ES2194897T3 - Procedimiento de deposicion por plasma con regulacion de temperatura del substrato. - Google Patents
Procedimiento de deposicion por plasma con regulacion de temperatura del substrato.Info
- Publication number
- ES2194897T3 ES2194897T3 ES95902666T ES95902666T ES2194897T3 ES 2194897 T3 ES2194897 T3 ES 2194897T3 ES 95902666 T ES95902666 T ES 95902666T ES 95902666 T ES95902666 T ES 95902666T ES 2194897 T3 ES2194897 T3 ES 2194897T3
- Authority
- ES
- Spain
- Prior art keywords
- substrate temperature
- temperature regulation
- plasma deposition
- deposition procedure
- hydrogen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000008021 deposition Effects 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 title abstract 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical class [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 abstract 2
- 229910052739 hydrogen Inorganic materials 0.000 abstract 2
- 239000001257 hydrogen Substances 0.000 abstract 2
- 229910045601 alloy Inorganic materials 0.000 abstract 1
- 239000000956 alloy Substances 0.000 abstract 1
- 230000015556 catabolic process Effects 0.000 abstract 1
- 230000002596 correlated effect Effects 0.000 abstract 1
- 238000006731 degradation reaction Methods 0.000 abstract 1
- 238000005137 deposition process Methods 0.000 abstract 1
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/206—Particular processes or apparatus for continuous treatment of the devices, e.g. roll-to roll processes, multi-chamber deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
- H01L31/204—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table including AIVBIV alloys, e.g. SiGe, SiC
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Photovoltaic Devices (AREA)
- Manufacturing Of Electric Cables (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Abstract
EN UN PROCESO DE DEPOSICION POR DESCARGA DE INCANDESCENCIA PARA LA PREPARACION DE ALEACIONES SEMICONDUCTORAS DEL GRUPO IV, HIDROGENADAS, EL SUSTRATO SE MANTIENE A UNA TEMPERATURA QUE SE CORRELACIONA POSITIVAMENTE CON LA VELOCIDAD DE DEPOSICION Y QUE ES SUFICIENTEMENTE ALTA PARA IMPARTIR UNA ENERGIA CINETICA A LA CAPA PARA ACTIVAR LA ELIMINACION DE MORFOLOGIA INDESEABLES., PERO SUFICIENTEMENTE BAJA PARA EVITAR LA DEGRADACION DE LA CAPA CAUSADA POR LA PERDIDA EXCESIVA DE HIDROGENO.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/157,322 US5476798A (en) | 1992-06-29 | 1993-11-26 | Plasma deposition process with substrate temperature control |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2194897T3 true ES2194897T3 (es) | 2003-12-01 |
Family
ID=22563238
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES95902666T Expired - Lifetime ES2194897T3 (es) | 1993-11-26 | 1994-11-21 | Procedimiento de deposicion por plasma con regulacion de temperatura del substrato. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5476798A (es) |
EP (1) | EP0681743B1 (es) |
JP (1) | JP3936391B2 (es) |
ES (1) | ES2194897T3 (es) |
WO (1) | WO1995015012A1 (es) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6391690B2 (en) * | 1995-12-14 | 2002-05-21 | Seiko Epson Corporation | Thin film semiconductor device and method for producing the same |
US6274461B1 (en) * | 1998-08-20 | 2001-08-14 | United Solar Systems Corporation | Method for depositing layers of high quality semiconductor material |
US6265288B1 (en) * | 1998-10-12 | 2001-07-24 | Kaneka Corporation | Method of manufacturing silicon-based thin-film photoelectric conversion device |
US6468829B2 (en) | 2000-05-16 | 2002-10-22 | United Solar Systems Corporation | Method for manufacturing high efficiency photovoltaic devices at enhanced depositions rates |
JP4240933B2 (ja) * | 2002-07-18 | 2009-03-18 | キヤノン株式会社 | 積層体形成方法 |
US7902049B2 (en) * | 2004-01-27 | 2011-03-08 | United Solar Ovonic Llc | Method for depositing high-quality microcrystalline semiconductor materials |
US20100116334A1 (en) * | 2008-11-07 | 2010-05-13 | United Solar Ovonic Llc | Vhf energized plasma deposition process for the preparation of thin film materials |
