BR112017000460A2 - método e sistema para ajuste de padrão de luz para imageamento de luz estruturada - Google Patents

método e sistema para ajuste de padrão de luz para imageamento de luz estruturada

Info

Publication number
BR112017000460A2
BR112017000460A2 BR112017000460A BR112017000460A BR112017000460A2 BR 112017000460 A2 BR112017000460 A2 BR 112017000460A2 BR 112017000460 A BR112017000460 A BR 112017000460A BR 112017000460 A BR112017000460 A BR 112017000460A BR 112017000460 A2 BR112017000460 A2 BR 112017000460A2
Authority
BR
Brazil
Prior art keywords
light
adjusted
scene
adjustment method
transmitter
Prior art date
Application number
BR112017000460A
Other languages
English (en)
Inventor
Raz Guy
Original Assignee
Facebook Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Facebook Inc filed Critical Facebook Inc
Publication of BR112017000460A2 publication Critical patent/BR112017000460A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • User Interface Of Digital Computer (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)

Abstract

um sistema e um método para produzir um padrão de luz ajustável são fornecidos na presente invenção. o sistema pode incluir: um transmissor configurado para iluminar uma cena com uma luz padronizada sendo ajustada com base em critérios predefinidos; um receptor configurado para receber reflexos da luz padronizada ajustada; e um processador de computador configurado para controlar o ajuste da luz padronizada e adicionalmente analisar os reflexos recebidos, para fornecer um mapa de profundidade de objetos na cena, em que o transmissor pode incluir: uma fonte de luz configurada para produzir um feixe de luz; um primeiro refletor inclinável aproximadamente ao longo de uma linha em um plano x-y em um sistema de coordenadas cartesianas x-y-z; e um segundo refletor inclinável ao longo de um eixo-z no sistema de coordenadas, em que os refletores são inclinados ao longo de seus eixos respectivos para frente e para trás de modo a desviar o feixe de luz para criar a luz padronizada ajustada.
BR112017000460A 2014-07-08 2015-07-07 método e sistema para ajuste de padrão de luz para imageamento de luz estruturada BR112017000460A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462021942P 2014-07-08 2014-07-08
PCT/IL2015/050703 WO2016005976A2 (en) 2014-07-08 2015-07-07 Method and system for adjusting light pattern for structured light imaging

Publications (1)

Publication Number Publication Date
BR112017000460A2 true BR112017000460A2 (pt) 2017-11-07

Family

ID=55065049

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017000460A BR112017000460A2 (pt) 2014-07-08 2015-07-07 método e sistema para ajuste de padrão de luz para imageamento de luz estruturada

Country Status (11)

Country Link
US (2) US10408605B2 (pt)
EP (2) EP3167311B1 (pt)
JP (1) JP6600348B2 (pt)
KR (1) KR102372449B1 (pt)
CN (2) CN106716175B (pt)
AU (1) AU2015287252C1 (pt)
BR (1) BR112017000460A2 (pt)
CA (1) CA2954430A1 (pt)
IL (1) IL249931A0 (pt)
MX (1) MX364492B (pt)
WO (1) WO2016005976A2 (pt)

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* Cited by examiner, † Cited by third party
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JP6600348B2 (ja) 2014-07-08 2019-10-30 フェイスブック・テクノロジーズ・リミテッド・ライアビリティ・カンパニー 構造化光イメージング用の光パターンを調整するための方法およびシステム
US11057608B2 (en) 2016-01-04 2021-07-06 Qualcomm Incorporated Depth map generation in structured light system
KR101733228B1 (ko) * 2016-04-28 2017-05-08 주식회사 메디트 구조광을 이용한 3차원 스캐닝 장치
US10241244B2 (en) 2016-07-29 2019-03-26 Lumentum Operations Llc Thin film total internal reflection diffraction grating for single polarization or dual polarization
US10277842B1 (en) * 2016-11-29 2019-04-30 X Development Llc Dynamic range for depth sensing
US11262192B2 (en) 2017-12-12 2022-03-01 Samsung Electronics Co., Ltd. High contrast structured light patterns for QIS sensors
US10740913B2 (en) 2017-12-12 2020-08-11 Samsung Electronics Co., Ltd. Ultrafast, robust and efficient depth estimation for structured-light based 3D camera system
JP7296138B2 (ja) * 2018-05-03 2023-06-22 ザ ガバニング カウンシル オブ ザ ユニバーシティ オブ トロント 深度イメージングを最適化するための方法およびシステム
US11995851B2 (en) * 2018-10-04 2024-05-28 Isak Du Preez Optical surface encoder
JP7224708B6 (ja) * 2019-03-15 2023-04-18 上海図漾信息科技有限公司 深度データ測定ヘッド、測定装置及び測定方法
CN110763158B (zh) * 2019-10-09 2021-06-04 天津大学 镜像h型钢轮廓尺寸测量装置
EP3839483B1 (en) 2019-12-19 2023-07-26 Imec VZW An illuminator, an imaging apparatus and a system
WO2023041706A1 (de) * 2021-09-17 2023-03-23 OQmented GmbH Verfahren und vorrichtung zur messung von tiefeninformationen einer szene anhand von mittels zumindest einer parallelstrahlungsquelle generiertem strukturierten licht
KR20230174621A (ko) * 2022-06-21 2023-12-28 삼성전자주식회사 깊이 맵 생성을 위한 전자 장치 및 그 동작 방법

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JP6600348B2 (ja) 2014-07-08 2019-10-30 フェイスブック・テクノロジーズ・リミテッド・ライアビリティ・カンパニー 構造化光イメージング用の光パターンを調整するための方法およびシステム

Also Published As

Publication number Publication date
CA2954430A1 (en) 2016-01-14
WO2016005976A2 (en) 2016-01-14
IL249931A0 (en) 2017-03-30
KR102372449B1 (ko) 2022-03-10
CN106716175A (zh) 2017-05-24
EP3167311A4 (en) 2018-01-10
AU2015287252B2 (en) 2019-04-04
WO2016005976A3 (en) 2016-04-07
CN106716175B (zh) 2019-08-02
US10996049B2 (en) 2021-05-04
MX364492B (es) 2019-04-29
EP3167311A2 (en) 2017-05-17
AU2015287252A1 (en) 2017-02-16
US20170199029A1 (en) 2017-07-13
MX2017000193A (es) 2017-09-01
CN110360953A (zh) 2019-10-22
JP2017521660A (ja) 2017-08-03
US20190285405A1 (en) 2019-09-19
KR20170027776A (ko) 2017-03-10
JP6600348B2 (ja) 2019-10-30
AU2015287252C1 (en) 2019-08-22
US10408605B2 (en) 2019-09-10
EP3167311B1 (en) 2019-11-13
EP3627186A1 (en) 2020-03-25

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Legal Events

Date Code Title Description
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B11B Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements