ATE51301T1 - Verfahren und einrichtung zum nachweis von oberflaechenfehlern auf einem durchlaufenden band. - Google Patents

Verfahren und einrichtung zum nachweis von oberflaechenfehlern auf einem durchlaufenden band.

Info

Publication number
ATE51301T1
ATE51301T1 AT85400178T AT85400178T ATE51301T1 AT E51301 T1 ATE51301 T1 AT E51301T1 AT 85400178 T AT85400178 T AT 85400178T AT 85400178 T AT85400178 T AT 85400178T AT E51301 T1 ATE51301 T1 AT E51301T1
Authority
AT
Austria
Prior art keywords
image
stored
equipment
surface defects
converted
Prior art date
Application number
AT85400178T
Other languages
English (en)
Inventor
Dominique Ferriere
Gabriel Giraudy
Original Assignee
Siderurgie Fse Inst Rech
Usinor
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siderurgie Fse Inst Rech, Usinor filed Critical Siderurgie Fse Inst Rech
Application granted granted Critical
Publication of ATE51301T1 publication Critical patent/ATE51301T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Image Analysis (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Cable Accessories (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Road Signs Or Road Markings (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Manufacturing Of Electric Cables (AREA)
AT85400178T 1984-02-10 1985-02-04 Verfahren und einrichtung zum nachweis von oberflaechenfehlern auf einem durchlaufenden band. ATE51301T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8402078A FR2559581B1 (fr) 1984-02-10 1984-02-10 Procede et installation de detection de defauts de surface sur une bande en cours de defilement
EP85400178A EP0153218B1 (de) 1984-02-10 1985-02-04 Verfahren und Einrichtung zum Nachweis von Oberflächenfehlern auf einem durchlaufenden Band

Publications (1)

Publication Number Publication Date
ATE51301T1 true ATE51301T1 (de) 1990-04-15

Family

ID=9300948

Family Applications (1)

Application Number Title Priority Date Filing Date
AT85400178T ATE51301T1 (de) 1984-02-10 1985-02-04 Verfahren und einrichtung zum nachweis von oberflaechenfehlern auf einem durchlaufenden band.

Country Status (12)

