ES2051575T3 - Circuito de medicion de la corriente en un transistor mos de potencia. - Google Patents

Circuito de medicion de la corriente en un transistor mos de potencia.

Info

Publication number
ES2051575T3
ES2051575T3 ES91420005T ES91420005T ES2051575T3 ES 2051575 T3 ES2051575 T3 ES 2051575T3 ES 91420005 T ES91420005 T ES 91420005T ES 91420005 T ES91420005 T ES 91420005T ES 2051575 T3 ES2051575 T3 ES 2051575T3
Authority
ES
Spain
Prior art keywords
power transistor
current measurement
measurement circuit
mos power
transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES91420005T
Other languages
English (en)
Inventor
Carlo Cini
Domenico Rossi
Marc Simon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SGS THOMSON MICROELECTRONICS
Continental Automotive France SAS
STMicroelectronics SRL
Original Assignee
SGS THOMSON MICROELECTRONICS
Siemens Automotive SA
SGS Thomson Microelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS THOMSON MICROELECTRONICS, Siemens Automotive SA, SGS Thomson Microelectronics SRL filed Critical SGS THOMSON MICROELECTRONICS
Application granted granted Critical
Publication of ES2051575T3 publication Critical patent/ES2051575T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage
    • G01R19/15—Indicating the presence of current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2644—Adaptations of individual semiconductor devices to facilitate the testing thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Electronic Switches (AREA)

Abstract

LA PRESENTE INVENCION CONCIERNE A UN CIRCUITO DE MEDIDA DE CORRIENTE EN UN TRANSISTOR MOS DE POTENCIA (MO), INCLUYENDO SEGUNDAS (M1) Y TERCERAS (M2) TRANSISTORES EN SERIE DEL MISMO TIPO Y DE LA MISMA TECNOLOGIA, PERO DE SUPERFICIE MAS PEQUEÑA QUE EL TRANSISTOR DE POTENCIA Y DISPUESTOS PARALELAMENTE SOBRE EL, ESTOS DOS TRANSISTORES EN SERIE TENIENDO SUS REDES CONECTADAS A LA RED DEL TRANSISTOR DE POTENCIA, Y LOS MEDIOS DE MEDIDA DE CORRIENTE EN LAS REDES DE LOS DOS TRANSISTORES (M2) QUE ESTAN UNIDOS AL ELECTRODO DE REFERENCIA DEL TRANSISTOR DE POTENCIA.
ES91420005T 1990-01-09 1991-01-07 Circuito de medicion de la corriente en un transistor mos de potencia. Expired - Lifetime ES2051575T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9000401A FR2656932B1 (fr) 1990-01-09 1990-01-09 Circuit de mesure du courant dans un transistor mos de puissance.

Publications (1)

Publication Number Publication Date
ES2051575T3 true ES2051575T3 (es) 1994-06-16

Family

ID=9392771

Family Applications (1)

Application Number Title Priority Date Filing Date
ES91420005T Expired - Lifetime ES2051575T3 (es) 1990-01-09 1991-01-07 Circuito de medicion de la corriente en un transistor mos de potencia.

Country Status (7)

Country Link
US (1) US5287055A (es)
EP (1) EP0438363B1 (es)
JP (1) JP2961900B2 (es)
KR (1) KR100193212B1 (es)
DE (1) DE69101386T2 (es)
ES (1) ES2051575T3 (es)
FR (1) FR2656932B1 (es)

Families Citing this family (31)

