EP3472583A1 - Thermopile infrarot einzelsensor für temperaturmessungen oder zur gasdetektion - Google Patents
Thermopile infrarot einzelsensor für temperaturmessungen oder zur gasdetektionInfo
- Publication number
- EP3472583A1 EP3472583A1 EP17729482.4A EP17729482A EP3472583A1 EP 3472583 A1 EP3472583 A1 EP 3472583A1 EP 17729482 A EP17729482 A EP 17729482A EP 3472583 A1 EP3472583 A1 EP 3472583A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sensor
- thermopile
- individual
- infrared
- thermopile infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000012528 membrane Substances 0.000 claims abstract description 39
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 6
- 239000007789 gas Substances 0.000 claims description 47
- 239000004065 semiconductor Substances 0.000 claims description 15
- 238000001514 detection method Methods 0.000 claims description 12
- 238000001745 non-dispersive infrared spectroscopy Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 229910052732 germanium Inorganic materials 0.000 claims description 6
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 238000005192 partition Methods 0.000 claims description 6
- 238000007781 pre-processing Methods 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 5
- 239000010703 silicon Substances 0.000 claims description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 3
- 229910052787 antimony Inorganic materials 0.000 claims description 3
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 229910052797 bismuth Inorganic materials 0.000 claims description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 3
- 229910052743 krypton Inorganic materials 0.000 claims description 3
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 3
- 229920005591 polysilicon Polymers 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 abstract description 8
- 238000007789 sealing Methods 0.000 abstract 1
- 239000006096 absorbing agent Substances 0.000 description 12
- 239000000758 substrate Substances 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 238000005530 etching Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 238000009412 basement excavation Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0037—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the heat emitted by liquids
- G01J5/004—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the heat emitted by liquids by molten metals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/041—Mountings in enclosures or in a particular environment
- G01J5/045—Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/048—Protective parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
- G01J5/14—Electrical features thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J2005/065—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
- G01J2005/123—Thermoelectric array
Definitions
- Thermopile infrared single sensor for temperature measurements or for gas detection
- thermopile single sensor for temperature measurements or gas detection in monolithic Si micromechanical technology in a filled with a gas medium housing with optics and one or more
- Infrared-sensitive areas are spanned by in each case at least one beam over a cavity in a good heat-conducting support body.
- DE 101 44 342 A1 shows a thermopile sensor chip which, with vertical or nearly vertical walls, has the largest possible membrane as an IR-receiving surface in order to maximize the signal to be received on the membrane with an IR-sensitive surface.
- the membrane is clamped over a recess in a silicon support body, which is also designed as a heat sink.
- thermopile elements whose hot ends are positioned on the membrane and the cold ends are located on a Si support body.
- thermocouples such as Thermopile- elements
- sensor chip in a housing with thermocouples
- thermocouples In order to obtain as signal voltage as possible in thermopile sensor elements, their thermocouples must be made as long as possible, because less heat conduction and thus a higher temperature difference between the hot and cold end of the thermocouples is achieved.
- the sensitive sensor surface alone has to be quite large, e.g. l x l mm, or larger.
- the sensor chips themselves are then significantly larger, which is disadvantageous for the user.
- the disadvantage is that the signal voltage achieved per area is not sufficient for many applications, the large area also has a high time constant (thermal inertia) and thus requires too slow a reaction time. As a result, homogeneous, unstructured membranes with many thermocouples can not achieve the required signal voltage with a short reaction time.
- WO 91 02229 A1 proposes a single thermopile sensor in which a single free-floating membrane is arranged above a cutout in the chip body, which is arranged over as long a beam as possible with a heat sink, i. the edge of the chip body, is connected.
- thermopile infrared sensor in monolithic Si micromechanics
- the sensor chip membrane is provided with slots and a IR radiation receiving inner surface is suspended with the absorber area on thin webs, on the few thermocouples from the Si edge ("Cold” contacts) to the absorber area ("warm” contacts).
- the sensor element is in a
- thermocouples Surrounds recess. Above the recess is a membrane. However, a variety of rather short thermocouples are provided, which do not allow high sensitivity.
- the recesses are formed by micromechanical
- the disadvantage here is the short distance between the sensor structure on the membrane and the
- thermopile
- the absorber area on the membrane is over a long beam and a few thermocouples held in the membrane holes or slots.
- the beam with the thermocouples and a width of 130 ym is isolated by however also wide slots from the substrate edge and the absorber area. That under the
- the wide slots prevent optimal use of area (degree of filling) of the sensor cell.
