JPS54101679A - Inspection unit for life of semiconductor device - Google Patents
Inspection unit for life of semiconductor deviceInfo
- Publication number
- JPS54101679A JPS54101679A JP855478A JP855478A JPS54101679A JP S54101679 A JPS54101679 A JP S54101679A JP 855478 A JP855478 A JP 855478A JP 855478 A JP855478 A JP 855478A JP S54101679 A JPS54101679 A JP S54101679A
- Authority
- JP
- Japan
- Prior art keywords
- state
- semiconductor device
- binary
- life
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To detect faults such as tentative opening and short-circuit of a smaple semiconductor device and count the number of detection times in the life inspection of semiconductor devices.
CONSTITUTION: In case that measured transistor Qn generates characteristic fluctuation from a normal state and the current is reduced rapidly, the potential difference between both ends of resistance Rn is reduced rapidly, and a binary is set to counter 3 through a differentiating circuit consisting of C0 and R0, and the display according to this state is performed on display part 4. Next, in case that transistor Qn restores and the current increases rapidly, a negative pulse is inputted to Q0, and a binary is set to the counter through D2, and the display according to this state is performed on display part 4. Thus, the number of characteristic change times and normal characteristic restoration times is always displayed.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP855478A JPS54101679A (en) | 1978-01-27 | 1978-01-27 | Inspection unit for life of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP855478A JPS54101679A (en) | 1978-01-27 | 1978-01-27 | Inspection unit for life of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54101679A true JPS54101679A (en) | 1979-08-10 |
Family
ID=11696327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP855478A Pending JPS54101679A (en) | 1978-01-27 | 1978-01-27 | Inspection unit for life of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54101679A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5287055A (en) * | 1990-01-09 | 1994-02-15 | Siemens Automotive S.A. | Circuit for measuring current in a power MOS transistor |
-
1978
- 1978-01-27 JP JP855478A patent/JPS54101679A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5287055A (en) * | 1990-01-09 | 1994-02-15 | Siemens Automotive S.A. | Circuit for measuring current in a power MOS transistor |
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