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Publication number Priority date Publication date Assignee Title
DE19520735C2 (de) * 1995-06-07 1999-07-01 Siemens Ag Schaltungsanordnung zum Erfassen des Laststroms eines Leistungs-Halbleiterbauelementes mit sourceseitiger Last
JP2822951B2 (ja) * 1995-08-28 1998-11-11 日本電気株式会社 絶縁ゲート電界効果トランジスタの評価素子とそれを用いた評価回路および評価方法
EP0869370B1 (en) * 1997-04-01 2003-07-02 STMicroelectronics S.r.l. Means for testing a gate oxide
DE19722872B4 (de) * 1997-05-31 2006-09-28 Robert Bosch Gmbh Schaltung zur Messung des Elektrodenstroms eines keramischen Gassensors
DE19729904A1 (de) * 1997-07-12 1999-02-11 Kammerer Gmbh M Schaltungsanordnung zur Überwachung von durch eine Last fließenden Strömen
US6949916B2 (en) * 2002-11-12 2005-09-27 Power-One Limited System and method for controlling a point-of-load regulator
US7394445B2 (en) * 2002-11-12 2008-07-01 Power-One, Inc. Digital power manager for controlling and monitoring an array of point-of-load regulators
US7456617B2 (en) * 2002-11-13 2008-11-25 Power-One, Inc. System for controlling and monitoring an array of point-of-load regulators by a host
US7882372B2 (en) * 2002-12-21 2011-02-01 Power-One, Inc. Method and system for controlling and monitoring an array of point-of-load regulators
US7266709B2 (en) * 2002-12-21 2007-09-04 Power-One, Inc. Method and system for controlling an array of point-of-load regulators and auxiliary devices
US7249267B2 (en) * 2002-12-21 2007-07-24 Power-One, Inc. Method and system for communicating filter compensation coefficients for a digital power control system
US7673157B2 (en) 2002-12-21 2010-03-02 Power-One, Inc. Method and system for controlling a mixed array of point-of-load regulators through a bus translator
US7836322B2 (en) * 2002-12-21 2010-11-16 Power-One, Inc. System for controlling an array of point-of-load regulators and auxiliary devices
US7737961B2 (en) * 2002-12-21 2010-06-15 Power-One, Inc. Method and system for controlling and monitoring an array of point-of-load regulators
US7743266B2 (en) * 2002-12-21 2010-06-22 Power-One, Inc. Method and system for optimizing filter compensation coefficients for a digital power control system
US7373527B2 (en) * 2002-12-23 2008-05-13 Power-One, Inc. System and method for interleaving point-of-load regulators
US7710092B2 (en) * 2003-02-10 2010-05-04 Power-One, Inc. Self tracking ADC for digital power supply control systems
US7080265B2 (en) * 2003-03-14 2006-07-18 Power-One, Inc. Voltage set point control scheme
US7372682B2 (en) 2004-02-12 2008-05-13 Power-One, Inc. System and method for managing fault in a power system
DE102004014731B4 (de) 2004-03-25 2007-05-03 Infineon Technologies Ag Mess-Schaltung für den Ausgang eines Leistungsverstärkers sowie ein die Mess-Schaltung umfassender Leistungsverstärker
US7141956B2 (en) * 2005-03-18 2006-11-28 Power-One, Inc. Digital output voltage regulation circuit having first control loop for high speed and second control loop for high accuracy
US7554310B2 (en) * 2005-03-18 2009-06-30 Power-One, Inc. Digital double-loop output voltage regulation
US7327149B2 (en) * 2005-05-10 2008-02-05 Power-One, Inc. Bi-directional MOS current sense circuit
JP4542972B2 (ja) * 2005-09-12 2010-09-15 セイコーＮｐｃ株式会社 過電流検出回路及びそれを用いた電源装置
KR100836900B1 (ko) * 2007-02-09 2008-06-11 한양대학교 산학협력단 전류 감지 회로
US7834613B2 (en) * 2007-10-30 2010-11-16 Power-One, Inc. Isolated current to voltage, voltage to voltage converter
EP2515126A1 (en) * 2011-04-19 2012-10-24 Dialog Semiconductor GmbH Bidirectional current sense
US10041982B2 (en) * 2012-08-15 2018-08-07 Texas Instruments Incorporated Switch mode power converter current sensing apparatus and method
US9429598B2 (en) * 2014-06-30 2016-08-30 Infineon Technologies Ag Current measurement and control of a semiconductor element based on the current measurement in a power semiconductor arrangement
FR3034873B1 (fr) 2015-04-10 2017-04-07 Nexter Electronics Dispositif de mesure d'un courant dans un circuit electrique
CN114325062B (zh) * 2022-03-10 2022-06-10 杭州飞仕得科技有限公司 一种功率模组的电流测试方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54101679A (en) * 1978-01-27 1979-08-10 Nec Corp Inspection unit for life of semiconductor device
JPS5950943B2 (ja) * 1978-12-11 1984-12-11 沖電気工業株式会社 電子部品の動作試験回路
US4518869A (en) * 1982-12-21 1985-05-21 Motorola, Inc. Resistance comparator for switch detection
US4588950A (en) * 1983-11-15 1986-05-13 Data Probe Corporation Test system for VLSI digital circuit and method of testing
JPS6164135A (ja) * 1984-09-05 1986-04-02 Matsushita Electric Ind Co Ltd 半導体解析装置
JPS6215475A (ja) * 1985-07-15 1987-01-23 Oki Electric Ind Co Ltd トランジスタの破壊検出表示回路
US4789825A (en) * 1986-05-14 1988-12-06 American Telephone And Telegraph Co., At&T Bell Laboratories Integrated circuit with channel length indicator
ES2012483B3 (es) * 1986-05-14 1990-04-01 American Telephone & Telegraph Company Circuito integrado con indicador de longitud de canal.
JPH0234076A (ja) * 1988-07-25 1990-02-05 Toshiba Corp 留守番電話装置
JPH0770572B2 (ja) * 1988-10-13 1995-07-31 松下電器産業株式会社 信号試験回路
US5013935A (en) * 1989-12-18 1991-05-07 Motorola, Inc. CMOS level detctor circuit

Also Published As

Publication number Publication date
EP0438363A1 (fr) 1991-07-24
FR2656932B1 (fr) 1992-05-07
KR910014712A (ko) 1991-08-31
DE69101386D1 (de) 1994-04-21
FR2656932A1 (fr) 1991-07-12
US5287055A (en) 1994-02-15
DE69101386T2 (de) 1994-10-20
JPH05223887A (ja) 1993-09-03
KR100193212B1 (ko) 1999-06-15
JP2961900B2 (ja) 1999-10-12
EP0438363B1 (fr) 1994-03-16

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