EP4081485A1 - Herstellung von moo2cl2 - Google Patents
Herstellung von moo2cl2Info
- Publication number
- EP4081485A1 EP4081485A1 EP21819495.9A EP21819495A EP4081485A1 EP 4081485 A1 EP4081485 A1 EP 4081485A1 EP 21819495 A EP21819495 A EP 21819495A EP 4081485 A1 EP4081485 A1 EP 4081485A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- m0o2cl2
- moo2cl2
- temperature
- icp
- molybdenum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G39/00—Compounds of molybdenum
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G39/00—Compounds of molybdenum
- C01G39/04—Halides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D7/00—Sublimation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/20—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional [3D] arrangements, e.g. with cells on different height levels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional [3D] arrangements, e.g. with cells on different height levels
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/80—Compositional purity
Definitions
- the invention relates to methods for producing molybdenum dioxide dichloride (M0O2CI2) and M0O2CI2 obtainable by such methods, its use and electronic components.
- M0O2CI2 molybdenum dioxide dichloride
- Layers containing molybdenum are often used in electronic components, e.g. in so-called flash memories. Such layers containing molybdenum are often produced by means of gas phase deposition. In such a gas phase deposition, M0O2Cl2 is increasingly being used as a precursor for the molybdenum. In order to achieve advantageous electronic properties of the layers containing molybdenum, the use of particularly pure M0O2Cl2 is desirable. In particular, the M0O2CI2 should be as free as possible from metallic impurities that can impair the electronic properties. Particular attention is paid to tungsten as an impurity, since tungsten can particularly impair the electronic properties of a layer containing molybdenum. Accordingly, an M0O2Cl2 that is as tungsten-free as possible is particularly desirable.
- M0O2Cl2 The production of M0O2Cl2 is known per se.
- Schrock et al. J. Am. Chem. Soc., 1990, 1 12, 3875-3886
- M0O2Cl2 molybdenum oxide
- Cl2 chlorine gas
- CN 102632245 A discloses a method for producing molydenum powder, in which M0O2CI2 is formed as an intermediate by the reaction of M0O2 with Cl2. No information is given on the atmosphere under which the reaction is carried out. No information is given on the purity of the M0O2CI2 produced as an intermediate.
- the intermediately produced M0O2CI2 is subsequently treated with ammonia water converted to ammonium paramolybdate. This is converted into molybdenum(VI) oxide (M0O3), from which molydenum powder is ultimately obtained.
- EP 3 656 741 A1 discloses a process for preparing molybdenum oxychlorides from a molydenum oxide and Cl 2 under reduced pressure.
- the molybdenum oxychlorides produced also include molybdenum oxytrichloride (M0OCI3) and molybdenum oxytetrachloride (M0OCI4).
- M0O2CI2 is produced by reacting M0O3 with CI2. The purity of the M0O2CI2 produced is limited to 99.9995% by weight.
- the object of the invention is to provide a method for producing MOO2Cl2 which at least partially and if possible completely overcomes the disadvantages of the prior art.
- a further object of the invention is to provide a method for producing a molybdenum-containing layer which at least partially and if possible completely overcomes the disadvantages of the prior art.
- M0O2Cl2 which at least partially and as completely as possible overcomes the disadvantages of the prior art, and in particular to provide M0O2Cl2 with improved purity. It is also an object of the invention to provide a use of MOO2Cl2 as a precursor for the production of a molybdenum-containing layer which at least partially and if possible completely overcomes the disadvantages of the prior art.
- the subject matter of the invention is a process for the production of M0O2CI2 under inert conditions, comprising the steps:
- the process according to the invention is carried out under inert conditions and is preferably carried out continuously under inert conditions. Apart from the Cl2 supplied in step (ii), the process is thus carried out with the exclusion of other reactive gases or substances. Accordingly, the process is preferably carried out with the exclusion of oxygen and/or the exclusion of air and/or the exclusion of water. Particularly preferably, the process is carried out in an atmosphere of pure Cl2 or in an atmosphere of a Cl2-N2 mixture.
- the process according to the invention is also carried out with M0O2 as the only molydenum-containing and/or only oxidic starting material. In particular, no other molydene oxide such as MoO or MoO3 is used in the method according to the invention.