- the total sensor cell should be about 2x2 mm in size.
- the oblique outgoing substrate walls do not allow small sensor cells or cell gaps.
- Receive area leads to slow response speed and a high time constant, so that many measurement tasks that require fast measurements are not possible.
- Chip technology without sufficient thermal isolation of the absorber to achieve low signals per area, or have sufficiently large sensitive area of the individual absorber area too high time constants and therefore react too slow and slow in a measurement task.
- the object of the invention is a thermopile infrared sensor in monolithic Si micromechanics
- thermopile infrared single sensor of the type mentioned in that in each case a plurality of individual adjacent sensor cells each having an infrared sensitive area with Thermopile Jardin on the membrane on a common support body of a single chip to a single thermopile sensor structure with a signal output in the housing, consisting of a closed cap with a base plate, with common gas medium
- Series connection, parallel connection or combined in a combination of series and parallel connection to an output signal and led out via a connection is
- the cavity under each membrane with the infrared sensitive areas perpendicular or nearly
- the cavity beneath each membrane having the infrared sensitive regions may have slanted walls etched from the front through the slits in the membrane.
- the common gas medium is preferably a gas of significantly higher molar mass than air, such as xenon, krypton, argon under normal atmospheric pressure.
- the gas medium is a gas or gas mixture having a pressure which is significantly lower than normal
- Sensor chips are routed via an individual preprocessing channel with an individual preamplifier, impedance transformer or analog to digital converter, with some or
- Signal processing units such as temperature or light
- Carrier or housed on an adjacent semiconductor chip within the sensor housing in the common gas medium.
- Thermopile Conceptuents: consist of in one CMOS process applied n- and p-type polysilicon, amorphous silicon, germanium or a mixed form
- thermoelectric thin metal layers of bismuth or antimony to ensure cost-effective production.
- Single sensors are advantageously suitable for use in NDIR gas detection.
- Fig. 1 the basic structure of a thermopile according to the invention
- Fig. 2 a plan view of an inventive
- thermopile sensor chip with 4-fold structured sensor cell; a plan view of an inventive
- thermopile sensor Single chip with 9-fold structured sensor cell, each in series connection; an embodiment of the thermopile sensor according to the invention with summation of the signals of the individual structures via preamplifier or
- Sensor structure with a multi-channel sensor, e.g. for gas detection
- Fig. 6 an enlarged view of the detail A from
- thermopile infrared individual sensor The basic structure of a thermopile infrared individual sensor according to the invention on a single chip is shown in FIG. 1a, b.
- the thermopile individual sensor is constructed on a common frame-shaped semiconductor support body 1, for example made of silicon, and is located in one
- Sensor housing consisting of a bottom plate 2, and a base plate 3 with electrical terminals 4, which are connected via a respective wire bridge 5 with connection pads 6 on the frame-shaped semiconductor support body 1 (Fig. 2, 3), and a cap 7 with an aperture opening 8 and an optic 9, wherein the sensor housing 10 encloses a gas medium tight.
- the support body 1 is provided with a cavity 11 formed by a membrane 12 having a sensitive area
- the gas medium 10 is a gas or gas mixture containing a
- the gas medium 10 is a gas with a high molar mass, such as xenon, krypton or
- Argon or a gas with a compared to normal air pressure significantly reduced internal pressure.
- the sensor housing must be closed so that no gas exchange with the environment can occur.
- the sensor chip consisting of the support body 1 of a
- Single chips contains a plurality of individual cells 18 with a slotted membrane 12 and a beam structure 13, on the thermocouples 13 as Thermopile Modellen, are housed, the "hot” contact 14 is located on the membrane 12 and the “cold” contact 15 on the support body. 1 Furthermore, there is a thin on the membrane 12
- Absorber layer 15 (preferably thinner than 1 ym) to make the thermal mass of the sensitive area low and the response speed high. Between the membrane 12 and the beams 13, and between these and the support body 1 are slots 17 for thermal separation (Fig. 2, 3, 6).
- thermocouples of the thermopile structure are made of known thermoelectric materials of different thermoelectric polarity. This may include both semiconductor materials deposited in a CMOS process, such as e.g. n-type and p-type poly-silicon
- thermoelectric thin metal layers such as bismuth, antimony or the like
- the membranes 12 with the beams 13 and the sensitive area are clamped on the support body 1 via the cavities 11.
