuray Corporation Apparatus and process for measuring physical parameters of sheet material
DE3875209D1 (de) * 1987-08-13 1992-11-12 Siemens Ag Vorrichtung zur identifikation von unterschiedlichen halbleiterscheiben.
US5259716A (en) * 1987-12-16 1993-11-09 Dai Nippon Insatsu Kabushiki Kaisha Container conveyor for conveying a container to an inspecting station
US5139406A (en) * 1987-12-16 1992-08-18 Dai Nippon Insatsu Kabushiki Kaisha Apparatus and system for inspecting wall thickness of synthetic resin containers
US4912332A (en) * 1988-06-03 1990-03-27 Research And Development Institute, Inc. At Montana State University Non-destructive methods for detecting organic deposits and removing them
JPH03292780A (ja) * 1990-04-11 1991-12-24 Fujitsu Ltd 超伝導体の特性評価方法およびこれに用いた超伝導体薄膜の成長方法および装置
US5091647A (en) * 1990-12-24 1992-02-25 Ford Motor Company Method and apparatus for measuring the thickness of a layer on a substrate
DE4109014A1 (de) * 1991-03-20 1992-09-24 Uwe Paetzold Verfahren und vorrichtung zur haertepruefung
DE4133359C2 (de) * 1991-10-09 1997-01-02 Porsche Ag Verfahren zur Messung der Dicke einer auf einer Fahrbahn vorhandenen Wasserschicht und Verwendung einer Vorrichtung hierfür
DE9212406U1 (ja) * 1992-09-15 1992-12-17 Roehm Gmbh, 6100 Darmstadt, De
JP2986072B2 (ja) * 1995-06-16 1999-12-06 インターナショナル・ビジネス・マシーンズ・コーポレイション 膜厚の検査方法
US6620352B1 (en) 2000-07-27 2003-09-16 Ball Corporation Automated material distribution control for stretch blow molded articles
US6863860B1 (en) * 2002-03-26 2005-03-08 Agr International, Inc. Method and apparatus for monitoring wall thickness of blow-molded plastic containers
JP5271908B2 (ja) * 2006-09-01 2013-08-21 エイジーアール インターナショナル，インコーポレイテッド 検査システム、ブロー形成システム、プラスチック容器を検査する方法、及び、プラスチック容器を製造する方法
US10859494B2 (en) * 2018-09-03 2020-12-08 Chongqing Hkc Optoelectronics Technology Co., Ltd. Transmittance measuring method, device and computer readable storage medium
JP6512361B1 (ja) * 2018-11-29 2019-05-15 横河電機株式会社 測定装置、測定方法、および測定プログラム

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3043956A (en) * 1958-09-24 1962-07-10 Franklin Systems Inc Measuring systems using infra-red radiation
US3821550A (en) * 1969-07-18 1974-06-28 Deere & Co Plant thinner having radiant energy plant detecting means
US3737237A (en) * 1971-11-18 1973-06-05 Nasa Monitoring deposition of films
US3825755A (en) * 1972-11-13 1974-07-23 Infra Data Inc Gauge for polymers
JPS49134351A (ja) * 1973-04-25 1974-12-24
US3994586A (en) * 1975-10-30 1976-11-30 Aluminum Company Of America Simultaneous determination of film uniformity and thickness
US4027161A (en) * 1976-04-05 1977-05-31 Industrial Nucleonics Corporation Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation
GB1525291A (en) * 1976-06-11 1978-09-20 Infrared Eng Ltd Apparatus for determining the thickness moisture content or composition of a film or coating
DE2627753C2 (de) * 1976-06-21 1983-09-01 Leybold-Heraeus GmbH, 5000 Köln Anordnung zur Dickenmessung und -steuerung optisch wirksamer Dünnschichten
DE2724919C3 (de) * 1977-06-02 1979-12-06 Paul Lippke Gmbh & Co Kg, 5450 Neuwied Verfahren zum Messen physikalischer Eigenschaften dünner Körper mit HiUe von Ultrarot-Strahlung, z.B. zur Dickenmessung oder Feuchtigkeitsmessung
FI782773A (fi) * 1978-09-11 1980-03-12 G W Sohlberg Oy Foerfarande och anordning foer maetning av vaeggtjockleken hos ett plastfoeremaol

Also Published As

Publication number Publication date
JPH0348705U (ja) 1991-05-10
US4490612A (en) 1984-12-25
JPS5839931A (ja) 1983-03-08
FI812546L (fi) 1983-02-19
DE3230442A1 (de) 1983-03-10
FI69370B (fi) 1985-09-30

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Owner name: TOPWAVE INSTRUMENTS OY