- the submitted M0O2 may contain impurities, especially metallic impurities such as tungsten (W). It is also preferred according to the invention that, in addition to M0O2Cl2, no other molybdenum oxychloride is produced in the method according to the invention, in particular no MOOCI3 and/or no MOOCI4.
- the purity of the M0O2Cl2 recovered in step (v) is determined by means of coupled ICP-OES/MS.
- An inductively coupled plasma (ICP, "inductively coupled plasma”) is used as the excitation source.
- ICP inductively coupled plasma
- the M0O2CI2 is introduced into an inert gas flow (e.g. argon flow), to which high-frequency energy is then transferred by inductive coupling without electrodes.
- the frequencies used for this are typically in the range of 25 and 100 MHz.
- the generators used typically have outputs between 1 and 10 kW.
- the flow of inert gas heats up to temperatures of typically up to 10000 K.
- the M0O2CI2 is thereby atomized or ionized.
- the resulting free atoms and/or ions are analyzed both optically using atomic emission spectrometry (OES; "Optical Emission Spectrometry”) and using mass spectrometry (MS).
- OFES atomic emission spect
- ICP-OES optical emission spectrometry with inductively coupled plasma
- ICP-AES ICP atomic spectrometry
- the solution to be measured is atomized as described above and the aerosol formed is introduced into a high-frequency plasma in which the components of the solution are atomized and partially ionized.
- the characteristic emission lines of the atoms and ions are resolved with a monochromator or polychromator and the line intensities are recorded with a suitable detector.
- the measurement can be carried out axially and/or radially. According to the invention, the measurement is preferably carried out axially, since the axial measurement is more sensitive.
- a calibration with suitable standard solutions can be carried out for quantitative determination, as there is a linear relationship between the signal intensities of the emission and the concentrations of an element.
- ICP-MS mass spectrometry with inductively coupled plasma
- elements in solutions can be regularly detected and quantified.
- the solution to be measured is atomized as described above and introduced into a high-frequency plasma in which the components of the solution are atomized and ionized.
- the ions are extracted from the high-frequency plasma using a pinhole system and separated according to their mass/charge ratio. After separation, they are registered in a detector and the resulting signals are evaluated by the device software.
- a quantitative determination is possible after calibration with standard solutions, since there is a linear relationship between the signal intensities of the ions and the concentrations of an element.
- the measuring principle of the ICP-MS of DIN EN ISO 17294-2: 2017-01 water quality - application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 2: Determination of selected elements including uranium isotopes (IS0 17294-2:2016); German version EN IS0 17294-2:2016) and/or the guideline for chemical analysis, determination of element levels in environmental samples by ICP-MS, Fraunhofer Institute for Molecular Biology and Applied Ecology, Auf dem Aberg 1 , D-57392 Schmallenberg follows.
- ICP-MS inductively coupled plasma mass spectrometry
- the coupling of the two analysis methods OES and MS makes it possible to analyze a wide range of elements. For example, lighter elements are more difficult to determine with OES. However, the simultaneous use of MS allows their determination. It is therefore necessary to link the analysis methods.
- the proportions of elements determined with the two analysis methods are consistent for the same elements, ie they deliver the same results within the usual measurement accuracies. According to the invention, it is preferred that devices from Thermo Fischer with the type designations iCap, iCap Duo or iCap RQ are used for the coupled ICP-OES/MS.
- impurities in the recovered M0O2CI2 in particular metallic impurities such as tungsten, can be determined in the ppb range ("parts per billion" billionths).
- the ppb values or ppb limits given here correspond to the respective detection limit of the impurities.
- M0O2Cl2 With the method according to the invention, particularly pure M0O2Cl2 can be produced, in particular M0O2Cl2 with a low tungsten content can be produced. According to the invention, it is preferred that the purity of the MOO 2 Cl 2 recovered in step (v) is 99.99969% by weight or more. Molybdenum-containing layers with further improved electronic properties can be produced with such pure M0O2Cl2.
- the solid MOO2Cl2 recovered in step (v) has a tungsten content, again determined by ICP-OES/MS, of ⁇ 200 ppb and particularly preferably of ⁇ 50 ppb.
