ES8705630A1 - Instalacion de deteccion de defectos de superficie sobre una banda en curso de deslizamiento - Google Patents

Instalacion de deteccion de defectos de superficie sobre una banda en curso de deslizamiento

Info

Publication number
ES8705630A1
ES8705630A1 ES555320A ES555320A ES8705630A1 ES 8705630 A1 ES8705630 A1 ES 8705630A1 ES 555320 A ES555320 A ES 555320A ES 555320 A ES555320 A ES 555320A ES 8705630 A1 ES8705630 A1 ES 8705630A1
Authority
ES
Spain
Prior art keywords
image
stored
arrangement
detection
converted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES555320A
Other languages
English (en)
Other versions
ES555320A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut de Recherches de la Siderurgie Francaise IRSID
USINOR SA
Original Assignee
Institut de Recherches de la Siderurgie Francaise IRSID
USINOR SA
Union Siderurgique du Nord et de lEst de France SA USINOR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut de Recherches de la Siderurgie Francaise IRSID, USINOR SA, Union Siderurgique du Nord et de lEst de France SA USINOR filed Critical Institut de Recherches de la Siderurgie Francaise IRSID
Publication of ES555320A0 publication Critical patent/ES555320A0/es
Publication of ES8705630A1 publication Critical patent/ES8705630A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Manufacturing Of Electric Cables (AREA)
  • Cable Accessories (AREA)
  • Road Signs Or Road Markings (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

INSTALACION DE DETECCION DE DEFECTOS DE SUPERFICIE SOBRE UNA BANDA EN CURSO DE DESPLAZAMIENTO. CONSTA DE UN DISPOSITIVO FOTOSENSIBLE, QUE ORIGINA, PERIODICAMENTE, SEÑALES ANALOGICAS QUE REPRESENTAN LAS IMAGENES SUCESIVAS DE SUPERFICIES DE LA BANDA, Y UN DISPOSITIVO DE TRATAMIENTO DE LAS SEÑALES ANALOGICAS, PARA DETECTAR VARIACIONES DE NIVEL ANORMALES. COMPRENDE UN CONVERTIDOR ANALOGICO-DIGITAL, DIVIDIENDO LA IMAGEN EN ELEMENTOS DE IMAGEN, A CADA UNO DE LOS CUALES SE ASOCIA UN VALOR DIGITAL; UN FILTRO RECIBE LAS SEÑALES DIGITALES QUE REPRESENTA CADA IMAGEN, Y UN CIRCUITO DE ANALISIS CONECTADO A LA SALIDA DEL FILTRO PARA ORIGINAR PARA CADA IMAGEN, UNA SEÑAL DE DEFECTO EN FUNCION DE LAS VARIACIONES DE LOS VALORES DIGITALES DETECTADOS.
ES555320A 1984-02-10 1986-05-26 Instalacion de deteccion de defectos de superficie sobre una banda en curso de deslizamiento Expired ES8705630A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8402078A FR2559581B1 (fr) 1984-02-10 1984-02-10 Procede et installation de detection de defauts de surface sur une bande en cours de defilement

Publications (2)

Publication Number Publication Date
ES555320A0 ES555320A0 (es) 1987-05-01
ES8705630A1 true ES8705630A1 (es) 1987-05-01

Family

ID=9300948

Family Applications (2)

Application Number Title Priority Date Filing Date
ES540253A Expired ES8700437A1 (es) 1984-02-10 1985-02-08 Procedimiento de deteccion de defectos de sudperficie sobre una banda en curso de deslizamiento.
ES555320A Expired ES8705630A1 (es) 1984-02-10 1986-05-26 Instalacion de deteccion de defectos de superficie sobre una banda en curso de deslizamiento

Family Applications Before (1)

Application Number Title Priority Date Filing Date
ES540253A Expired ES8700437A1 (es) 1984-02-10 1985-02-08 Procedimiento de deteccion de defectos de sudperficie sobre una banda en curso de deslizamiento.

Country Status (12)

