FI20096035A - Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi - Google Patents

Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi Download PDF

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Publication number
FI20096035A
FI20096035A FI20096035A FI20096035A FI20096035A FI 20096035 A FI20096035 A FI 20096035A FI 20096035 A FI20096035 A FI 20096035A FI 20096035 A FI20096035 A FI 20096035A FI 20096035 A FI20096035 A FI 20096035A
Authority
FI
Finland
Prior art keywords
measuring
surface properties
measuring instrument
instrument
properties
Prior art date
Application number
FI20096035A
Other languages
English (en)
Swedish (sv)
Other versions
FI124299B (fi
FI20096035A0 (fi
Inventor
Karri Niemelae
Heimo Keraenen
Original Assignee
Valtion Teknillinen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=41263452&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=FI20096035(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Valtion Teknillinen filed Critical Valtion Teknillinen
Priority to FI20096035A priority Critical patent/FI124299B/fi
Publication of FI20096035A0 publication Critical patent/FI20096035A0/fi
Priority to JP2012532637A priority patent/JP2013507608A/ja
Priority to CN201080045557.7A priority patent/CN102575985B/zh
Priority to PL10821623T priority patent/PL2486392T3/pl
Priority to US13/500,073 priority patent/US8786836B2/en
Priority to PCT/FI2010/050778 priority patent/WO2011042606A1/en
Priority to EP10821623.5A priority patent/EP2486392B1/en
Priority to ES10821623T priority patent/ES2743461T3/es
Publication of FI20096035A publication Critical patent/FI20096035A/fi
Publication of FI124299B publication Critical patent/FI124299B/fi
Application granted granted Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/44—Caliper-like sensors with detectors on both sides of the object to be measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
FI20096035A 2009-10-08 2009-10-08 Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi FI124299B (fi)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI20096035A FI124299B (fi) 2009-10-08 2009-10-08 Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi
ES10821623T ES2743461T3 (es) 2009-10-08 2010-10-07 Instrumento de medida y método para determinación de las propiedades de un artículo y su superficie
PL10821623T PL2486392T3 (pl) 2009-10-08 2010-10-07 Przyrząd pomiarowy i sposób określania właściwości przedmiotu i jego powierzchni
CN201080045557.7A CN102575985B (zh) 2009-10-08 2010-10-07 用于确定物品及其表面的特性的测量仪器和方法
JP2012532637A JP2013507608A (ja) 2009-10-08 2010-10-07 物品及びその表面の特性を決定するための測定機器及び方法
US13/500,073 US8786836B2 (en) 2009-10-08 2010-10-07 Measuring instrument and method for determination of the properties of an item and its surface
PCT/FI2010/050778 WO2011042606A1 (en) 2009-10-08 2010-10-07 Measuring instrument and method for determination of the properties of an item and its surface
EP10821623.5A EP2486392B1 (en) 2009-10-08 2010-10-07 Measuring instrument and method for determination of the properties of an item and its surface

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20096035 2009-10-08
FI20096035A FI124299B (fi) 2009-10-08 2009-10-08 Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi

Publications (3)

Publication Number Publication Date
FI20096035A0 FI20096035A0 (fi) 2009-10-08
FI20096035A true FI20096035A (fi) 2011-04-09
FI124299B FI124299B (fi) 2014-06-13

Family

ID=41263452

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20096035A FI124299B (fi) 2009-10-08 2009-10-08 Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi

Country Status (8)

Country Link
US (1) US8786836B2 (fi)
EP (1) EP2486392B1 (fi)
JP (1) JP2013507608A (fi)
CN (1) CN102575985B (fi)
ES (1) ES2743461T3 (fi)
FI (1) FI124299B (fi)
PL (1) PL2486392T3 (fi)
WO (1) WO2011042606A1 (fi)

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JP5701837B2 (ja) * 2012-10-12 2015-04-15 横河電機株式会社 変位センサ、変位測定方法
FI20126126L (fi) * 2012-10-30 2014-05-01 Metso Automation Oy Menetelmä ja laite kiillon mittaamiseksi
GB2507813B (en) * 2012-11-13 2017-06-21 Focalspec Oy Apparatus and method for inspecting seals of items
CN103063615B (zh) * 2012-12-28 2014-12-31 天威（成都）太阳能热发电开发有限公司 基于抛物面反射镜的光洁度测量仪及其测量方法
WO2015038850A2 (en) * 2013-09-12 2015-03-19 Sio2 Medical Products, Inc. Rapid, non-destructive, selective infrared spectrometry analysis of organic coatings on molded articles
JP5907364B2 (ja) * 2015-02-17 2016-04-26 横河電機株式会社 分光特性測定装置、分光特性測定方法、面状測定対象物品質監視装置
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US9863842B2 (en) 2015-09-24 2018-01-09 Novartis Ag Method for characterizing an ophthalmic lens
FI126900B (fi) * 2015-12-29 2017-07-31 Optiweld Oy Menetelmä ja järjestelmä hitsaussauman ominaisuuksien analysoimiseksi
DE102016122528A1 (de) * 2016-11-22 2018-05-24 Carl Zeiss Microscopy Gmbh Verfahren zum Steuern oder Regeln einer Mikroskopbeleuchtung
US10480935B2 (en) 2016-12-02 2019-11-19 Alliance For Sustainable Energy, Llc Thickness mapping using multispectral imaging
EP3346229B1 (en) * 2017-01-09 2022-03-30 Unity Semiconductor GmbH Method and assembly for determining the thickness of layers in a sample stack
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CN113677971A (zh) * 2019-04-11 2021-11-19 克里奥瓦克公司 用于密封完整性的在线检查的系统
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CN110425983B (zh) * 2019-07-26 2021-04-06 杭州电子科技大学 一种基于偏振多光谱的单目视觉三维重建测距方法
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Also Published As

Publication number Publication date
CN102575985B (zh) 2015-10-14
CN102575985A (zh) 2012-07-11
US8786836B2 (en) 2014-07-22
PL2486392T3 (pl) 2020-01-31
EP2486392A4 (en) 2017-01-04
EP2486392B1 (en) 2019-06-05
FI124299B (fi) 2014-06-13
WO2011042606A1 (en) 2011-04-14
FI20096035A0 (fi) 2009-10-08
ES2743461T3 (es) 2020-02-19
EP2486392A1 (en) 2012-08-15
JP2013507608A (ja) 2013-03-04
US20120206710A1 (en) 2012-08-16

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