ES2012483B3 - Circuito integrado con indicador de longitud de canal. - Google Patents
Circuito integrado con indicador de longitud de canal.Info
- Publication number
- ES2012483B3 ES2012483B3 ES87303983T ES87303983T ES2012483B3 ES 2012483 B3 ES2012483 B3 ES 2012483B3 ES 87303983 T ES87303983 T ES 87303983T ES 87303983 T ES87303983 T ES 87303983T ES 2012483 B3 ES2012483 B3 ES 2012483B3
- Authority
- ES
- Spain
- Prior art keywords
- integrated circuit
- channel length
- length indicator
- indicator
- channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/92—Capacitors having potential barriers
- H01L29/94—Metal-insulator-semiconductors, e.g. MOS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US86309486A | 1986-05-14 | 1986-05-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2012483B3 true ES2012483B3 (es) | 1990-04-01 |
Family
ID=25340235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES87303983T Expired - Lifetime ES2012483B3 (es) | 1986-05-14 | 1987-05-05 | Circuito integrado con indicador de longitud de canal. |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP0249325B1 (es) |
JP (1) | JPS62274635A (es) |
KR (1) | KR900007045B1 (es) |
CA (1) | CA1252911A (es) |
DE (1) | DE3761711D1 (es) |
ES (1) | ES2012483B3 (es) |
IE (1) | IE59931B1 (es) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5068603A (en) * | 1987-10-07 | 1991-11-26 | Xilinx, Inc. | Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays |
FR2656932B1 (fr) * | 1990-01-09 | 1992-05-07 | Sgs Thomson Microelectronics | Circuit de mesure du courant dans un transistor mos de puissance. |
US5761214A (en) * | 1992-10-16 | 1998-06-02 | International Business Machines Corporation | Method for testing integrated circuit devices |
JPH0794683A (ja) * | 1993-09-27 | 1995-04-07 | Nec Corp | 自己診断機能を有する半導体集積回路装置 |
JP3011095B2 (ja) * | 1996-03-15 | 2000-02-21 | 日本電気株式会社 | 自己診断機能を有する半導体集積回路装置 |
JP3214556B2 (ja) | 1998-08-25 | 2001-10-02 | 日本電気株式会社 | 集積回路装置、半導体ウェハ、回路検査方法 |
DE10001129A1 (de) * | 2000-01-13 | 2001-07-26 | Infineon Technologies Ag | Schaltungsanordnung zur Kapazitätsmessung von Strukturen in einer integrierten Schaltung |
JP2005057256A (ja) * | 2003-08-04 | 2005-03-03 | Samsung Electronics Co Ltd | 漏洩電流を利用した半導体検査装置および漏洩電流補償システム |
-
1987
- 1987-05-05 DE DE8787303983T patent/DE3761711D1/de not_active Expired - Fee Related
- 1987-05-05 ES ES87303983T patent/ES2012483B3/es not_active Expired - Lifetime
- 1987-05-05 EP EP87303983A patent/EP0249325B1/en not_active Expired - Lifetime
- 1987-05-11 KR KR1019870004585A patent/KR900007045B1/ko not_active IP Right Cessation
- 1987-05-12 CA CA000536955A patent/CA1252911A/en not_active Expired
- 1987-05-13 IE IE124387A patent/IE59931B1/en not_active IP Right Cessation
- 1987-05-14 JP JP62116028A patent/JPS62274635A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0325937B2 (es) | 1991-04-09 |
EP0249325A1 (en) | 1987-12-16 |
DE3761711D1 (de) | 1990-03-15 |
IE59931B1 (en) | 1994-05-04 |
KR870011703A (ko) | 1987-12-26 |
KR900007045B1 (ko) | 1990-09-27 |
EP0249325B1 (en) | 1990-02-07 |
JPS62274635A (ja) | 1987-11-28 |
CA1252911A (en) | 1989-04-18 |
IE871243L (en) | 1987-11-14 |
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