- These cavities 11 may be introduced, for example, by dry etching (Deep RIE) from the wafer backside, and then preferably have vertical walls ( Figure 1 a), or may be obtained by etching sacrificial layers or the semiconductor substrate itself from the front through slots 17 (Fig. 2, 3) in the semiconductor substrate for forming the support body 1 through the membrane 12th
- thermopile single sensor closely adjacent several smaller cells 18 (eg 2, 4, 9 or 16 cells) with slotted diaphragms 12, the interconnection by a just as large receiving surface, as known Single element thermopile chips form, wherein the gas medium 10 enables high individual signals per cell 18.
- thermopile chip Due to the relatively small dimensions of the individual cells 18 and their sensitive areas on the respective membranes 12, significantly lower time constants and higher response rates result than with a non-segmented thermopile chip of conventional size.
- thermopile chips in turn leads to a significantly higher signal voltage for the same size of the thermopile chip.
- each cell 18 acts like a single thermopile known per se, only the geometric surface of the individual cells 18 typically much smaller than the usual
- Thermopile single sensor Thermopile single sensor.
- thermopile single sensor has + and - terminals (bond pads 5). All formed as a thermopile cells 18 are combined with each other
- thermopile single sensor interconnected.
- all cells 18 of a thermopile individual sensor are preferably connected in series, in each case the + and - terminals being connected together like individual batteries in a battery block.
- parallel connection or a combination of series and parallel connection.
- FIG. 2 shows a 4-fold cell structuring and FIG. 3 shows a 9-fold cell structuring.
- a further embodiment of the invention consists in the use of preamplifiers or impedance converters 19 or electronic summers 20 or multiplexers /
- Preamplifiers and low pass 19 and a summer 20 or a multiplexer can both on the same
- Substrate such as the Thermopile single sensor, or on a separate chip but in the case, or outside the
- Housing be housed.
- the summation can also be done in a micro-processor which processes the pre-amplified, filtered and multiplexed signals of the individual cells 18.
- the summation element 20 preferably consists of a signal multiplexer for all cells 18 and
- Downstream AD / converter with microprocessor which adds the signals of all cells 18 low noise.
- the structure of at least part of the signal processing is housed in the housing, because then electrical or
- thermocouples of a cell 18 connected in series, so the signal increases, but also the
- Impedance thermocouple, resistor
- NDIR NDIR gas detection
- thermopile infrared sensors it is advantageous to integrate two or more sensor channels from a respective thermopile individual sensor in a housing, that is, two or four thermopile infrared individual sensors according to the invention are arranged side by side in a housing. This allows several gases to be measured simultaneously.
- one of the sensor channels with a Reference filter, which significantly improves the long-term stability and drift resistance.
- the one or more other channels then measure one or more specific gases.
- a multi-channel Thermopilesensor Fig. 5 shows a dual Thermopilesensor, the NDIR
- Gas detection is particularly suitable.
- thermopile individual sensor per channel
- thermopile individual sensors 21, 22 are arranged side by side under a common cap 26 on a common one
- Bottom plate 27 is arranged, with a separate optical filter 23, 24 is provided for each channel.
- an optical partition 25 is recommended between adjacent
- the partition wall 25 must absorb the infrared radiation and must neither let through nor reflect it.
- each cell 18 a common ground pin (minus terminal) are assigned to the bottom plate 27 and the plus terminals are each an individual
- connection led out can be Alternatively, several channels can be routed via a preamplifier and low pass to a multiplexer and read out successively via an output line.
- the combined Thermopile single cells can all be located on the same chip, which the
- Single chips as shown in Figure 5, be housed. Depending on the size, 2 to 4, but also 10 or more individual channels may be located in one housing.
- the partitions 18 can be mounted on both the bottom plate 27, or in the cap 26. In addition to the signal processing channels and the electronic summing can more electronic
- Signal processing units e.g., with temperature or voltage references or an arithmetic circuit for
- Calculation of object temperatures or gas concentrations can be accommodated on the same semiconductor support body 1 within the sensor housing.