- Tungsten as an impurity can particularly affect the electronic properties of molybdenum-containing layers. Such impairments can be avoided and the electronic properties further improved by the low tungsten contents according to the invention.
- the M0O2Cl2 may also contain very small amounts of other impurities, in particular (semi)metallic impurities such as Ag, Al, Au, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cu, Fe, Ga, Ge, Hf, In, Ir, K, La, Li, Mg, Mn, Na, Nb, Ni, Pb, Pd, Pt, Rb, Rh, Ru, Sb, Se, Sn, Sr, Te, Th, Ti, TI, U, V, W, Zn and Zr.
- impurities in particular (semi)metallic impurities such as Ag, Al, Au, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cu, Fe, Ga, Ge, Hf, In, Ir, K, La, Li, Mg, Mn, Na, Nb, Ni, Pb, Pd, Pt, Rb, Rh, Ru, Sb, Se, Sn, Sr, Te, Th,
- the M0O2Cl2 recovered in step (v) has a content of ⁇ 300 ppb, more preferably ⁇ 200 ppb, even more preferably ⁇ 100 ppb, particularly preferably ⁇ 50 ppb and most preferably ⁇ 20 ppb.
- the electronic properties of layers containing molybdenum obtained therefrom can be further improved by the low contents of such impurities in the M0O2Cl2 according to the invention.
- the first temperature Ti is >170°C, more preferably >170 to ⁇ 600°C, even more preferably >200 to ⁇ 500°C, particularly preferably >350 to ⁇ 450° C and most preferably 400°C.
- the reaction vessel it is also possible for the reaction vessel to be divided into different physical and/or theoretical reaction zones in which the temperature Ti is set differently within the temperature ranges mentioned above.
- step (ii) preference is given to using a reaction vessel whose temperature can be controlled or regulated.
- a reaction vessel whose temperature can be controlled or regulated.
- a rotary kiln a static kiln or a drop tube kiln is used.
- the second temperature T2 ⁇ 160°C, more preferably >10 to ⁇ 120°C, even more preferably >20 to ⁇ 90°C, particularly preferably >25 to ⁇ 70° C and most preferably 70°C.
- T2 the second temperature T2 ⁇ 160°C, more preferably >10 to ⁇ 120°C, even more preferably >20 to ⁇ 90°C, particularly preferably >25 to ⁇ 70° C and most preferably 70°C.
- the second temperature T2 between the beginning and the end of the method according to the invention. It is particularly preferred that the temperature T2 in the collecting vessel is higher temperature to a lower temperature, preferably from 90°C up to 20°C, more preferably from 70°C to 25°C. With such a temperature control, a particularly high purity of the M0O2Cl2 can be set during resublimation in step (iv).
- step (iv) preference is given to using a collecting vessel whose temperature can be controlled or regulated.
- a receiving flask is used.
- a cold finger can also be used, on which gaseous M0O2Cl2 resublimates.
- the resublimated M0O2CI2 can be removed from the receiving flask in the usual way or thermally removed from the cold finger.
- the first temperature Ti and the second temperature T 2 are set simultaneously as stated above. Accordingly, the following temperature pairs or temperature profiles are particularly preferred:
- T 2 is 90°C at the start of the process and is lowered to up to 20°C by the end of the process;
- Ti 400°C and T2 is 70°C at the start of the process and is lowered to 25°C by the end of the process.
- step (iii) is carried out at a temperature of >160°C. Such a temperature can prevent premature re-sublimation of M0O2Cl2 and thus increase the yield in the collection vessel.
- the gas flow of the Cl 2 is 0.01 to 1 L/min and more preferably 0.05 to 0.8 L/min. With such a gas stream, a balance can be achieved between increased reaction speed and increased yield on the one hand and unnecessary use of chlorine with a possible subsequent problem of disposal of unused chlorine on the other.
- an inert gas preferably nitrogen (N 2 )
- N 2 nitrogen
- the method according to the invention can be carried out even more reliably under inert conditions.
- the gas flow of the inert gas, in particular of N 2 is 0.05 to 0.4 L/min, more preferably 0.1 to 0.3 L/min and particularly preferably 0.2 L/min
- the choice of gas flow depends on the furnace size and configuration and must be adjusted accordingly. With such a gas flow of inert gas, in particular N 2 , the inert conditions can be maintained even better without using unnecessarily large amounts of inert gas.
- such a gas stream can enable improved transport of the gaseous Mo0 2 Cl 2 from the reaction vessel to the collecting vessel.
- other inert gases can also be used, for example argon (Ar).
- Ar argon
- the use of Ar can lead to a further improved purity of the Mo0 2 Cl 2 .
- the use of N 2 is most preferred because of its lower cost.
- the gas flow of Cl 2 is 0.01 to 1 L/min and more preferably 0.05 to 0.8 L/min and at the same time N 2 with a gas flow of 0.05 to 0.4 L/min and more preferably from 0.1 to 0.3 L/min (0.01 to 1 L/min Cl 2 and 0.05 to 0.4 L/min N 2 ; 0. 05 to 0.8 L/min Cl 2 and 0.05 to 0.4 L/min N 2 , 0.01 to 1 L/min Cl 2 and 0.1 to 0.3 L/min N 2 , or 0.05 to 0.8 L/min Cl 2 and 0.1 to 0.3 L/min N 2 ).
- step (ii) Cl 2 is fed with a gas flow of 0.8 L/min and N 2 with a gas flow of 0.2 L/min.
- reaction vessel, the collecting vessel and, if appropriate, a transition region optionally arranged between the reaction vessel and the collecting vessel are rendered inert before step (i) by flushing with an inert gas, preferably nitrogen.
- inert gas preferably nitrogen.
- inerting is understood to mean, as is customary, the setting of inert conditions in an apparatus.
- the inert conditions of the process according to the invention can be set particularly quickly and efficiently by flushing with an inert gas.
- the method according to the invention does not include a pressure reduction step, in particular no step in which the pressure in the reaction vessel and/or in the collecting vessel is reduced.
- the MOO2Cl2 obtained in step (v) is further purified in a subsequent step (vi) by sublimation and renewed re-sublimation.
- other purification methods such as recrystallization can also be used in step (vi) in order to further purify the M0O2Cl2 obtained in step (v).
- an M0O2CI2 with an even further improved purity can be provided.
- Such a MoO2Cl2 can be converted into a particularly pure molybdenum-containing layer with improved electronic properties in a subsequent process, in particular in a process of gas phase deposition.
- the method according to the invention has no step in which solid MOO2Cl2 produced is processed wet-chemically, in particular no step of reacting solid MOO2CI2 produced with ammonia water.
- Such a reaction would typically produce hydrogen chloride (HCl).
- HCl hydrogen chloride
- the formation of HCl should be avoided according to the invention, however, so that there is no associated disposal problem or the risk of undesired corrosion of the apparatus used, including the reaction vessel and collecting vessel, by the HCl.
- the subject matter of the invention is also a method for producing a molybdenum-containing layer, which comprises a method according to the invention, with subsequent ie after step (v), or if performed after step (vi), the MOO2Cl2 obtained in step (v) or step (vi) is used in a vapor deposition as a precursor to form the molybdenum-containing layer.
- a chemical vapor deposition (CVD) or an atomic layer deposition (ALD) is used for the vapor phase deposition.
- Chemical vapor deposition, or CVD is a gas phase reaction that typically occurs on or near a surface of a substrate.
- the reactants involved in the reaction are simultaneously fed in the form of gases to the substrate to be coated.
- the substrate is arranged in a reaction chamber and is heated.
- the mostly preheated gases are thermally activated by the heated substrate and react with each other.
- the desired material is separated and chemically bound. Chemisorption of the desired material, in the present invention molybdenum, occurs.
- the ALD process also known as atomic layer deposition, is a modified CVD process.
- the reaction or sorption on the surface ends automatically once the surface has been completely covered. This self-limiting reaction is carried out in several cycles, which are limited by intermediate rinsing steps. In this way, very precise layer thicknesses can be achieved.
- M0O2Cl2 which can be obtained by a method according to the invention.
- a M0O2CI2 is a high-purity M0O2CI2 and is particularly suitable as a precursor for the production of high-purity layers containing molybdenum with improved electronic properties, in particular improved storage properties, e.g. when used in flash memories such as a 3D NAND.