Country Link
US (1) US4665317A (es)
EP (1) EP0153218B1 (es)
JP (1) JP2531580B2 (es)
KR (1) KR880002322B1 (es)
AT (1) ATE51301T1 (es)
AU (1) AU582137B2 (es)
BR (1) BR8500585A (es)
CA (1) CA1236920A (es)
DE (1) DE3576729D1 (es)
ES (2) ES8700437A1 (es)
FR (1) FR2559581B1 (es)
ZA (1) ZA85884B (es)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1000294A3 (nl) * 1987-02-05 1988-10-11 Wetenschappelijk En Tech Ct Va Werkwijze voor het meten van de garendichtheid van een weefsel of de steekdichtheid van een breisel en inrichting voor het uitvoeren van deze werkwijze.
US4758888A (en) * 1987-02-17 1988-07-19 Orbot Systems, Ltd. Method of and means for inspecting workpieces traveling along a production line
JPH01249181A (ja) * 1988-03-31 1989-10-04 Tdk Corp チップ部品自動外観選別機における部品仕分け方法
DE3742447C2 (de) * 1987-12-15 1996-02-01 Basf Magnetics Gmbh Verfahren zur Fehlererkennung bei Videosignalen
JPH01310485A (ja) * 1988-06-08 1989-12-14 Dainippon Printing Co Ltd 欠陥情報検出装置
US4951223A (en) * 1989-03-28 1990-08-21 Langdon Wales R Web material inspection system
JPH03188358A (ja) * 1989-12-19 1991-08-16 Hajime Sangyo Kk 物体の表面検査装置
WO1991018281A1 (en) * 1990-05-23 1991-11-28 Pulp And Paper Research Institute Of Canada On-line dirt counter
FI85308C (fi) * 1990-06-07 1992-03-25 Rautaruukki Oy Foerfarande och anordning foer optisk granskning av ark- och banformiga produkter.
US5118195A (en) * 1990-09-10 1992-06-02 Rkb Opto-Electrics, Inc. Area scan camera system for detecting streaks and scratches
IT1246047B (it) * 1990-12-21 1994-11-07 Pirelli Prod Diversificati Procedimento ed apparecchiatura per individuare difettosita' supeficiali su strati e/o manicotti in materiale elastomerico
FR2670896B1 (fr) * 1990-12-24 1994-08-12 Siderurgie Fse Inst Rech Dispositif de detection de defauts d'une bande en cours de defilement.
FR2714469B1 (fr) * 1993-12-23 1996-01-26 Lorraine Laminage Dispositif et procédé de visualisation de brames.
US5654977A (en) * 1995-02-02 1997-08-05 Teledyne Industries Inc. Method and apparatus for real time defect inspection of metal at elevated temperature
AR002082A1 (es) * 1995-05-25 1998-01-07 Gillette Co Metodo para producir un borde cortante en una tira de metal y el aparato para realizarlo
JPH11515108A (ja) * 1996-09-05 1999-12-21 ダヴリュイーエー マニュファクチュアリング，インク． 両面光ディスク面検査装置
DE19919895A1 (de) * 1999-04-30 2000-11-02 Zentrum Fuer Neuroinformatik G Fehlererkennungssystem für bandförmiges Material, Beleuchtungs-, Steuer- und Aufnahmevorrichtung hierfür
GB0005792D0 (en) * 2000-03-11 2000-05-03 Shelton Vision Systems Ltd Automatic inspection method
US6950546B2 (en) 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7324681B2 (en) 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
DE102005051053A1 (de) * 2005-10-25 2007-04-26 Sms Demag Ag Verfahren zur Bandkantenerfassung
JP6173088B2 (ja) * 2013-07-19 2017-08-02 キヤノン株式会社 検査装置、検査方法、プログラム及び記録媒体
CN117333441B (zh) * 2023-09-27 2024-04-02 威海天拓合创电子工程有限公司 一种基于图像数据的pcb板缺陷检测方法及系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
JPS4934385A (es) * 1972-07-28 1974-03-29
CA1043463A (en) * 1975-12-05 1978-11-28 Paul A. Mueller Lumber inspection and optimization system
JPS5334586A (en) * 1976-09-10 1978-03-31 Ishikawajima Harima Heavy Ind Method of and apparatus for detecting surface flaw
FR2402868A1 (fr) * 1977-09-12 1979-04-06 Usinor Procede et appareil de detection de defauts de surface sur une bande defilant a grande vitesse
JPS5474793A (en) * 1977-11-28 1979-06-15 Nippon Steel Corp Surface defect inspection method of steel plates
US4221974A (en) * 1979-02-02 1980-09-09 The Bendix Corporation Lumber inspection and optimization system
JPS5782713A (en) * 1980-11-12 1982-05-24 Toshiba Corp Surface inspection device
CA1193709A (en) * 1980-11-17 1985-09-17 Gary G. Wagner Operator programmable inspection apparatus
US4493420A (en) * 1981-01-29 1985-01-15 Lockwood Graders (U.K.) Limited Method and apparatus for detecting bounded regions of images, and method and apparatus for sorting articles and detecting flaws
DE3111728A1 (de) * 1981-03-25 1982-10-07 Philips Patentverwaltung Gmbh, 2000 Hamburg "pruefverfahren fuer werkstuecke"
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
EP0095517B1 (de) * 1982-05-28 1985-11-21 Ibm Deutschland Gmbh Verfahren und Einrichtung zur automatischen optischen Inspektion
US4454545A (en) * 1982-06-14 1984-06-12 Rca Corporation Charge coupled device based inspection system and method
DE3381703D1 (de) * 1982-07-02 1990-08-09 American Cyanamid Co Vorrichtung zur inspektion und zum messen von faeden.
US4561104A (en) * 1984-01-16 1985-12-24 Honeywell Inc. Automated inspection of hot steel slabs

Also Published As

Publication number Publication date
EP0153218A3 (en) 1985-10-16
AU582137B2 (en) 1989-03-16
FR2559581B1 (fr) 1986-07-11
JP2531580B2 (ja) 1996-09-04
KR860006704A (ko) 1986-09-13
ES555320A0 (es) 1987-05-01
BR8500585A (pt) 1985-09-24
AU3847585A (en) 1985-08-15
DE3576729D1 (de) 1990-04-26
EP0153218A2 (fr) 1985-08-28
ATE51301T1 (de) 1990-04-15
US4665317A (en) 1987-05-12
ES8700437A1 (es) 1986-10-01
KR880002322B1 (ko) 1988-10-22
ZA85884B (en) 1985-11-27
ES540253A0 (es) 1986-10-01
CA1236920A (fr) 1988-05-17
EP0153218B1 (fr) 1990-03-21
JPS60253807A (ja) 1985-12-14
FR2559581A1 (fr) 1985-08-16

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20070120