Country Link
US (1) US4665317A (de)
EP (1) EP0153218B1 (de)
JP (1) JP2531580B2 (de)
KR (1) KR880002322B1 (de)
AT (1) ATE51301T1 (de)
AU (1) AU582137B2 (de)
BR (1) BR8500585A (de)
CA (1) CA1236920A (de)
DE (1) DE3576729D1 (de)
ES (2) ES8700437A1 (de)
FR (1) FR2559581B1 (de)
ZA (1) ZA85884B (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1000294A3 (nl) * 1987-02-05 1988-10-11 Wetenschappelijk En Tech Ct Va Werkwijze voor het meten van de garendichtheid van een weefsel of de steekdichtheid van een breisel en inrichting voor het uitvoeren van deze werkwijze.
US4758888A (en) * 1987-02-17 1988-07-19 Orbot Systems, Ltd. Method of and means for inspecting workpieces traveling along a production line
JPH01249181A (ja) * 1988-03-31 1989-10-04 Tdk Corp チップ部品自動外観選別機における部品仕分け方法
DE3742447C2 (de) * 1987-12-15 1996-02-01 Basf Magnetics Gmbh Verfahren zur Fehlererkennung bei Videosignalen
JPH01310485A (ja) * 1988-06-08 1989-12-14 Dainippon Printing Co Ltd 欠陥情報検出装置
US4951223A (en) * 1989-03-28 1990-08-21 Langdon Wales R Web material inspection system
JPH03188358A (ja) * 1989-12-19 1991-08-16 Hajime Sangyo Kk 物体の表面検査装置
US5402228A (en) * 1990-05-23 1995-03-28 Pulp And Paper Research Institute Of Canada On-line dirt counter
FI85308C (fi) * 1990-06-07 1992-03-25 Rautaruukki Oy Foerfarande och anordning foer optisk granskning av ark- och banformiga produkter.
US5118195A (en) * 1990-09-10 1992-06-02 Rkb Opto-Electrics, Inc. Area scan camera system for detecting streaks and scratches
IT1246047B (it) * 1990-12-21 1994-11-07 Pirelli Prod Diversificati Procedimento ed apparecchiatura per individuare difettosita' supeficiali su strati e/o manicotti in materiale elastomerico
FR2670896B1 (fr) * 1990-12-24 1994-08-12 Siderurgie Fse Inst Rech Dispositif de detection de defauts d'une bande en cours de defilement.
FR2714469B1 (fr) * 1993-12-23 1996-01-26 Lorraine Laminage Dispositif et procédé de visualisation de brames.
US5654977A (en) * 1995-02-02 1997-08-05 Teledyne Industries Inc. Method and apparatus for real time defect inspection of metal at elevated temperature
AR002082A1 (es) * 1995-05-25 1998-01-07 Gillette Co Metodo para producir un borde cortante en una tira de metal y el aparato para realizarlo
EP0865607A4 (de) * 1996-09-05 1999-12-01 Wea Mfg Inc Vorrichtung zum prufen der oberflache einer doppelseitigen optischen platte
DE19919895A1 (de) * 1999-04-30 2000-11-02 Zentrum Fuer Neuroinformatik G Fehlererkennungssystem für bandförmiges Material, Beleuchtungs-, Steuer- und Aufnahmevorrichtung hierfür
GB0005792D0 (en) * 2000-03-11 2000-05-03 Shelton Vision Systems Ltd Automatic inspection method
US6950546B2 (en) 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7324681B2 (en) 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
DE102005051053A1 (de) * 2005-10-25 2007-04-26 Sms Demag Ag Verfahren zur Bandkantenerfassung
JP6173088B2 (ja) * 2013-07-19 2017-08-02 キヤノン株式会社 検査装置、検査方法、プログラム及び記録媒体
CN117333441B (zh) * 2023-09-27 2024-04-02 威海天拓合创电子工程有限公司 一种基于图像数据的pcb板缺陷检测方法及系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
JPS4934385A (de) * 1972-07-28 1974-03-29
CA1043463A (en) * 1975-12-05 1978-11-28 Paul A. Mueller Lumber inspection and optimization system
JPS5334586A (en) * 1976-09-10 1978-03-31 Ishikawajima Harima Heavy Ind Method of and apparatus for detecting surface flaw
FR2402868A1 (fr) * 1977-09-12 1979-04-06 Usinor Procede et appareil de detection de defauts de surface sur une bande defilant a grande vitesse
JPS5474793A (en) * 1977-11-28 1979-06-15 Nippon Steel Corp Surface defect inspection method of steel plates
US4221974A (en) * 1979-02-02 1980-09-09 The Bendix Corporation Lumber inspection and optimization system
JPS5782713A (en) * 1980-11-12 1982-05-24 Toshiba Corp Surface inspection device
CA1193709A (en) * 1980-11-17 1985-09-17 Gary G. Wagner Operator programmable inspection apparatus
US4493420A (en) * 1981-01-29 1985-01-15 Lockwood Graders (U.K.) Limited Method and apparatus for detecting bounded regions of images, and method and apparatus for sorting articles and detecting flaws
DE3111728A1 (de) * 1981-03-25 1982-10-07 Philips Patentverwaltung Gmbh, 2000 Hamburg "pruefverfahren fuer werkstuecke"
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
EP0095517B1 (de) * 1982-05-28 1985-11-21 Ibm Deutschland Gmbh Verfahren und Einrichtung zur automatischen optischen Inspektion
US4454545A (en) * 1982-06-14 1984-06-12 Rca Corporation Charge coupled device based inspection system and method
DE3381703D1 (de) * 1982-07-02 1990-08-09 American Cyanamid Co Vorrichtung zur inspektion und zum messen von faeden.
US4561104A (en) * 1984-01-16 1985-12-24 Honeywell Inc. Automated inspection of hot steel slabs

Also Published As

Publication number Publication date
AU3847585A (en) 1985-08-15
ES8700437A1 (es) 1986-10-01
JP2531580B2 (ja) 1996-09-04
US4665317A (en) 1987-05-12
ZA85884B (en) 1985-11-27
BR8500585A (pt) 1985-09-24
ES555320A0 (es) 1987-05-01
ES540253A0 (es) 1986-10-01
AU582137B2 (en) 1989-03-16
EP0153218B1 (de) 1990-03-21
FR2559581B1 (fr) 1986-07-11
DE3576729D1 (de) 1990-04-26
KR860006704A (ko) 1986-09-13
CA1236920A (fr) 1988-05-17
FR2559581A1 (fr) 1985-08-16
EP0153218A3 (en) 1985-10-16
JPS60253807A (ja) 1985-12-14
EP0153218A2 (de) 1985-08-28
ES8705630A1 (es) 1987-05-01
KR880002322B1 (ko) 1988-10-22

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
EELA Cancelled due to lapse of time