- Such an M0O2Cl2 is preferably an M0O2Cl2 with a low water content, particularly preferably an anhydrous or dry M0O2Cl2.
- the invention also relates to MOO2Cl2, which has a purity determined by ICP-OES/MS of 0.9996% by weight or more and more preferably 0.99969% by weight or more. It is particularly preferred that the M0O2Cl2 has a tungsten content determined by ICP-OES/MS of ⁇ 200 ppb, more preferably ⁇ 100 ppb and even more preferably ⁇ 50 ppb.
- M0O2Cl2 is also a high-purity M0O2Cl2 and is particularly suitable as a precursor for the production of high-purity layers containing molybdenum with improved electronic properties, in particular improved storage properties, for example when used in flash memories such as a 3D NAND.
- Such an M0O2Cl2 is preferably an M0O2Cl2 with a low water content, particularly preferably an anhydrous or dry M0O2Cl2.
- the subject matter of the invention is also a use of the M0O2Cl2 obtainable or provided according to the invention as a precursor for the production of a layer containing molybdenum.
- the M0O2Cl2 can be used to produce a layer containing molybdenum by means of gas-phase thin-layer processes such as the CVD or ALD described above.
- the subject matter of the invention is also an electronic component which comprises a layer containing molybdenum produced according to the invention. Due to the improved purity of the M0O2Cl2 provided according to the invention, the molybdenum-containing layer is also particularly pure and is in particular almost or completely free of tungsten impurities. As a result, the electronic component can be equipped with improved electronic properties.
- the electronic component is a so-called 3D NAND.
- 3D NAND is non-volatile memory (“flash memory”) in which multiple memory cells are stacked vertically in multiple layers. The memory cells are connected in series. For example, 16, 32, 64, 96 or 128 memory cells can be connected in order to achieve increased memory density.
- flash memory non-volatile memory
- a layer containing molybdenum produced according to the invention in such a non-volatile memory, its electronic properties can be improved, in particular its memory properties can be improved.
- a rotary kiln with a tube length of 1 m and a tube diameter of 5 cm is used as the reaction vessel.
- the rotary kiln is connected to a product flask as a collecting vessel via a transition area.
- Rotary kiln, transition area and product flask can be heated separately.
- 400 g M0O2 are placed in the rotary kiln.
- An inert gas atmosphere is then created in the entire apparatus by introducing nitrogen (0.4 L/min N 2 ). Thereafter, the rotary kiln is brought to a temperature (Ti) of 400°C, the transition zone to a temperature of 160°C and the product flask to a temperature (T 2 ) of 70°C.
- an N 2 flow of 0.2 L/min is set.
- additional Cl 2 is introduced into the rotary kiln (0.8 L/min Cl 2 ).
- the submitted Mo0 2 is allowed to react with the introduced Cl 2 for two hours (2 h).
- the introduction of Cl 2 and the heating of the rotary kiln and transition area are stopped, and the product flask is allowed to cool to 25°C.
- the N 2 flow is increased to 1 L/min and continued for 30 min.
- the introduction of N 2 is stopped, and the product flask is removed from the apparatus in Ar countercurrent.
- the product flask is introduced into a glove box with an inert gas atmosphere and packaged there.
- the sum of the impurities is thus ⁇ 3070 ppb.
