GB1525291A - Apparatus for determining the thickness moisture content or composition of a film or coating - Google Patents

Apparatus for determining the thickness moisture content or composition of a film or coating

Info

Publication number
GB1525291A
GB1525291A GB1060175A GB1060175A GB1525291A GB 1525291 A GB1525291 A GB 1525291A GB 1060175 A GB1060175 A GB 1060175A GB 1060175 A GB1060175 A GB 1060175A GB 1525291 A GB1525291 A GB 1525291A
Authority
GB
United Kingdom
Prior art keywords
filters
signals
sample
peak wavelength
bandwidth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1060175A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NDC Technologies Ltd
Original Assignee
Infrared Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infrared Engineering Ltd filed Critical Infrared Engineering Ltd
Priority to GB1060175A priority Critical patent/GB1525291A/en
Publication of GB1525291A publication Critical patent/GB1525291A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Abstract

1525291 Photo-electric measuring apparatus INFRARED ENG Ltd 11 June 1976 [13 March 1975] 10601/75 Heading G1A In apparatus for measuring a reflection, scattering or transmission characteristic of a sample, in order to define a single effective waveband of variable peak wavelength and/or bandwidth, first and second filters provide beams having overlapping spectral bandwidth characteristics and the effects of the sample on these beams is detected to develop respective signals which are weighted in differing degrees and then combined. Thus with two filters having different peak wavelengths, differing weightings can alter the effective peak wavelength of the combination; two filters of the same peak wavelength and different bandwidths can be used to provide an effective waveband of variable bandwidth. In the particular embodiment, Fig. 1, two pairs of filters are used to define measurement (strongly absorbed by sample) and reference (weakly absorbed) wavelength bands. Light from the filters is sequentially detected and resulting signals demodulated under the control of synchronizing transducer T, to produce signals which are fed to respective adjustable resistors V.R. 1 - VR 4 the weighted signals being combined in pairs and amplified at A 1 , A 2 to provide the measurement and reference signals, the ratio of which is taken and indicated.
GB1060175A 1976-06-11 1976-06-11 Apparatus for determining the thickness moisture content or composition of a film or coating Expired GB1525291A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1060175A GB1525291A (en) 1976-06-11 1976-06-11 Apparatus for determining the thickness moisture content or composition of a film or coating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1060175A GB1525291A (en) 1976-06-11 1976-06-11 Apparatus for determining the thickness moisture content or composition of a film or coating

Publications (1)

Publication Number Publication Date
GB1525291A true GB1525291A (en) 1978-09-20

Family

ID=9970855

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1060175A Expired GB1525291A (en) 1976-06-11 1976-06-11 Apparatus for determining the thickness moisture content or composition of a film or coating

Country Status (1)

Country Link
GB (1) GB1525291A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3230442A1 (en) * 1981-08-18 1983-03-10 Topwave Instruments OY, 00380 Helsinki METHOD FOR MEASURING THE PROPERTIES OF A PLASTIC FILM BY MEANS OF INFRARED RADIATION
GB2365964A (en) * 2000-03-24 2002-02-27 Innogy Ltd Moisture membrane measurement
DE102006010100B4 (en) 2006-03-06 2018-03-15 Robert Bosch Gmbh Apparatus and method for spectroscopic measurement
CN115388755A (en) * 2022-10-27 2022-11-25 中国航空制造技术研究院 Microwave frequency spectrum-based wave-absorbing coating thickness measuring method and device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3230442A1 (en) * 1981-08-18 1983-03-10 Topwave Instruments OY, 00380 Helsinki METHOD FOR MEASURING THE PROPERTIES OF A PLASTIC FILM BY MEANS OF INFRARED RADIATION
GB2365964A (en) * 2000-03-24 2002-02-27 Innogy Ltd Moisture membrane measurement
GB2365964B (en) * 2000-03-24 2002-07-10 Innogy Ltd Membrane moisture measurement
DE102006010100B4 (en) 2006-03-06 2018-03-15 Robert Bosch Gmbh Apparatus and method for spectroscopic measurement
CN115388755A (en) * 2022-10-27 2022-11-25 中国航空制造技术研究院 Microwave frequency spectrum-based wave-absorbing coating thickness measuring method and device

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19940611