MX364492B - Método y sistema para ajustar el patrón de luz para formación de imágenes de luz estructurada. - Google Patents

Método y sistema para ajustar el patrón de luz para formación de imágenes de luz estructurada.

Info

Publication number
MX364492B
MX364492B MX2017000193A MX2017000193A MX364492B MX 364492 B MX364492 B MX 364492B MX 2017000193 A MX2017000193 A MX 2017000193A MX 2017000193 A MX2017000193 A MX 2017000193A MX 364492 B MX364492 B MX 364492B
Authority
MX
Mexico
Prior art keywords
light
patterned light
adjusted
along
scene
Prior art date
Application number
MX2017000193A
Other languages
English (en)
Other versions
MX2017000193A (es
Inventor
Raz Guy
Original Assignee
Facebook Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Facebook Inc filed Critical Facebook Inc
Publication of MX2017000193A publication Critical patent/MX2017000193A/es
Publication of MX364492B publication Critical patent/MX364492B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • User Interface Of Digital Computer (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)

Abstract

La presente proporciona un sistema y un método para ajustar un patrón de luz. El sistema puede incluir: un transmisor configurado para iluminar una escena con una luz de patrón que se ajusta en función a un criterio predefinido; un receptor configurado para recibir reflejos de la luz de patrón ajustado; y un procesador de computadora configurado para controlar el ajuste de la luz de patrón y además analizar los reflejos recibidos, para producir un mapa de profundidad de objetos dentro de la escena, en donde el transmisor puede incluir: una fuente de luz configurada para producir un haz de luz; un primer reflector que se puede inclinar aproximadamente a lo largo de una línea en un plano x-y en un sistema de coordenadas x-y-z cartesianas; y un segundo reflector que se puede inclinar a lo largo de un eje x en dicho sistema de coordenadas, en donde los reflectores se inclinan a lo largo de sus respectivos ejes hacia adelante y hacia atrás con el fin de desviar el haz de luz para crear la luz de patrón ajustado.
MX2017000193A 2014-07-08 2015-07-07 Método y sistema para ajustar el patrón de luz para formación de imágenes de luz estructurada. MX364492B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462021942P 2014-07-08 2014-07-08
PCT/IL2015/050703 WO2016005976A2 (en) 2014-07-08 2015-07-07 Method and system for adjusting light pattern for structured light imaging

Publications (2)

Publication Number Publication Date
MX2017000193A MX2017000193A (es) 2017-09-01
MX364492B true MX364492B (es) 2019-04-29

Family

ID=55065049

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017000193A MX364492B (es) 2014-07-08 2015-07-07 Método y sistema para ajustar el patrón de luz para formación de imágenes de luz estructurada.

Country Status (11)

Country Link
US (2) US10408605B2 (es)
EP (2) EP3627186A1 (es)
JP (1) JP6600348B2 (es)
KR (1) KR102372449B1 (es)
CN (2) CN106716175B (es)
AU (1) AU2015287252C1 (es)
BR (1) BR112017000460A2 (es)
CA (1) CA2954430A1 (es)
IL (1) IL249931A0 (es)
MX (1) MX364492B (es)
WO (1) WO2016005976A2 (es)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
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EP3627186A1 (en) 2014-07-08 2020-03-25 Facebook Technologies, LLC Method and system for adjusting light pattern for structured light imaging
US11057608B2 (en) 2016-01-04 2021-07-06 Qualcomm Incorporated Depth map generation in structured light system
KR101733228B1 (ko) * 2016-04-28 2017-05-08 주식회사 메디트 구조광을 이용한 3차원 스캐닝 장치
US10241244B2 (en) 2016-07-29 2019-03-26 Lumentum Operations Llc Thin film total internal reflection diffraction grating for single polarization or dual polarization
US10277842B1 (en) * 2016-11-29 2019-04-30 X Development Llc Dynamic range for depth sensing
US11262192B2 (en) 2017-12-12 2022-03-01 Samsung Electronics Co., Ltd. High contrast structured light patterns for QIS sensors
US10740913B2 (en) 2017-12-12 2020-08-11 Samsung Electronics Co., Ltd. Ultrafast, robust and efficient depth estimation for structured-light based 3D camera system
CA3098526C (en) * 2018-05-03 2024-06-04 The Governing Council Of The University Of Toronto Method and system for optimizing depth imaging
US11995851B2 (en) * 2018-10-04 2024-05-28 Isak Du Preez Optical surface encoder
WO2020186825A1 (zh) * 2019-03-15 2020-09-24 上海图漾信息科技有限公司 深度数据测量头、测量装置和测量方法
CN110763158B (zh) * 2019-10-09 2021-06-04 天津大学 镜像h型钢轮廓尺寸测量装置
EP3839483B1 (en) 2019-12-19 2023-07-26 Imec VZW An illuminator, an imaging apparatus and a system
WO2023041706A1 (de) * 2021-09-17 2023-03-23 OQmented GmbH Verfahren und vorrichtung zur messung von tiefeninformationen einer szene anhand von mittels zumindest einer parallelstrahlungsquelle generiertem strukturierten licht
KR20230174621A (ko) * 2022-06-21 2023-12-28 삼성전자주식회사 깊이 맵 생성을 위한 전자 장치 및 그 동작 방법

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JP3656598B2 (ja) * 2001-12-07 2005-06-08 日産自動車株式会社 レーダ装置
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EP3627186A1 (en) 2014-07-08 2020-03-25 Facebook Technologies, LLC Method and system for adjusting light pattern for structured light imaging

Also Published As

Publication number Publication date
CN106716175B (zh) 2019-08-02
EP3167311B1 (en) 2019-11-13
MX2017000193A (es) 2017-09-01
US10408605B2 (en) 2019-09-10
JP2017521660A (ja) 2017-08-03
IL249931A0 (en) 2017-03-30
JP6600348B2 (ja) 2019-10-30
AU2015287252C1 (en) 2019-08-22
WO2016005976A3 (en) 2016-04-07
AU2015287252A1 (en) 2017-02-16
EP3167311A2 (en) 2017-05-17
US20170199029A1 (en) 2017-07-13
EP3167311A4 (en) 2018-01-10
BR112017000460A2 (pt) 2017-11-07
KR20170027776A (ko) 2017-03-10
WO2016005976A2 (en) 2016-01-14
EP3627186A1 (en) 2020-03-25
CN106716175A (zh) 2017-05-24
AU2015287252B2 (en) 2019-04-04
US20190285405A1 (en) 2019-09-19
CN110360953A (zh) 2019-10-22
KR102372449B1 (ko) 2022-03-10
CA2954430A1 (en) 2016-01-14
US10996049B2 (en) 2021-05-04

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