- the M0O2CI2 produced accordingly has a purity of at least 99.9996930% by weight.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP20020649.8A EP4019470A1 (de) | 2020-12-23 | 2020-12-23 | Herstellung von moo2cl2 |
| PCT/EP2021/083966 WO2022135866A1 (de) | 2020-12-23 | 2021-12-02 | Herstellung von moo2cl 2 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4081485A1 true EP4081485A1 (de) | 2022-11-02 |
Family
ID=74003666
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP20020649.8A Withdrawn EP4019470A1 (de) | 2020-12-23 | 2020-12-23 | Herstellung von moo2cl2 |
| EP21819495.9A Pending EP4081485A1 (de) | 2020-12-23 | 2021-12-02 | Herstellung von moo2cl2 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP20020649.8A Withdrawn EP4019470A1 (de) | 2020-12-23 | 2020-12-23 | Herstellung von moo2cl2 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US12466742B2 (de) |
| EP (2) | EP4019470A1 (de) |
| JP (1) | JP7579985B2 (de) |
| KR (1) | KR20230088807A (de) |
| CN (1) | CN116529206A (de) |
| TW (1) | TWI905312B (de) |
| WO (1) | WO2022135866A1 (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20240055305A (ko) * | 2022-10-20 | 2024-04-29 | 에스케이트리켐 주식회사 | 고순도의 이염화이산화몰리브덴 및 이의 제조방법. |
| KR102790268B1 (ko) * | 2023-11-13 | 2025-04-04 | 주식회사 레이크머티리얼즈 | 몰리브덴옥시클로라이드의 제조방법 및 이의 제조장치 |
| KR20250095397A (ko) * | 2023-12-19 | 2025-06-26 | 주식회사 포스코 | 몰리브데늄 옥시할라이드 제조장치 및 방법 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1383849A (fr) | 1963-10-07 | 1965-01-04 | Kuhlmann Ets | Procédé d'extraction du molybdène à l'état de son trioxyde pur, trioxyde de molybdène et molybdène ainsi obtenus |
| JPH0693314A (ja) | 1991-06-05 | 1994-04-05 | Toshiba Corp | 高純度のタングステンまたはモリブデン粉末の製造方法 |
| CN102632245B (zh) | 2012-05-10 | 2014-08-06 | 湖南顶立科技有限公司 | 一种高纯钼粉的制备方法 |
| JP7076999B2 (ja) | 2017-12-14 | 2022-05-30 | 日本エア・リキード合同会社 | 固体材料の前処理方法および固体材料が充填されている固体材料製品を製造する方法 |
| US10710896B2 (en) | 2018-04-30 | 2020-07-14 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Tungsten pentachloride conditioning and crystalline phase manipulation |
| US10287177B1 (en) * | 2018-05-08 | 2019-05-14 | Robert Ten | Method and apparatus for extracting high-purity molybdenum oxide powders and nanopowders from low-grade concentrates |
| EP3656741A4 (de) | 2018-07-25 | 2021-07-28 | JX Nippon Mining & Metals Corporation | Verfahren zur herstellung von molybdänoxidchlorid mit hoher schüttdichte |
| US20200131628A1 (en) * | 2018-10-24 | 2020-04-30 | Entegris, Inc. | Method for forming molybdenum films on a substrate |
| WO2020084852A1 (ja) | 2018-10-25 | 2020-04-30 | Jx金属株式会社 | モリブデンオキシクロライド又はタングステンオキシクロライド及びそれらの製造方法 |
| WO2021171742A1 (ja) | 2020-02-28 | 2021-09-02 | Jx金属株式会社 | 高純度モリブデンオキシクロライド及びその製造方法 |
-
2020
- 2020-12-23 EP EP20020649.8A patent/EP4019470A1/de not_active Withdrawn
-
2021
- 2021-11-16 TW TW110142578A patent/TWI905312B/zh active
- 2021-12-02 EP EP21819495.9A patent/EP4081485A1/de active Pending
- 2021-12-02 KR KR1020237016831A patent/KR20230088807A/ko active Pending
- 2021-12-02 JP JP2023550718A patent/JP7579985B2/ja active Active
- 2021-12-02 WO PCT/EP2021/083966 patent/WO2022135866A1/de not_active Ceased
- 2021-12-02 CN CN202180082125.1A patent/CN116529206A/zh active Pending
- 2021-12-02 US US17/642,688 patent/US12466742B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI905312B (zh) | 2025-11-21 |
| JP2023548433A (ja) | 2023-11-16 |
| US12466742B2 (en) | 2025-11-11 |
| WO2022135866A1 (de) | 2022-06-30 |
| CN116529206A (zh) | 2023-08-01 |
| JP7579985B2 (ja) | 2024-11-08 |
| TW202227366A (zh) | 2022-07-16 |
| US20240083766A1 (en) | 2024-03-14 |
| EP4019470A1 (de) | 2022-06-29 |
| KR20230088807A (ko) | 2023-06-20 |
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