ES2720949T3 - Dispositivo óptico, banco de pruebas óptico y procedimiento de prueba óptico - Google Patents

Dispositivo óptico, banco de pruebas óptico y procedimiento de prueba óptico Download PDF

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Publication number
ES2720949T3
ES2720949T3 ES13701833T ES13701833T ES2720949T3 ES 2720949 T3 ES2720949 T3 ES 2720949T3 ES 13701833 T ES13701833 T ES 13701833T ES 13701833 T ES13701833 T ES 13701833T ES 2720949 T3 ES2720949 T3 ES 2720949T3
Authority
ES
Spain
Prior art keywords
light wave
optical
test
olcol
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES13701833T
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English (en)
Inventor
Emmanuelle Pitte
Vincent Petit
Pierre Lecoq
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Spherea Test and Services SAS
Original Assignee
Spherea Test and Services SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spherea Test and Services SAS filed Critical Spherea Test and Services SAS
Application granted granted Critical
Publication of ES2720949T3 publication Critical patent/ES2720949T3/es
Active legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/04—Optical benches therefor
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V13/00—Producing particular characteristics or distribution of the light emitted by means of a combination of elements specified in two or more of main groups F21V1/00 - F21V11/00
    • F21V13/02—Combinations of only two kinds of elements
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V14/00—Controlling the distribution of the light emitted by adjustment of elements
    • F21V14/06—Controlling the distribution of the light emitted by adjustment of elements by movement of refractors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0448—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B15/00—Optical objectives with means for varying the magnification
    • G02B15/14—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective
    • G02B15/142—Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective having two groups only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/30—Collimators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

Banco de pruebas óptico, que comprende un sistema (102) óptico que comprende: - un dispositivo (106) de generación de una onda luminosa plana, denominada onda (OLcol); - un dispositivo (114) de desviación de la onda luminosa colimada para proporcionar una onda luminosa, denominada onda luminosa de prueba (OLprueba), presentando el dispositivo (114) de desviación una distancia focal ajustable; y, - un sistema de observación óptico u optrónico, denominado unidad (104) de prueba, destinado a recibir la onda luminosa de prueba (OLprueba) y a proporcionar una imagen a partir de la onda luminosa de prueba (OLprueba); comprendiendo el dispositivo de generación: - una fuente (108) luminosa que emite una onda luminosa fuente (OLfuente), - una pantalla (110) parcialmente transparente y que presenta un motivo determinado, disponiéndose la pantalla a través de la onda luminosa fuente (OLfuente) para ocultar una parte y dejar pasar otra parte, denominada onda luminosa de mira (OLmira); - un colimador (112) dispuesto para recibir la onda luminosa de mira (OLmira) y colimarla para proporcionar la onda luminosa colimada (OLcol); y, - un dispositivo (122) informático destinado a realizar uno o varios tratamientos en la imagen; caracterizado porque el sistema óptico comprende además un espejo (116) dispuesto al lado de la unidad (104) de prueba para recibir una parte de la onda luminosa colimada (OLcol) sin tapar la unidad (104) de prueba y orientado perpendicularmente hacia la onda luminosa colimada (OLcol) para reflejarla en su dirección de llegada, hacia el colimador (112) para poder utilizarse para determinar el eje de referencia mecánico de la unidad (104) de prueba por autocolimación.
ES13701833T 2012-01-13 2013-01-07 Dispositivo óptico, banco de pruebas óptico y procedimiento de prueba óptico Active ES2720949T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1250333A FR2985811B1 (fr) 2012-01-13 2012-01-13 Dispositif optique, banc de test optique et procede de test optique.
PCT/FR2013/050025 WO2013104851A1 (fr) 2012-01-13 2013-01-07 Dispositif optique, banc de test optique et procede de test optique

Publications (1)

Publication Number Publication Date
ES2720949T3 true ES2720949T3 (es) 2019-07-25

Family

ID=47628360

Family Applications (1)

Application Number Title Priority Date Filing Date
ES13701833T Active ES2720949T3 (es) 2012-01-13 2013-01-07 Dispositivo óptico, banco de pruebas óptico y procedimiento de prueba óptico

Country Status (7)

Country Link
US (1) US9719882B2 (es)
EP (1) EP2802854B1 (es)
CN (1) CN104136902B (es)
ES (1) ES2720949T3 (es)
FR (1) FR2985811B1 (es)
RU (1) RU2626969C2 (es)
WO (1) WO2013104851A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106338383B (zh) * 2015-12-21 2018-09-04 中国科学院长春光学精密机械与物理研究所 一种光学检测平台及光学检测方法
RU2687511C1 (ru) * 2018-04-09 2019-05-14 Федеральное государственное бюджетное образовательное учреждение высшего образования "Уфимский государственный нефтяной технический университет" Устройство для измерения положения лазерного луча
RU187820U1 (ru) * 2018-05-07 2019-03-19 Федеральное государственное казенное военное образовательное учреждение высшего образования "Военная академия материально-технического обеспечения имени генерала армии А.В. Хрулёва" Министерства обороны Российской Федерации Демонстрационно-учебный универсальный коллиматор ночных приборов

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100220674B1 (ko) * 1994-01-18 1999-09-15 전주범 투사형 화상표시장치
US7455407B2 (en) * 2000-02-11 2008-11-25 Amo Wavefront Sciences, Llc System and method of measuring and mapping three dimensional structures
TW584738B (en) * 2003-01-08 2004-04-21 Microtek Int Inc Lens module for a thin scanning device
KR20050114661A (ko) * 2003-03-20 2005-12-06 코닌클리케 필립스 일렉트로닉스 엔.브이. 광 주사장치
JP2005091930A (ja) * 2003-09-18 2005-04-07 Ricoh Opt Ind Co Ltd 光走査装置用光学系・光走査装置および光走査方法
JP4474150B2 (ja) * 2003-11-28 2010-06-02 キヤノン株式会社 偏心測定方法
CN101226344B (zh) * 2008-01-31 2010-06-02 上海微电子装备有限公司 测量光学系统参数的测量装置及其测量方法
FR2936065A1 (fr) * 2008-09-17 2010-03-19 Thales Sa Calibrage d'un zoom optique
JP2010211842A (ja) * 2009-03-09 2010-09-24 Hitachi Media Electoronics Co Ltd 光ピックアップ、光学的情報再生装置および光学的情報記録再生装置

Also Published As

Publication number Publication date
FR2985811B1 (fr) 2014-12-05
EP2802854B1 (fr) 2019-01-23
CN104136902A (zh) 2014-11-05
RU2014133181A (ru) 2016-03-10
FR2985811A1 (fr) 2013-07-19
CN104136902B (zh) 2018-01-23
US9719882B2 (en) 2017-08-01
WO2013104851A1 (fr) 2013-07-18
EP2802854A1 (fr) 2014-11-19
RU2626969C2 (ru) 2017-08-02
US20140347653A1 (en) 2014-11-27

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