- Thermopile infrared single sensor for temperature measurements or for gas detection
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102016111349 | 2016-06-21 | ||
PCT/EP2017/064429 WO2017220381A1 (de) | 2016-06-21 | 2017-06-13 | Thermopile infrarot einzelsensor für temperaturmessungen oder zur gasdetektion |
Publications (1)
Publication Number | Publication Date |
---|---|
EP3472583A1 true EP3472583A1 (de) | 2019-04-24 |
Family
ID=59054138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP17729482.4A Withdrawn EP3472583A1 (de) | 2016-06-21 | 2017-06-13 | Thermopile infrarot einzelsensor für temperaturmessungen oder zur gasdetektion |
Country Status (7)
Country | Link |
---|---|
US (2) | US10794768B2 (de) |
EP (1) | EP3472583A1 (de) |
JP (1) | JP2019518960A (de) |
KR (1) | KR102214389B1 (de) |
CN (1) | CN109313079A (de) |
DE (1) | DE102017113023A1 (de) |
WO (1) | WO2017220381A1 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102015223362A1 (de) * | 2015-11-25 | 2017-06-01 | Minimax Gmbh & Co. Kg | Explosionsgeschütztes Gehäuse für Mittel zum Senden und Empfangen elektromagnetischer Strahlung |
WO2018151200A1 (ja) * | 2017-02-15 | 2018-08-23 | パナソニックIpマネジメント株式会社 | 赤外線センサチップと、これを用いた赤外線センサ |
FR3073941B1 (fr) * | 2017-11-21 | 2021-01-15 | Commissariat Energie Atomique | Dispositif de detection d’un rayonnement electromagnetique a diaphotie reduite |
US10914636B2 (en) * | 2018-03-16 | 2021-02-09 | Ams Sensors Uk Limited | Thermopile self-test and/or self-calibration |
TWI686691B (zh) * | 2018-08-16 | 2020-03-01 | 緯穎科技服務股份有限公司 | 電子裝置及被動元件 |
US11598723B2 (en) * | 2018-10-12 | 2023-03-07 | Amphenol Thermometrics, Inc. | NDIR sensor, sampling method and system for breath analysis |
CN113677962A (zh) * | 2019-03-27 | 2021-11-19 | 松下知识产权经营株式会社 | 红外传感器和配备有红外传感器的红外传感器装置 |
CN110289348B (zh) * | 2019-04-24 | 2021-05-14 | 电子科技大学 | 一种光辅助热电器件的油墨印刷式制备方法及其结构 |
CN110146136B (zh) * | 2019-06-21 | 2020-08-28 | 中国科学院上海微系统与信息技术研究所 | 热堆式气体质量流量传感器及其制备方法 |
CN111735546B (zh) * | 2020-06-04 | 2023-11-10 | 郑州炜盛电子科技有限公司 | 传感器装配壳体、无引线热电堆传感器及制作方法 |
WO2023128782A1 (ru) * | 2021-12-29 | 2023-07-06 | Общество с ограниченной ответственностью "СТЭК-М" | Инфракрасный одноэлементный термопарный сенсор температуры |
JP2024002465A (ja) * | 2022-06-24 | 2024-01-11 | 浜松ホトニクス株式会社 | 赤外線検出器 |
CN116124728A (zh) * | 2023-02-24 | 2023-05-16 | 上海烨映微电子科技股份有限公司 | 热电堆红外探测器及其制备方法和ndir探测系统 |
CN116940203A (zh) * | 2023-09-07 | 2023-10-24 | 深圳市美思先端电子有限公司 | 一种热释电红外传感器 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
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-
2017
- 2017-06-13 DE DE102017113023.3A patent/DE102017113023A1/de not_active Withdrawn
- 2017-06-13 WO PCT/EP2017/064429 patent/WO2017220381A1/de unknown
- 2017-06-13 CN CN201780038145.2A patent/CN109313079A/zh active Pending
- 2017-06-13 US US16/309,513 patent/US10794768B2/en active Active
- 2017-06-13 EP EP17729482.4A patent/EP3472583A1/de not_active Withdrawn
- 2017-06-13 KR KR1020197000195A patent/KR102214389B1/ko active IP Right Grant
- 2017-06-13 JP JP2018564957A patent/JP2019518960A/ja active Pending
-
2020
- 2020-08-07 US US16/947,599 patent/US20200370963A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
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KR102214389B1 (ko) | 2021-02-08 |
DE102017113023A1 (de) | 2017-12-21 |
US20200370963A1 (en) | 2020-11-26 |
US20190265105A1 (en) | 2019-08-29 |
WO2017220381A1 (de) | 2017-12-28 |
JP2019518960A (ja) | 2019-07-04 |
KR20190016538A (ko) | 2019-02-18 |
CN109313079A (zh) | 2019-02-05 |
US10794768B2 (en) | 2020-10-06 |
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