JPS5782713A - Surface inspection device - Google Patents

Surface inspection device

Info

Publication number
JPS5782713A
JPS5782713A JP15925580A JP15925580A JPS5782713A JP S5782713 A JPS5782713 A JP S5782713A JP 15925580 A JP15925580 A JP 15925580A JP 15925580 A JP15925580 A JP 15925580A JP S5782713 A JPS5782713 A JP S5782713A
Authority
JP
Japan
Prior art keywords
circuit
defective
signal
processing
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15925580A
Other languages
Japanese (ja)
Other versions
JPS6343685B2 (en
Inventor
Yoshihisa Morioka
Masayoshi Shimada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP15925580A priority Critical patent/JPS5782713A/en
Publication of JPS5782713A publication Critical patent/JPS5782713A/en
Publication of JPS6343685B2 publication Critical patent/JPS6343685B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Indicating Measured Values (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve the reliability of a device by deciding a defective accurately by storing a defective signal obtained by discriminating an inspection signal obtained by optically scanning the overall width of a material to be inspected, and by displaying and recording a still picture in the center of a monitoring device. CONSTITUTION:The overall width of a material to be inspected is scanned optically and output signals of photodetectors 4 and 4a are inputted to a discrminating circuit 10 through a preamplifier 7, a main amplifier 8 and a signal processing circuit 9 to discriminate and store a defective signal. On receiving a synchronizing pulse outputted by a pulse generator 23 each time one line is scanned, a control circuit 24 writes the signal from the amplifier in a frame memory 25 through a switch circuit 21 and an ADC22. At the same time, a signal from the circuit 10 is sent to a control circuit to perform address movement processing. After the processing, the contents of the memory 25 are passed through a DAC28 to be monitored 26 as a still picture so that a defective picture is in the center, and defective data from the discriminating circuit 10 is recorded 31 through a gate circuit 30. Thus, the defective is decided accurately and the reliability of the device is improved.
JP15925580A 1980-11-12 1980-11-12 Surface inspection device Granted JPS5782713A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15925580A JPS5782713A (en) 1980-11-12 1980-11-12 Surface inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15925580A JPS5782713A (en) 1980-11-12 1980-11-12 Surface inspection device

Publications (2)

Publication Number Publication Date
JPS5782713A true JPS5782713A (en) 1982-05-24
JPS6343685B2 JPS6343685B2 (en) 1988-09-01

Family

ID=15689750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15925580A Granted JPS5782713A (en) 1980-11-12 1980-11-12 Surface inspection device

Country Status (1)

Country Link
JP (1) JPS5782713A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2559581A1 (en) * 1984-02-10 1985-08-16 Siderurgie Fse Inst Rech METHOD AND INSTALLATION FOR DETECTING SURFACE DEFECTS ON A STRIP DURING SCROLL

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2559581A1 (en) * 1984-02-10 1985-08-16 Siderurgie Fse Inst Rech METHOD AND INSTALLATION FOR DETECTING SURFACE DEFECTS ON A STRIP DURING SCROLL
EP0153218A2 (en) * 1984-02-10 1985-08-28 Institut De Recherches De La Siderurgie Francaise (Irsid) Method and arrangement for the detection of superficial faults in a moving sheet

Also Published As

Publication number Publication date
JPS6343685B2 (en) 1988-09-01

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