US20100116338A1 (en) * | 2008-11-07 | 2010-05-13 | United Solar Ovinic Llc | High quality semiconductor material |
US20100117172A1 (en) * | 2008-11-07 | 2010-05-13 | United Solar Ovonic Llc | Thin film semiconductor alloy material prepared by a vhf energized plasma deposition process |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4492810A (en) * | 1978-03-08 | 1985-01-08 | Sovonics Solar Systems | Optimized doped and band gap adjusted photoresponsive amorphous alloys and devices |
JPS5857757A (ja) * | 1981-10-01 | 1983-04-06 | Seiko Epson Corp | 非晶質シリコン太陽電池の製造方法 |
US4517223A (en) * | 1982-09-24 | 1985-05-14 | Sovonics Solar Systems | Method of making amorphous semiconductor alloys and devices using microwave energy |
US4701343A (en) * | 1982-09-24 | 1987-10-20 | Energy Conversion Devices, Inc. | Method of depositing thin films using microwave energy |
US4504518A (en) * | 1982-09-24 | 1985-03-12 | Energy Conversion Devices, Inc. | Method of making amorphous semiconductor alloys and devices using microwave energy |
US4515107A (en) * | 1982-11-12 | 1985-05-07 | Sovonics Solar Systems | Apparatus for the manufacture of photovoltaic devices |
US4721663A (en) * | 1985-08-26 | 1988-01-26 | Energy Conversion Devices, Inc. | Enhancement layer for negatively charged electrophotographic devices |
US4713309A (en) * | 1985-08-26 | 1987-12-15 | Energy Conversion Devices, Inc. | Enhancement layer for positively charged electrophotographic devices and method for decreasing charge fatigue through the use of said layer |
US4729341A (en) * | 1985-09-18 | 1988-03-08 | Energy Conversion Devices, Inc. | Method and apparatus for making electrophotographic devices |
JPS62271418A (ja) * | 1986-05-20 | 1987-11-25 | Matsushita Electric Ind Co Ltd | 非晶質シリコン半導体素子の製造方法 |
JPS62279304A (ja) * | 1986-05-28 | 1987-12-04 | Sumitomo Electric Ind Ltd | 光導波層の製造方法 |
DE3742110C2 (de) * | 1986-12-12 | 1996-02-22 | Canon Kk | Verfahren zur Bildung funktioneller aufgedampfter Filme durch ein chemisches Mikrowellen-Plasma-Aufdampfverfahren |
JPH01152765A (ja) * | 1987-12-10 | 1989-06-15 | Matsushita Electric Ind Co Ltd | 非晶質シリコン太陽電池の製造方法 |
JPH0387372A (ja) * | 1988-07-22 | 1991-04-12 | Canon Inc | 堆積膜形成方法 |
KR910007465B1 (ko) * | 1988-10-27 | 1991-09-26 | 삼성전관 주식회사 | 비정질 실리콘 태양전지의 제조방법 |
JP2846651B2 (ja) * | 1989-03-31 | 1999-01-13 | 三洋電機株式会社 | 光起電力装置 |
US5114770A (en) * | 1989-06-28 | 1992-05-19 | Canon Kabushiki Kaisha | Method for continuously forming functional deposited films with a large area by a microwave plasma cvd method |
US5194398A (en) * | 1989-06-28 | 1993-03-16 | Mitsui Toatsu Chemicals, Inc. | Semiconductor film and process for its production |
AU632241B2 (en) * | 1990-09-06 | 1992-12-17 | Mitsui Toatsu Chemicals Inc. | Amorphous silicon solar cell and method for manufacturing the same |
JPH04329881A (ja) * | 1991-05-01 | 1992-11-18 | Canon Inc | マイクロ波プラズマcvd法による堆積膜形成装置 |
US5204272A (en) * | 1991-12-13 | 1993-04-20 | United Solar Systems Corporation | Semiconductor device and microwave process for its manufacture |
US5256576A (en) * | 1992-02-14 | 1993-10-26 | United Solar Systems Corporation | Method of making pin junction semiconductor device with RF deposited intrinsic buffer layer |
-
1993
- 1993-11-26 US US08/157,322 patent/US5476798A/en not_active Expired - Lifetime
-
1994
- 1994-11-21 JP JP51518995A patent/JP3936391B2/ja not_active Expired - Fee Related
- 1994-11-21 ES ES95902666T patent/ES2194897T3/es not_active Expired - Lifetime
- 1994-11-21 EP EP95902666A patent/EP0681743B1/en not_active Expired - Lifetime
- 1994-11-21 WO PCT/US1994/013478 patent/WO1995015012A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US5476798A (en) | 1995-12-19 |
EP0681743A4 (en) | 1997-08-13 |
EP0681743A1 (en) | 1995-11-15 |
JP3936391B2 (ja) | 2007-06-27 |
WO1995015012A1 (en) | 1995-06-01 |
EP0681743B1 (en) | 2003-03-26 |
JPH08506455A (ja) | 1996-07-09 |
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